NASA NTRS · 19790000099
Troubleshooting plated-wire memories
Abstract
Faults in plated wire memories are identified and located from outside of system by applying electrical impulses and analyzing their reflectance in technique of Time-Domain Reflectometry (TDR). Intermittent faults are easier to find because memory system is not disturbed by probing or disassembly.
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Baker, C. M., Bright, T. M., Constable, R. C.. 1979-08-01. Troubleshooting plated-wire memories. https://ntrs.nasa.gov/citations/19790000099
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