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Mackie, W. A.

Publications and source records attributed to Mackie, W. A..

Work function measurements by the field emission retarding potential method

Using the field emission retarding potential method true work functions have been measured for the following monocrystalline substrates: W(110), W(111), W(100), Nb(100), Ni(100), Cu(100), Ir(110) and Ir(111). The electron elastic and inelastic reflection coefficients from several of these surfaces have also been examined near zero primary beam energy.

Swanson, L. W.