DOE OSTI2024
Concentrating Solar Power (CSP) requires precision mirrors, and these in turn require metrology systems to measure their optical slope. In this project we studied a color-based approach to the correspondence problem, which is the association of points on an optical target with their corresponding points seen in a reflection. This is a core problem in deflectometry-based metrology, and a color solution would enable important new capabilities. We modeled color as a vector in the [R,G,B] space measured by a digital camera, and explored a dual-image approach to compensate for inevitable changes in illumination color. Through a series of experiments including color target design and dual-image setups both indoors and outdoors, we collected reference/measurement image pairs for a variety of configurations and light conditions. We then analyzed the resulting image pairs by selecting example [R,G,B] pixels in the reference image, and seeking matching [R,G,B] pixels in the measurement image. Modulating a tolerance threshold enabled us to assess both match reliability and match ambiguity, and for some configurations, orthorectification enabled us to assess match accuracy. Using direct-direct imaging, we demonstrated color correspondence achieving average match accuracy values of 0.004 h, where h is the height of the color pattern. We found that wide-area two-dimensional and linear one-dimensional color targets outperformed hybrid linear/lateral gradient targets in the cases studied. Introducing a mirror degraded performance under our current techniques, and we did not have time to evaluate whether matches could be reliably achieved despite varying light conditions. Nonetheless, our results thus far are promising.