How reliable are MOS ICs - As good as bipolars, says NASA.
Metal oxide semiconductor integrated circuits, showing failure rates and degradation causes
Hamiter, L. C., Jr.↗
Engineering topics
Hamiter, L. C., Jr.
Publications and source records attributed to Hamiter, L. C., Jr..
Assessment of reliability of metal-oxide- silicon devices
Reliability of metal oxide silicon integrated microcircuits
Bagley, B.↗
Quality and reliability assurance research at MSFS
Quality and reliability assurance research reviews at Marshall Space Flight Center
Beal, J. B.↗
Fast scan infrared microscope for improving microelectronic device reliability
Fast scan infrared microscope for measuring thermal and electromechanical parameters affecting reliability of microelectronic devices
TEST METHOD↗
Fast scan infrared microscope for improving microelectronic device reliability
Fast scan infrared microscope to determine thermal and electromechanical parameters affecting reliability of microelectronic components
INFRARED INSPECTION↗
External visual inspection criteria for semiconductor devices
External visual inspection criteria for semiconductor devices
Cole, C. G.↗
Fast scan infrared microscope for improving microelectronic device reliability
Fast scan infrared microscope for inspecting microelectronic circuits
MICROELECTRONICS↗