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Specimen holder for X ray diffraction analysis presents the specimen to the incident X rays in a curvature. This permits the use of an X ray beam having a larger divergence angle, the beam intensity is increased, and the statistical accuracy of analysis is improved.
Reduces spectral contamination by spurious X-ray. Specimen holder made of compressed carbon, securely retains standard electron microscope grid (disk) 3 mm in diameter and absorbs backscattered electrons that otherwise generate spurious X-rays. Since holder inexpensive, dedicated to single specimen when numerous samples examined.
Fixture holds sheet specimens for flammability tests. Frame and clamps designed to minimize local overstress on specimen. Heat capacity of fixture low, interfering less with interpretation of results of test by drawing less heat away from specimen. Accepts films, fabrics, foams, and other sheets, rigid or flexible. Specimens thin or thick, or of variable thickness. Bent to accommodate curved rigid specimens. Also used for such other tests as particle-impact tests.
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Test specimen and loading frame developed for fatigue and fracture testing of materials under mode-II (sliding-mode) loading. Assembly placed in compression-testing machine. Loads directed oppositely along centerline cause self-similar crack to propagate. Enables consistently accurate alignment of specimens before insertion of specimen/frame assemblies into compression-testing machine. Makes design attractive for testing in hostile environments in which access to machine or furnace limited. Additional feature, with little or no modification, placed horizontally into impact testing machine and subjected to loading at high speeds.
This ECAR calculates the fluence and temperature of the AGC-1 specimens as they change elevation through the course of the experiment. The specimen elevation varies as the specimen stack shrinks due to irradiation and load induced creep. The compressed specimen stacks (S-1 thru S-6) have a graphite pushrod that applies a gas cylinder load. The top of the pushrod position is measured and recorded in the NGNP Data Management and Analysis System (NDMAS). The bottom of each of these compressed stacks is supported by the lower specimen holder which also shrinks as a result of irradiation and load. The specimen holder post-irradiation length was recorded during post-irradiation examination (PIE). Assuming the specimen holder shrinkage is linear with respect to the fluence received, the position of the top of the specimen holder can be calculated with respect to reactor integrated power. Assuming that individual specimen shrinkage is proportional to the fluence received, and that the shrinkage behavior is similar in all the specimens, the individual specimen position can be calculated.
Microscope-stage holder keeps filter pad flat to keep it in focus. Specimen holder is special vacuum chuck that applies suction through flat screen. Suction keeps filter pad flat against specimen holder while microscope stage moving to scan areas denoted by grid. In microscope system equipped with video camera, image-analyzing/particle-counting computer, and automatic focus, use of stage speeds count considerably by eliminating need to stop frequently for manual refocusing. Technician free to perform other tasks while computer controls translation of stage and takes count automatically.
Single-ended notch design facilitates accurate measurements of crack progression. Novel test specimen and novel loading fixture and fracture testing of materials under Mode II, or sliding-mode, loading. Testing required for analysis of failures in structural materials, bearings, and the like.
Small mass-spectrometer specimens are positioned in three dimensions by manipulator that employs two bellows to provide vacuum seal and accommodate movement of specimen holder. Inner bellows and outer bellows accommodate vertical and horizontal motion, respectively. Y-axis movement is in and out of plane of page. Specimen-holder column is hollow so electrical wires can pass through it to specimen.
Cryogenic transmission electron microscopy has revolutionized structural biology and materials science. To image below liquid nitrogen temperatures, various liquid helium stages have been constructed but have proven to be complex and unstable, making high-resolution imaging challenging. This problem is even more pronounced in side-entry specimen holders common on modern transmission electron microscopes. Here, we introduce an ultracold liquid helium transmission electron microscope side-entry specimen holder, featuring continuous cryogen flow and vibration decoupling. This instrument is compatible with modern aberration-corrected microscopes and achieves sub-25 K base temperature, ±2 mK thermal stability over many hours, and atomic resolution—setting the stage for a new era of cryogenic electron microscopy.
New instrument allows in situ measurement of flow resistivity on Earth's ground surface. Nonintrusive instrument includes specimen holder inserted into ground. Flow resistivity measured by monitoring compressed air passing through flow-meters; pressure gages record pressure at ground surface. Specimen holder with knife-edged inner and outer cylinders easily driven into ground. Air-stream used in measuring flow resistivity of ground enters through quick-connect fitting and exits through screen and venthole.
Effects of specimen preparation on measured values of an acrylic's electomagnetic properties at X-band microwave frequencies, TE sub 1,0 mode, utilizing an automatic network analyzer have been studied. For 1 percent or less error, a gap between the specimen edge and the 0.901-in. wall of the specimen holder was the most significant parameter. The gap had to be less than 0.002 in. The thickness variation and alignment errors in the direction parallel to the 0.901-in. wall were equally second most significant and had to be less than 1 degree. Errors in the measurement f the thickness were third most significant. They had to be less than 3 percent. The following parameters caused errors of 1 percent or less: ratios of specimen-holder thicknesses of more than 15 percent, gaps between the specimen edge and the 0.401-in. wall less than 0.045 in., position errors less than 15 percent, surface roughness, hickness variation in the direction parallel to the 0.401-in. wall less than 35 percent, and specimen alignment in the direction parallel to the 0.401-in. wall mass than 5 degrees.
