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Jech, R. E.

Publications and source records attributed to Jech, R. E..

Surface profilometer for examining grain-boundary grooves

Surface profilometer, consisting primarily of commercially available components, measures surface topographical features accurately and precisely. It shows improvement over the interferometric technique in measurement of grain-boundary grooves formed during annealing on nickel-oxide bicrystals.

Jech, R. E.↗