NASA NTRS · 19880000321
Dual-Cathode Electron-Beam Source
Abstract
Beam from either cathode electromagnetically aligned with exit port. Electron beam from either of two cathodes deflected by magnetic and electric fields to central axis. Mechanical alignment of beam easy because cathode axes, anode apertures, and electron trajectories coplanar. Applications where uninterrupted service needed: scanning electron microscopes, transmission electron microscopes, electron-beam lithography equipment, Auger instruments, and microfocused x-ray sources.
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Bradley, James G., Conley, Joseph M., Wittry, David B.. 1988-06-01. Dual-Cathode Electron-Beam Source. https://ntrs.nasa.gov/citations/19880000321
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