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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Equations derived to estimate obscuration ratios of surfaces contaminated by particles. Ratio is fraction of surface area covered by particles. Useful as index of cleanliness in clean-room operations in manufacturing of semiconductor devices, magnetic recording media, optical devices, and pharmaceutical and biotechnological products.
A bidirectional reflectometer system was developed for in situ measurements of the changes in spectral reflectance of surfaces contaminated with films of organic materials. The system permits experiments with films of controlled thickness in an environment that simulates the thermal, radiation, and vacuum conditions of space. The mechanical and optical construction of the reflectometer are discussed in detail, and actual data curves are used to illustrate its operation and performance.
In technique to detect surface contamination, object inspected illuminated by ultraviolet light to make contaminants fluoresce; low-light-level video camera views fluorescence. Image-processing techniques quantify distribution of contaminants. If fluorescence of material expected to contaminate surface is not intense, tagged with low concentration of dye.
Surface contamination effects on behavior of liquids in space vehicle tanks at zero gravity
Solid surface preparation and characterization apparatus - interaction of gas molecules and solid surface applied to surface contamination research
An apparatus denoted a swab device has been developed as a convenient means of acquiring samples of contaminants from surfaces and suspending the samples in liquids. (Thereafter, the liquids can be dispensed, in controlled volumes, into scientific instruments for analysis of the contaminants.) The swab device is designed so as not to introduce additional contamination and to facilitate, simplify, and systematize the dispensing of controlled volumes of liquid into analytical instruments. The swab device is a single apparatus into which are combined all the equipment and materials needed for sampling surface contamination. The swab device contains disposable components stacked together on a nondisposable dispensing head. One of the disposable components is a supply cartridge holding a sufficient volume of liquid for one complete set of samples. (The liquid could be clean water or another suitable solvent, depending on the application.) This supply of liquid is sealed by Luer valves. At the beginning of a sampling process, the user tears open a sealed bag containing the supply cartridge. A tip on the nondisposable dispensing head is engaged with a Luer valve on one end of the supply cartridge and rotated, locking the supply cartridge on the dispensing head and opening the valve. The swab tip includes a fabric swab that is wiped across the surface of interest to acquire a sample. A sealed bag containing a disposable dispensing tip is then opened, and the swab tip is pushed into the dispensing tip until seated. The dispensing head contains a piston that passes through a spring-loaded lip seal. The air volume displaced by this piston forces the liquid out of the supply cartridge, over the swab, and into the dispensing tip. The piston is manually cycled to enforce oscillation of the air volume and thereby to cause water to flow to wash contaminants from the swab and cause the resulting liquid suspension of contaminants to flow into the dispensing tip. After several cycles to ensure adequate mixing, liquid containing the suspended contaminant sample is dispensed. The disposable components are then removed from the dispensing head, which may then be reused with a fresh set of disposable components.
MOTIVATION: We present an optimization technique for propulsive vehicles that autonomously minimizes contamination during surface approach and landing. In addition to short-range hoppers, the optimization technique is also fully applicable to traditional orbit-to-surface landers. This study addresses scenarios where surface alterations from propulsion events are counterproductive or hazardous to the mission objectives. This is of immediate interest for landers (whether human or robotic), that may rely on pristine soils collected in the immediate vicinity of landing sites to accomplish science investigations, mining, or ISRU surface operations. Such missions are averse to various surface-plume interactions such as thermal scoring, physical agitation, and contamination. The capability can be applied with minimal impact to the baseline mission concept. METHODS: Optimization algorithms have been developed to calculate descent trajectories and maneuvers, thrust magnitude, and attitude for various mission cases. These parameters are determined as an optimal solution when minimizing either fuel consumption, contamination deposited at the landing site, or some weighted combination of both. Among constraints imposed on the solution, we examined pitch rate, vertical takeoff and vertical landing (VTVL) requirements, size of the contamination zone, and minimum ground clearance during flight. This tool provides unique, non-intuitive solutions and can be a valuable resource for mission planners. RESULTS: A variety of agile trajectory solutions were obtained, each yielding different reductions in landing site contamination and corresponding to only modest increases in fuel consumption. Several optimal trajectories were obtained by varying the contamination weight in the fitness function. As expected, when the contamination weight is zero, the trajectory appears close to parabolic since the optimization scheme only attempts to minimize for fuel utilization, yielding essentially, the expected ballistic trajectory. Notably for contamination weights greater than zero, trajectory inflections are observed in the descent phase, which manifests as hovering or additional, mini “pseudo hops” before the final touchdown. A trajectory inflection is characterized by arresting the majority of the spacecraft vertical velocity component at a coordinate outside of the landing target, and without violating ground clearance constraints. FUTURE WORK: Our optimization technique is ready for laboratory or field demonstrations to validate the sophisticated maneuvering solutions obtained for fuel optimization and surface preservation. An appropriate testbed would validate the optimal guidance algorithms, the navigation system, and sensor suite by emulating vehicle flight in closed loop robotic tests. Critically, these algorithms could then be ported to flight software for implementation.
Polystyrene latex (PSL) microspheres have been utilized as seed material for flow visualization in wind tunnels. However, PSL microspheres have been observed to strongly adhere to wind tunnel and model surfaces. Surface contamination on the cleaning screens that remove vorticity and provide laminar flow in the test section, is particularly problematic. Agglomeration of particles on these screens cause constriction of the airflow through the screen resulting in inconsistent airflow properties in the test section. The adhesion mechanism of PSL microspheres to wind tunnel screens and 316 stainless steel flat plates, were evaluated in a contamination apparatus where small sections of screen material were exposed to PSL-seeded airflow. Using a design of experiments (DOE) methodology airflow seeding parameters were changed to evaluate how these modifications affected the degree of surface contamination. The solution composition, comprised of ethanol and water, was determined to be the most significant factor in particle adhesion. Utilizing image analysis software, data were collected from the contaminated surfaces and incorporated to generate predictive particle contamination models. A relationship was identified between the solvent evaporation rate, and the morphology and magnitude of PSL contaminants on the test surfaces. This analysis can be extended to other solvent mixtures to provide insight into simultaneously improving wind tunnel testing capabilities while diminishing facility contamination.
