NASA NTRS · 19880000091
Imaging Of Directional-Solidification Interfaces
Abstract
X-ray and gamma-ray technique developed at NASA Langley Research Center enables melt/solid interface to be observed visually during crystal growth by directional solidification in Bridgman furnace. Technique used to observe movement and shape of interface in germanium and in lead tin telluride. Valuable tool in efforts to grow seeded semiconductor materials in Bridgman furnaces.
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Fripp, Archibald L., Jr., Debnam, William J., Jr., Berry, Robert F., Crouch, Roger K., Barber, Patrick G., Simchick, Richard. 1988-02-01. Imaging Of Directional-Solidification Interfaces. https://ntrs.nasa.gov/citations/19880000091
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