Engineering topics
Publications and source records attributed to Chen, Yuan.
This paper presents a qualification methodology on imaging sensors. In addition to overall chip reliability characterization based on sensor's overall figure of merit, such as Dark Rate, Linearity, Dark Current Non-Uniformity.
This paper summarizes the testing and characterization results performed down to 120 degrees Celsius on a group of COTS identified. Futher reliability and performance study of temperature cycling impaces on teh COTS will follow.
This paper presents a qualification methodology on imaging sensors. In addition to overall chip reliability characterization based on sensor s overall figure of merit, such as Dark Rate, Linearity, Dark Current Non-Uniformity, Fixed Pattern Noise and Photon Response Non-Uniformity, a simulation technique is proposed and used to project pixel reliability. The projected pixel reliability is directly related to imaging quality and provides additional sensor reliability information and performance control.
This paper provides a summary of an industry survey on junction temperature derating from key microelectronics suppliers, and offers recommendations to users for temperature derating for reliable operation over time. Background information on established derating factors, and reccommendations for safe operating junction temperatures for newer technologies are also presented.