NASA NTRS · 19690000344
Surface profilometer for examining grain-boundary grooves
Abstract
Surface profilometer, consisting primarily of commercially available components, measures surface topographical features accurately and precisely. It shows improvement over the interferometric technique in measurement of grain-boundary grooves formed during annealing on nickel-oxide bicrystals.
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Jech, R. E., Ready, D. W.. 1969-08-01. Surface profilometer for examining grain-boundary grooves. https://ntrs.nasa.gov/citations/19690000344
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