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Huang, Zixu [University of Washington, Seattle, WA (United States)] (ORCID:0009000464322612)

Publications and source records attributed to Huang, Zixu [University of Washington, Seattle, WA (United States)] (ORCID:0009000464322612).

Degradation Dynamics of Perovskite Solar Cells Under Fixed Reverse-Current Injection

Previous studies of reverse-bias stability in perovskite solar cells have focused primarily on voltage-controlled tests. Here we instead investigate perovskite solar cell degradation under well-defined, constant reverse-current stress. We show that the choice of hole-transport layer dictates the dominant degradation pathway: cells using thick poly(triphenylamine) (PTAA) layers can tolerate high reverse bias but quickly undergo catastrophic breakdown under fixed reverse current near their one-sun maximum power-point. In contrast, cells modified with phosphonic-acid interface layer MeO-2PACz, with poorer indium-doped tin oxide (ITO) coverage compared to PTAA, exhibit gradual and recoverable degradation under certain stress and recovery conditions. For MeO-2PACz devices, degradation increases with both current magnitude and duration. Importantly, when normalized by injected charge (current times duration), lower currents applied over longer times cause more degradation than higher currents over shorter periods. Here, combining electrical measurements with spatially resolved photoluminescence imaging, our observations support an ion- and charge-mediated interfacial electrochemical degradation mode.

Degradation

Comparing Machine Learning and Physics-Based Nanoparticle Geometry Determinations Using Far-Field Spectral Properties

Anisotropic metal nanostructures exhibit polarization-dependent light scattering, a property which has been widely studied and exploited to determine orientations of subwavelength structures using far-field microscopy. Here we explore the use of variational autoencoders (VAEs) to determine the geometries of gold nanorods (NRs) such as in-plane orientation and aspect ratio under linearly polarized dark-field illumination in an optical microscope. We enforce a shared latent space to connect two VAEs trained separately with polarized dark-field scattering spectra and electron microscopy images and achieve image prediction (shape, orientation, and size) of Au NRs using only polarized dark-field scattering spectra. We determine the geometrical parameters of orientational angle and aspect ratio quantitatively via both our dual-VAE and physics-based analysis on the input scattering spectra. We show that orientational angle prediction by dual-VAE performs well with only a small (~300 particle) training set, yielding a mean absolute error (MAE) of 14.4° and a concordance correlation coefficient (CCC) of 0.95. This performance is only marginally worse than the physics-based cos(2?) fitting approach between the scattering intensity and the polarizing angle, which achieves MAE of 8.78° and CCC of 0.99. Aspect ratio determination is also comparable for the dual-VAE and physics-based fitting comparison (MAE of 0.21 vs. 0.23 and CCC of 0.53 vs. 0.68). Here, this dual encoder-decoder architecture effectively exploits the structure-property relationships of plasmonic nanostructures to construct a cross-modal machine learning (ML) approach, providing a pathway to employ ML approaches to address other structure-property relationships in materials science.

Dark-field scattering