NASA NTRS · 19640025599
Capacitance extensometers for microstrain measurements.
Abstract
Fielden proximity meter and wayne kerr electronic micrometer for detecting small capacitance changes for microstrain measurements
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Bresie, D. A., Hartman, D. E., Roberts, J. M.. 1963-11-01. Capacitance extensometers for microstrain measurements.. https://ntrs.nasa.gov/citations/19640025599
Cite the original work for its findings. Save a collection to share your selection of sources.