Destructive breakdown in thin films of SiO, MgF sub 2, CaF sub 2, CeF sub 3, CeO sub 2, and Teflon.
Prebreakdown and breakdown electrical properties of thin film capacitors with certain oxides, fluorides and Teflon dielectrics
Budenstein, P. P.↗
Engineering topics
Smith, J. L.
Publications and source records attributed to Smith, J. L..