Two-Tone Spectroscopy of 3D SRF Cavities to Understand Two-Level System Loss
So-called two-level system (TLS) defects are among the most detrimental sources of loss and decoherence in superconducting quantum devices, and their microscopic nature still poorly understood. We develop a two-tone spectroscopy technique to characterize the spectral line width of TLS. This knowledge will help to distinguishes various types of TLS defects. In our experiments we use the fundamental TM010 pass band modes of 9-cell elliptical SRF cavities to probe spectral properties of TLS in native niobium oxide formed on the inside walls of the resonator. We pump one of the modes (4¿/9 through 8¿/9) with continuous high-power to saturate TLSs that couple to this frequency, and we probe the Q-factor of the ¿-mode. We observe increase of the quality factor of the probed ¿-mode when one of the neighboring modes is pumped. Extremely high quality factors of the pass band modes and their relative proximity in the frequency space allow us to estimate the width of the spectral hole burned in the TLS bath absorption spectrum which is related to the line spectral width of the TLS defects.