Engineering topics

Bever, R. S.

Publications and source records attributed to Bever, R. S..

7 records

NASA NTRS1985

Ramp technique for dc partial discharge testing

The partial discharge (PD) data presently obtained by means of a stepwise ramp technique, for the cases of high voltage (HV) components and such resin-packaged HV devices as the Space Telescope's Faint Object Camera, is acquired separately on part-way ramps to rated voltage and on the intermediate voltage plateaus. For test specimens intended for dc service, this ramp method yields more data on insulation integrity than quiescent dc measurements, especially in the case of specimens of high resistivity which causes the discharge frequency to be deceptively low at constant dc voltage. During upward ramping the voltage distribution is capacitive, and the PD behavior resembles that of an ac test. Many more pulses are obtained in the voids without the heat otherwise generated by the application of 60-Hz ac. PD histograms are presented for various materials, with and without intentional defects.

Bever, R. S.↗

NASA NTRS1984

Forecasting of high voltage insulation performance: Testing of recommended potting materials and of capacitors

Nondestructive high voltage test techniques (mostly electrical methods) are studied to prevent total or catastrophic breakdown of insulation systems under applied high voltage in space. Emphasis is on the phenomenon of partial breakdown or partial discharge (P.D.) as a symptom of insulation quality, notably partial discharge testing under D.C. applied voltage. Many of the electronic parts and high voltage instruments in space experience D.C. applied stress in service, and application of A.C. voltage to any portion thereof would be prohibited. Suggestions include: investigation of the ramp test method for D.C. partial discharge measurements; testing of actual flight-type insulation specimen; perfect plotting resin samples with controlled defects for test; several types of plotting resins and recommendations of the better ones from the electrical characteristics; thermal and elastic properties are also considered; testing of commercial capaciters; and approximate acceptance/rejection/rerating criteria for sample test elements for space use, based on D.C. partial discharge.

Bever, R. S.↗

NASA NTRS1982

Partial discharge testing under direct voltage conditions

DC partial discharge (PD) (corona) testing is performed using a multichannel analyzer for pulse storing, and data is collected during increase of voltage and at quiescent voltage levels. Thus high voltage ceramic disk capacitors were evaluated by obtaining PD data interspersed during an accelerated life test. Increased PD activity was found early in samples that later failed catastrophically. By this technique, trends of insulation behavior are revealed sensitively and nondestructively in high voltage dc components.

Bever, R. S.↗

NASA NTRS1981

Tank testing of a 2500-cm2 solar panel

A 50 cm by 50 cm solar array panel test patch was investigated for spacecraft charging and arcing effects. Bombardment with monochromatic electron was carried out. Some objectives of the test were: (1) to estimate at what voltage of electron bombardment arcing would be probable; (2) to find whether the arc's energy would be tolerable or damagingly large; (3) to try and separate thermal and photoeffects; and, (4) to see whether materials used were such as to minimize arcing. Some conclusions were: In sunlight the tracking data relay satellite's solar panel which has ceria glass on the front and conductive paint on the backside is probably a good design for reducing charge-up. In a geomagnetic substorm simulated in testing there will be arcing at the interconnects during eclipse and transitions into and out of eclipse in testing especially in view of the very cold temperatures that will be reached by this lightweight array. Ceria-doped glass is preferred to fused silica glass for reducing charge build up. The Kapton bare patch should still be conductively painted. The differential voltages on the panel determine when arcing first begins, and the electron beam voltages vary depending upon whether the metallic structure is directly grounded or semifloating.

Bever, R. S.↗

NASA NTRS1977

Measurement of insulation integrity of IUE camera tube facsimiles by partial discharges method and diffusion of gases through various silicone rubbers

Several dummy tubes imitating the IUE Camera System design were encapsulated with Solithane 2, Conathane EN-11, Green and Black Hysols and SMRD 432. Various flaws were purposefully placed in some of these. Partial discharge testing in vacuum under direct voltage conditions was carried once a week for 12 weeks, 15 kv dc being applied during normal working hours for 40 hours duration per week. None of the units showed much damage during this time judging by the P.D. energy histograms. A more complete mathematical presentation is given on diffusion and permeation than previously. Measurements of diffusion constants for various silicone rubbers are carried out by the Time-Lag method and compared to other determinations in the literature. Calculations of the time required for diffusion through a thick wall are demonstrated in the long time approximation and for dimensions pertaining to void and wall sizes of a delamination problem in the LANDSAT-C vidicon tubes. An actual delaminated LANDSAT-C tube and some facsimiles are immersed in vacuum for long periods and tested for catastrophic breakdown due to diffusion of gas, by application of high voltage.

Bever, R. S.↗

NASA NTRS1976

Methods for testing high voltage connectors in vacuum, measurements of thermal stresses in encapsulated assemblies, and measurement of dielectric strength of electrodes in encapsulants versus radius of curvature

Internal embedment stress measurements were performed, using tiny ferrite core transformers, whose voltage output was calibrated versus pressure by the manufacturer. Comparative internal strain measurements were made by attaching conventional strain gages to the same type of resistors and encapsulating these in various potting compounds. Both types of determinations were carried out while temperature cycling from 77 C to -50 C.

Bever, R. S.↗

NASA NTRS1975

Investigation of problems associated with solid encapsulation of high voltage electronic assemblies; also Reynolds connector study

Electric breakdown prevention in vacuum and encapsulation of high voltage electronic circuits was studied. The lap shear method was used to measure adhesive strengths. The permeation constants of air at ambient room temperature through four different space-grade encapsulants was measured. Order of magnitude was calculated for the time that air bubble pressures drop to the corona region. High voltage connectors with L-type cable attached were tested in a vacuum system at various pressures. The cable system was shown to suppress catastrophic breakdown when filled with and surrounded by gas in the corona region of pressures, but did not prove to be completely noise free.

Bever, R. S.↗