Engineering topics

East, Jack R.

Publications and source records attributed to East, Jack R..

3 records

NASA NTRS1992

Novel heterojunction varactors

An account is given of new varactor multiplier designs, for mm-wave and sub-mm-wave receiver systems, which have their bases in heterostructure layers and exhibit either stronger capacitance nonlinearity or a special symmetry of characteristics. While barrier-n-layer-n(+) C-V characteristics yield superior performance at low pump powers, the symmetric C-V characteristics of the single-barrier varactor devices yield efficient low-order harmonic generation. Capacitance nonlinearity in these devices is due to depletion of a semiconductor drift region.

Frerking, Margaret A.↗

NASA NTRS1992

Current saturation in submillimeter wave varactors

In semiconductor devices the speed of electrons cannot exceed certain limits. This phenomenon will affect varactor multipliers as well as other high frequency devices where the RF current through the active part of the device is primarily displacement current. Hence, 'saturation' of the varactor output power is expected at some point. This phenomenon is discussed in some detail and shown to severely deteriorate the multiplier performance at higher frequencies. Single barrier varactors should have an advantage over GaAs Schottky diode varactors because they can be fabricated on InAs and stacked in a series array, allowing for lower current densities and higher power handling.

Kollberg, Erik L.↗

NASA NTRS1990

Microwave dielectric properties of dry rocks

A combination of techniques was used to measure the dielectric properties of 80 rock samples in the microwave region. The real part (RP) of the relative dielectric constant was measured in 0.1-GHz steps from 0.5 to 18 GHz, and the imaginary part (IP) was measured at five frequencies between 1.6 and 16 GHz. The bulk density rho(b) was also measured for all the samples, and the bulk chemical composition (BCC) was determined for 56 of the samples. RP is found to be frequency-independent at 0.5-18 GHz for all samples, and rho(b) accounts for about 50 percent of the observed variance. For silicate rocks, as much as 78 percent of the variance is explained by the combination of rho(b) and the fractional contents of oxides when the silicates are subgrouped by genesis. In contrast, IP decreases with increasing frequency for most rock samples, and no statistically significant relationships are found between IP and rho(b). For subgrouped silicate rocks, 60 percent of the variance in IP can be explained by BCC.

Ulaby, Fawwaz T.↗