NASA NTRS ยท 19760000259
IGFET/SOI fabrication method
Abstract
Technique increases switching speeds, shortens channel length, reduces parasitic capacitance and gate overlap, and minimizes gate-to-channel capacitance. The p and n sections may be reversed, allowing fabrication of complementary devices.
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Feltner, W. R.. 1976-08-01. IGFET/SOI fabrication method. https://ntrs.nasa.gov/citations/19760000259
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