The further development of scanning electron microscopy in the microelectronics field semiannual report, 1 jan. - 30 jun. 1968
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Shaw, D. A.↗
Engineering topics
Wayte, R. C.
Publications and source records attributed to Wayte, R. C..
The application of the scanning electron microscope to studies of current multiplication, avalanche breakdown and thermal runaway. Part 2 - General studies, mainly non-thermal
Scanning electron microscope applications in study of current multiplication, avalanche breakdown, and thermal runaway - Nonthermal effects in Read diodes
Sulway, D. V.↗
Device failure analysis by scanning electron microscopy
Scanning electron microscopy for semiconductor device failure analysis
Davies, I. G.↗