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We report low-energy proton and alpha particle SEE data on a 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) static random access memory (SRAM) that demonstrates the criticality of understanding and using low-energy protons for SEE testing of highly-scaled technologies
We report low-energy proton and low-energy alpha particle single-event effects (SEE) data on a 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) latches and static random access memory (SRAM) that demonstrates the criticality of using low-energy protons for SEE testing of highly-scaled technologies. Low-energy protons produced a significantly higher fraction of multi-bit upsets relative to single-bit upsets when compared to similar alpha particle data. This difference highlights the importance of performing hardness assurance testing with protons that include energy distribution components below 2 megaelectron-volt. The importance of low-energy protons to system-level single-event performance is based on the technology under investigation as well as the target radiation environment.
This presentation gives a brief overview of some of the radiation challenges facing emerging scaled digital technologies with implications on using consumer grade electronics and next generation hardening schemes. Commercial semiconductor manufacturers are recognizing some of these issues as issues for terrestrial performance. Looking at means of dealing with soft errors. The thinned oxide has indicated improved TID tolerance of commercial products hardened by "serendipity" which does not guarantee hardness or say if the trend will continue. This presentation also focuses one reliability implications of thinned oxides.
The question of how ready the public is for the implementation of large-scale programs of technological change is considered. Four vital aspects of the issue are discussed which include: (1) the ways in which the public mis-perceives the change process, (2) the ways in which recent history impacts on public attitudes, (3) the ways in which the public divides among itself, and (4) the fundamentals of public attitudes towards change. It is concluded that nothing is so critical in the 1970's to securing public approval for large-scale planned change projects as is securing the approval by change-agents of the public.
Two major themes are addressed in this assessment of the management of large-scale NASA programs: (1) how a high technology agency was a decade marked by a rapid expansion of funds and manpower in the first half and almost as rapid contraction in the second; and (2) how NASA combined central planning and control with decentralized project execution.
Research and education in management of large scale technical programs - computers in urban affairs
In a major cooperative program between U.S. Government agencies (represented by the U.S. Army Aeroflightdynamics Directorate and NASA Ames and Langley Research Centers) and United Technologies Corp., a 1/6 geometrically and aeroelastically scaled UTC model helicopter rotor was tested in the open-jet anechoic test section of the Duits-Nederlandse Windtunnel in the Netherlands. As the fourth entry under the Aerodynamic and Acoustic Testing of Model Rotors Program, several comprehensive acoustic and aerodynamic databases were obtained relating the important aerodynamic phenomena to both the near- and far-field acoustic radiation. In particular, high speed impulsive noise and blade-vortex interaction are of primary interest. This paper provides an initial summary of the acoustic measurements acquired for some of the different configurations tested. A review of the baseline swept tip rotor acoustic characteristics in the regimes of high speed forward flight, where high speed impulsive noise dominates, and low speed descent, where severe blade vortex interaction noise occurs, is presented. The trends of these primary noise sources are studied as the first step in validating the data for release and application.
The UDF trademark (Unducted Fan) engine is a new aircraft engine concept based on an ungeared, counterrotating, unducted, ultra-high-bypass turbofan configuration. This engine is being developed to provide a high thrust-to-weight ratio powerplant with exceptional fuel efficiency for subsonic aircraft application. This report covers the testing of pertinent components of this engine such as the fan blades, control and actuation system, turbine blades and spools, seals, and mixer frame.
The Unducted Fan engine (UDF trademark) concept is based on an ungeared, counterrotating, unducted, ultra-high-bypass turbofan configuration. This engine is being developed to provide a high thrust-to-weight ratio power plant with exceptional fuel efficiency for subsonic aircraft application. This report covers the design methodology and details for the major components of this engine. The design intent of the engine is to efficiently produce 25,000 pounds of static thrust while meeting life and stress requirements. The engine is required to operate at Mach numbers of 0.8 or above.
The Unducted Fan (UDF) engine is an innovative aircraft engine concept based on an ungeared, counterrotating, unducted, ultra-high-bypass turbofan configuration. This engine is being developed to provide a high thrust-to-weight ratio power plant with exceptional fuel efficiency for subsonic aircraft application. This report covers the successful ground testing of this engine. A test program exceeding 100-hr duration was completed, in which all the major goals were achieved. The following accomplishments were demonstrated: (1) full thrust (25,000 lb); (2) full counterrotating rotor speeds (1393+ rpm); (3) low specific fuel consumption (less than 0.24 lb/hr/lb); (4) new composite fan design; (5) counterrotation of structures, turbines, and fan blades; (6) control system; (7) actuation system; and (8) reverse thrust.
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This work is sponsored by the NASA Electronic Parts and Packaging (NEPP) Program. One of the objectives of this task is to prepare a body of knowledge guideline document summarizing the CMOS technology scaling impact on CMOS parts and parts reliability for space applications. Scaling impact on parts radiation sensitivity is not addressed in this report.
Th effects of device technology and scaling on soft error rates are discussed, using information obtained from both the device and space communities as a guide to determine the net effect on soft errors.
The paper discusses the scale model technology being developed at the NASA Langley Research Center in support of the development of structural dynamic prediction methods for large flexible space structures. Space Station is used as a focus. The Dynamic Scale Model Technology (DSMT) Program is described; results of the effect of scaling Space Station components are presented; and supporting scale model technology development activities are described and results presented. The conceptual design of a hybrid-scale Pathfinder model for developing test techniques and suspension methods is also discussed, and a summary of the broad application of the scale model technology being developed is presented.
The desire to assess the reliability of emerging scaled microelectronics technologies through faster reliability trials and more accurate acceleration models is the precursor for further research and experimentation in this relevant field. The effect of semiconductor scaling on microelectronics product reliability is an important aspect to the high reliability application user. From the perspective of a customer or user, who in many cases must deal with very limited, if any, manufacturer's reliability data to assess the product for a highly-reliable application, product-level testing is critical in the characterization and reliability assessment of advanced nanometer semiconductor scaling effects on microelectronics reliability. A methodology on how to accomplish this and techniques for deriving the expected product-level reliability on commercial memory products are provided.Competing mechanism theory and the multiple failure mechanism model are applied to the experimental results of scaled SDRAM products. Accelerated stress testing at multiple conditions is applied at the product level of several scaled memory products to assess the performance degradation and product reliability. Acceleration models are derived for each case. For several scaled SDRAM products, retention time degradation is studied and two distinct soft error populations are observed with each technology generation: early breakdown, characterized by randomly distributed weak bits with Weibull slope (beta)=1, and a main population breakdown with an increasing failure rate. Retention time soft error rates are calculated and a multiple failure mechanism acceleration model with parameters is derived for each technology. Defect densities are calculated and reflect a decreasing trend in the percentage of random defective bits for each successive product generation. A normalized soft error failure rate of the memory data retention time in FIT/Gb and FIT/cm2 for several scaled SDRAM generations is presented revealing a power relationship. General models describing the soft error rates across scaled product generations are presented. The analysis methodology may be applied to other scaled microelectronic products and their key parameters.
A hover test of a full-scale, composite, advanced technology XV-15 rotor was conducted at the Outdoor Aerodynamic Research Facility at Ames Research Center. The primary objective of the test was to obtain accurate measurements of the hover performance of this rotor system. Data were acquired for rotor tip Mach numbers ranging from 0.35 to 0.73. The rotor was tested with several alternate blade root and blade-tip configurations. Data are presented on rotor performance, rotor-wake downwash velocities, and rotor system loads.