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Bright, T. M.

Publications and source records attributed to Bright, T. M..

Troubleshooting plated-wire memories

Faults in plated wire memories are identified and located from outside of system by applying electrical impulses and analyzing their reflectance in technique of Time-Domain Reflectometry (TDR). Intermittent faults are easier to find because memory system is not disturbed by probing or disassembly.

Baker, C. M.↗