Many industrial and aerospace processes involving the joining of materials, require sufficient surface cleanliness to insure proper bonding. Processes as diverse as painting, welding, or the soldering of electronic circuits will be compromised if prior inspection and removal of surface contaminants is inadequate. As process requirements become more stringent and the number of different materials and identified contaminants increases, various instruments and techniques have been developed for improved inspection. One such technique based on the principle of Optically Stimulated Electron Emission (OSEE) has been explored for a number of years as a tool for surface contamination monitoring. Some of the benefits of OSEE are: it's non-contacting; requires little operator training; and has very high contamination sensitivity. This paper describes the development of a portable OSEE based surface contamination monitor. The instrument is suitable for both hand-held and robotic inspections with either manual or automated control of instrument operation. In addition, instrument output data is visually displayed to the operator and may be output to an external computer for archiving or analysis.
Indirect measurement of wafer surface impurities has sensitivity of 300 monolayers. Photoconductivity-decay apparatus determines bulk recombination lifetime in semiconductor materials. Bulk impurity levels before and after annealing relate to level of surface contamination. Method evaluates wafer cleaning techniques, qualifying purity of chemical and deionized water used, or monitors production process.
This viewgraph presentation reviews surface contaminants, solar wind radiation damage, and Silicon substrate damage analysis from the GENESIS sample return mission.
The Temperature-Controlled Quartz Crystal Microbalance (TQCM) system was flown on the Spacelab I Mission as part of the Induced Environment Contamination Monitor to monitor surface contamination (SC) in the payload bay. SC on the five sensors of the TQCM was analyzed by means of IR spectroscopy, scanning electron spectroscopy, and energy dispersive X-ray fluorescence. The amount of SC ranged from 1.4 micrograms/sq cm for the -Z sensor to 39.9 micrograms/sq cm for the +X sensor. The IR analysis showed strong CH2, CH3, and carbonyl absorption bands, indicative of ester and polyester compounds found in adhesives, plasticizers, and tape. The particulates (mostly ranging from 1 micron to 20 microns in size) were mainly composed of Mg, Al, Al2O3, and Si, and probably originated in the solid rocket firings.
Many industrial and aerospace processes involving the joining of materials, require sufficient surface cleanliness to insure proper bonding. Processes as diverse as painting, welding, or the soldering of electronic circuits will be compromised if prior inspection and removal of surface contaminants is inadequate. As process requirements become more stringent and the number of different materials and identified contaminants increases, various instruments and techniques have been developed for improved inspection. One such technique, based on the principle of Optically Stimulated Electron Emission (OSEE), has been explored for a number of years as a tool for surface contamination monitoring. Some of the benefits of OSEE are: it is non-contacting; requires little operator training; and has very high contamination sensitivity. This paper describes the development of a portable OSEE based surface contamination monitor. The instrument is suitable for both hand-held and robotic inspections with either manual or automated control of instrument operation. In addition, instrument output data is visually displayed to the operator and may be sent to an external computer for archiving or analysis.
Corrosion products, oils and greases can potentially degrade material bonding properties. The Marshall Space Flight Center (MSFC) Surface Contamination Analysis Team (SCAT) utilizes a variety of analytical equipment to detect identify and quantify contamination on metallic and non-metallic substrates. Analysis techniques include FT-IR Microscopy (FT-IR), Near Infrared Optical Fiber Spectrometry (NIR), Optically Stimulated Electron Emission (OSEE), Ultraviolet Fluorescence (UVF) and Ellipsometry. To insure that consistent qualitative and quantitative information are obtained, standards are required to develop analysis techniques, to establish instrument sensitivity to potential contaminants, and to develop calibration curves. This paper describes techniques for preparing and preserving contamination standards. Calibration of surface contamination analysis systems is discussed, and methods are presented for evaluating the effects of potential contaminants on bonding properties.
Surface contamination generated by construction materials for aerospace and ordnance uses
Operation of indium adhesion surface tester for surface contamination measurements
The bonding of liner material to the inner metal surfaces of solid rocket booster cases is adversely affected by minute amounts of impurities on the metal surface. Suitable non-destructive methods currently used for detecting these surface contaminants do not provide the means of identifying their elemental composition. The feasibility of using isotopic source excited energy dispersive X-ray fluorescence as a possible technique for elemental analysis of such contaminants is investigated. A survey is made of the elemental compositions of both D-6ac steel, a common construction material for the booster cases, and Conoco HD-2 grease, a common surface contamination. Source and detector choices that maximize signal to noise ratio in a Recessed Source Geometry are made. A Monte Carlo simulation is then made of the optimized device incorporating the latest available X-ray constants at the energy of the chosen source to determine the device's response to a D-6ac steel surface contained with Conoco HD-2 grease.
Medium temperature baking (300- 350 °C) enhances the quality factor of niobium superconducting radio frequency cavities. However, surface contamination introduced during vacuum furnace baking limits the quench field and may also degrade the quality factor of the cavity. To investigate this effect, a 1.3 GHz single-cell Nb cavity underwent mid-T baking, followed by a chemical treatment to remove the surface contaminants. Post-treatment measurements revealed a significant improvement in both the quality factor and the quench field.