Evaluating Performance and Degradation of Bifacial Fields: Approach and Case Study
This presentation cover results of four years of bifacial technology performance and degradation study, presented at the bifiPV 2024.
Engineering topics
Publications and source records attributed to Kern, Dana.
This presentation cover results of four years of bifacial technology performance and degradation study, presented at the bifiPV 2024.
Photovoltaic (PV) energy production is currently increasing at a significant rate. A novel module architecture has been demonstrated that has potential for reducing manufacturing cost while improving module reliability and recycling for c-Si PV which utilizes an edge-seal. Referred to as Edge Sealed Module (ESM), this architecture eliminates the vacuum lamination process and cross-linked encapsulants on the interior of the module. Functioning prototypes of c-Si have been fabricated for stress testing in collaboration with National Renewable Energy Laboratories (NREL). These modules are being tested and compared to traditionally manufactured modules. Based on preliminary results, this module architecture is a potentially viable solution for improving the manufacturing cost and recyclability of PV modules while enhancing module performance.
Data for control and 5-year fielded bifacial modules of PERC and SHJ technologies, including IV Curves, EQE, EL and PL, for degradation and performance studies.