Engineering Papers⌕ Search

Engineering topics

Kirian, R. A.

Publications and source records attributed to Kirian, R. A..

7 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2015

Electronic damage in S atoms in a native protein crystal induced by an intense X-ray free-electron laser pulse

Current hard X-ray free-electron laser (XFEL) sources can deliver doses to biological macromolecules well exceeding 1 GGy, in timescales of a few tens of femtoseconds. During the pulse, photoionization can reach the point of saturation in which certain atomic species in the sample lose most of their electrons. This electronic radiation damage causes the atomic scattering factors to change, affecting, in particular, the heavy atoms, due to their higher photoabsorption cross sections. Here, it is shown that experimental serial femtosecond crystallography data collected with an extremely bright XFEL source exhibit a reduction of the effective scattering power of the sulfur atoms in a native protein. Quantitative methods are developed to retrieve information on the effective ionization of the damaged atomic species from experimental data, and the implications of utilizing new phasing methods which can take advantage of this localized radiation damage are discussed.

Galli, L.↗
DOE OSTI2011

New Light on Disordered Ensembles: Ab Initio Structure Determination of One Particle from Scattering Fluctuations of One Particular from Scattering Fluctuatins of Many Copies

We report on the first experimental ab initio reconstruction of an image of a single particle from fluctuations in the scattering from an ensemble of copies, randomly oriented about an axis. The method is applicable to identical particles frozen in space or time (as by snapshot diffraction from an x-ray free electron laser). These fluctuations enhance information obtainable from an experiment such as conventional small angle x-ray scattering.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2010

Beyond small-angle x-ray scattering: Exploiting angular correlations

We propose a method for determining the projected electron density of an individual molecule from diffraction patterns of many such simultaneously illuminated molecules, randomly oriented about an axis parallel to an incident x-ray beam. We illustrate the idea with a simulation of a structure determination of a K-channel membrane protein in situ.

59 BASIC BIOLOGICAL SCIENCES↗