NASA NTRS · 19670014346
Fast scan infrared microscope for improving microelectronic device reliability
Abstract
Fast scan infrared microscope to determine thermal and electromechanical parameters affecting reliability of microelectronic components
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Hamiter, L. C., Jr.. 1967-01-01. Fast scan infrared microscope for improving microelectronic device reliability. https://ntrs.nasa.gov/citations/19670014346
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