Work function measurements by the field emission retarding potential method

Abstract

Using the field emission retarding potential method true work functions have been measured for the following monocrystalline substrates: W(110), W(111), W(100), Nb(100), Ni(100), Cu(100), Ir(110) and Ir(111). The electron elastic and inelastic reflection coefficients from several of these surfaces have also been examined near zero primary beam energy.