In-situ observation has expanded the application of transmission electron microscopy (TEM) and has made a significant contribution to materials research and development for energy, biomedical, quantum, etc. Recent technological developments related to in-situ TEM have empowered the incorporation of three-dimensional observation, which was previously considered incompatible. In this review article, we take up heating as the most commonly used external stimulus for in-situ TEM observation and overview recent in-situ TEM studies. Then, we focus on the electron tomography (ET) and in-situ heating combined observation by introducing the authors’ recent research as an example. Assuming that in-situ heating observation is expanded from two dimensions to three dimensions using a conventional TEM apparatus and a commercially available in-situ heating specimen holder, the following in-situ heating-and-ET observation procedure is proposed: (i) use a rapid heating-and-cooling function of a micro-electro-mechanical system holder; (ii) heat and cool the specimen intermittently and (iii) acquire a tilt-series dataset when the specimen heating is stopped. This procedure is not too technically challenging and can have a wide range of applications. Essential technical points for a successful 4D (space and time) observation will be discussed through reviewing the authors’ example application.
A small, lightweight, compact, hand-held photomicroscope provides simultaneous viewing and photographing, with adjustable specimen illumination and exchangeable camera format. The novel photomicroscope comprises a main housing having a top plate, bottom plate, and side walls. The objective lens is mounted on the top plate in an inverted manner relative to the normal type of mounting. The specimen holder has an adjusting mechanism for adjustably moving the specimen vertically along an axis extending through the objective lens as well as transverse of the axis. The lens system serves to split the beam of light into two paths, one to the eyepiece and the other to a camera mounting. A light source is mounted on the top plate and directs light onto the specimen. A rheostat device is mounted on the top plate and coupled to the power supply for the light source so that the intensity of the light may be varied.
This project developed a prototype in-situ specimen holder product to transmission electron microscope (TEM) users that drastically expand the usability of TEM by combining nanoscale laser excitation and optical signal collection. A commercial prototype has been constructed and a few nanoscale materials characterization experiments have been performed to validate its performance and demonstrate its utility in real scientific studies, for example, in-situ characterization and mapping of defects in the synthesis of nanostructures.
X-ray detection by energy-dispersive spectrometry in the analytical electron microscope (AEM) is often limited by low collected X-ray intensity (P), modest peak-to-background (P/B) ratios, and limitations on total counting time (tau) due to specimen drift and contamination. A new AFM has been designed with maximization of P. P/B, and tau as the primary considerations. Maximization of P has been accomplished by employing a field-emission electron gun, X-ray detectors with high collection angles, high-speed beam blanking to allow only one photon into the detector at a time, and simultaneous collection from two detectors. P/B has been maximized by reducing extraneous background signals generated at the specimen holder, the polepieces and the detector collimator. The maximum practical tau has been increased by reducing specimen contamination and employing electronic drift correction. Performance improvments have been measured using the NIST standard Cr thin film. The 0-3 steradian solid angle of X-ray collection is the highest value available. The beam blanking scheme for X-ray detection provides 3-4 times greater throughput of X-rays at high count rates into a recorded spectrum than normal systems employing pulse-pileup rejection circuits. Simultaneous X-ray collection from two detectors allows the highest X-ray intensity yet recorded to be collected from the NIST Cr thin film. The measured P/B of 6300 is the highest level recorded for an AEM. In addition to collected X-ray intensity (cps/nA) and P/B measured on the standard Cr film, the product of these can be used as a figure-of-merit to evaluate instruments. Estimated minimum mass fraction (MMF) for Cr measured on the standard NIST Cr thin film is also proposed as a figure-of-merit for comparing X-ray detection in AEMs. Determinations here of the MMF of Cr detectable show at least a threefold improvement over previous instruments.
An airflow resistivity instrument features a novel specimen holder, especially designed for in situ measurement on the earth's ground surface. This capability eliminates the disadvantages of prior intrusive instruments, which necessitate the removal of a test specimen from the ground. A prototype instrument can measure airflow resistivities in the range 10-5000 cgs rayl/cm, at specimen depths up to 15.24 cm (6 in.), and at differential pressures up to 2490.8 dyn sq cm (1 in. H2O) across the specimen. Because of the close relationship between flow resistivity and acoustic impedance, this instrument should prove useful in acoustical studies of the earth's ground surface. Results of airflow resistivity measurements on an uncultivated grass field for varying values of moisture content are presented.
Radial distribution profiles of elemental carbon in lunar soils consisting of particles in the size range of 50 to 150 microns were investigated. Initial experiments on specimen preparation and the analysis of prepared specimens by Auger electron spectrometry (AES) and scanning electron microscopy (SEM) are described. Results from splits of samples 61501,84 and 64421,11, which were mounted various ways in several specimen holders, are presented. A low carbon content was observed in AES spectra from soil particles that were subjected to sputter-ion cleaning with 960eV argon ions for periods of time up to a total exposure for one hour. This ion charge was sufficient to remove approximately 70 nm of material from the surface. All of the physically adsorbed carbon (as well as water vapor, etc.) would normally be removed in the first few minutes, leaving only carbon in the specimen, and metal support structure, to be detected thereafter.