Engineering topics

Leung, Philip L.

Publications and source records attributed to Leung, Philip L..

5 records

NASA NTRS1992

Dielectric particle injector for material processing

A device for use as an electrostatic particle or droplet injector is disclosed which is capable of injecting dielectric particles or droplets. The device operates by first charging the dielectric particles or droplets using ultraviolet light induced photoelectrons from a low work function material plate supporting the dielectric particles or droplets, and then ejecting the charged particles or droplets from the plate by utilizing an electrostatic force. The ejected particles or droplets are mostly negatively charged in the preferred embodiment; however, in an alternate embodiment, an ion source is used instead of ultraviolet light to eject positively charged dielectric particles or droplets.

Leung, Philip L.↗

NASA NTRS1992

Dielectric-Particle Injector For Processing Of Materials

Device generates electrically charged particles of solid, or droplets of liquid, fabricated from dielectric material and projects them electrostatically, possibly injecting them into electrostatic-levitation chamber for containerless processing. Dielectric-particle or -droplet injector charges dielectric particles or droplets on zinc plate with photo-electrons generated by ultraviolet illumination, then ejects charged particles or droplets electrostatically from plate.

Leung, Philip L.↗

NASA NTRS1992

Conductive Bands Diminish Electrostatic Discharges

Electrostatic discharges on surfaces covered with electrically insulating paints reduced by connecting edges of painted surfaces to electrical grounds with band of conductive material. Prevents charge build up on paint which eventually arcs to conductive surface, damaging structures and equipment.

Leung, Philip L.↗

NASA NTRS1992

Lightweight, High-Yield Photocathode

Layer of Astroquartz (or equivalent) cloth woven from quartz thread multiplies electron current emitted by aluminum photocathode sensitive to ultraviolet light when placed in external steady-state electric field. Desirable in applications where low power consumption required.

Leung, Philip L.↗

NASA NTRS1991

Testing Conductive Films For Continuity

Apparatus tests thin conductive films for continuity without touching them. Specimen irradiated with 10-keV electrons; then noncontacting electrostatic probe scans specimen and measures charge on spot directly under it. Avoids damage to film and error from contact resistance resulting from touching film with conventional probe. Developed to determine integrity of conductive coats applied to surfaces of dielectric materials to inhibit accumulation of electrostatic charges.

Leung, Philip L.↗