Engineering topics
Publications and source records attributed to Zoutendyk, J. A..
The effects of field funneling and range straggling have been quantitatively observed in the measurement of charge collected from alpha-particle tracks in silicon surface-barrier charged-particle detectors. The method described may be used for the straight-forward measurement of charge collection from heavy ions in these and other semiconductor devices.
Single-Event Upset (SEU) in bipolar integrated circuits (ICs) is caused by charge collection from ion tracks in various regions of a bipolar transistor. This paper presents experimental data which have been obtained wherein the range-energy characteristics of heavy ions (Br) have been utilized to determine the cross section for soft-error generation as a function of charge collected from single-particle tracks which penetrate a bipolar static RAM. The results of this work provide a basis for the experimental verification of circuit-simulation SEU modeling in bipolar ICs.
Both bipolar and MOS integrated circuits have been empirically demonstrated to be susceptible to single-particle soft-error generation, commonly referred to as single-event upset (SEU), which is manifested in a bit-flip in a latch-circuit construction. Here, the intrinsic characteristics of SEU in bipolar (static) RAM's are demonstrated through results obtained from the modeling of this effect using computer circuit-simulation techniques. It is shown that as the dimensions of the devices decrease, the critical charge required to cause SEU decreases in proportion to the device cross-section. The overall results of the simulations are applicable to most integrated circuit designs.
The results of work done on the quantitative characterization of single-event upset (SEU) in bipolar random-access memories (RAMs) have been obtained through computer simulation of SEU in RAM cells that contain circuit models for bipolar transistors. The models include current generators that emulate the charge collected from ion tracks. The computer simulation results are compared with test data obtained from a RAM in a bipolar microprocessor chip. This methodology is applicable to other bipolar integrated circuit constructions in addition to RAM cells.
Gas jet used to control shape of meniscus and thus to regulate ribbon thickness in vertical silicon-ribbon growth. Gas jet also cools ribbon, increasing maximum possible pull speed for silicon, contact angle of 11 degrees plus or minus 1 degree required for constant thickness ribbon growth. Cooling effect of gas jet increases maximum possible pull speed.
Solid ribbon of silicon pulled horizontally over lip of crucible. As heat leaves silicon by radiation, conduction, and convections, surface layer solidifies from liquid. Horizontal growth of ribbon offers several advantages over vertical growth. It is faster--possibly 1 to 2 centimeters per second-and is done without using drawing dies, source of contamination in vertical growth.
Experimental results are summarized, and it is pointed out that gravity-driven convection can alter the diffusive-advective mass transport behavior in the growth of crystals by physical vapor transport. Specially designed and constructed transparent furnaces are described which are being used to study the effects of gravity in the crystal growth of the compound semiconductors PbTe and CdTe. The theory underlying vapor transport behavior is reviewed, with attention given to the vapor-solid behavior of compound materials, to one-dimensional mass transport, and to gravity-induced (natural) convection. In the transparent furnaces, the quartz capillary tube mounted along the axis of the main quartz ampoule is used to measure the temperature at the growth surface (vapor-solid crystal interface) and the source, as well as the complete temperature profile along the axis of the tube. The light-pipe works to remove heat from the growth end of the ampoule by radiative heat transfer. The ampoules are sealed after being evacuated to the low 10 to the -8th torr range with a cryogenic vacuum pump.
A heat transport analysis which considers forced convective fluid flow induced by the motion of a continuous solid ribbon over a melt has been done for horizontal ribbon growth. A model has been developed which treats both 'active' and 'passive' cooling at the ribbon surface. The results show that heat flow from the melt requires active cooling in the region of the leading growth edge or growth tip. Steady-state liquid-solid interface shape is analyzed and numerical results are given for steady-state pulling of silicon ribbon.
A theoretical heat flow analysis for horizontalribbon growth is presented. Equations are derived relating pull speed, ribbon thickness, thermal gradient in the melt, and melt temperature for limiting cases of heat removal by radiation only and isothermal heat removal from the solid surface over the melt. Geometrical cross sections of the growth zone are shown to be triangular and nearly parabolic for the two respective cases. Theoretical pull speed for silicon ribbon 0.01 cm thick, where the loss of latent heat of fusion is by radiation to ambient temperature (300 K) only, is shown to be 1 cm/sec for horizontal growth extending 2 cm over the melt and with no heat conduction either to or from the melt. Further enhancement of ribbon growth rate by placing cooling blocks adjacent to the top surface is shown to be theoretically possible.
Explore the source record for details and available documents.
Because of the growing need for new sources of electrical energy, photovoltaic solar energy conversion is being developed. Photovoltaic devices are now being produced mainly from silicon wafers obtained from the slicing and polishing of cylindrically shaped single crystal ingots. Inherently high-cost processes now being used must either be eliminated or modified to provide low-cost crystalline silicon. Basic to this pursuit is the development of new or modified methods of crystal growth and, if necessary, crystal cutting. If silicon could be grown in a form requiring no cutting, a significant cost saving would potentially be realized. Therefore, several techniques for growth in the form of ribbons or sheets are being explored. In addition, novel techniques for low-cost ingot growth and cutting are under investigation.
Space short circuit current calibrations on solar cells, using high altitude balloon flights
Space calibration of standard solar cells using high altitude balloon flights
Solar cell arrays for electrical power generation in space
Review of testing methods for solar-cell power systems, including measurements at table mountain test facility and in high-altitude balloon flight
Efficiency of solar cell power systems outside the earths atmosphere