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All sourcesNASA NTRSDOE OSTI
NASA NTRS2005

Computational Model Tracking Primary Electrons, Secondary Electrons, and Ions in the Discharge Chamber of an Ion Engine

Computational modeling of the plasma located in the discharge chamber of an ion engine is an important activity so that the development and design of the next generation of ion engines may be enhanced. In this work a computational tool called XOOPIC is used to model the primary electrons, secondary electrons, and ions inside the discharge chamber. The details of this computational tool are discussed in this paper. Preliminary results from XOOPIC are presented. The results presented include particle number density distributions for the primary electrons, the secondary electrons, and the ions. In addition the total number of a particular particle in the discharge chamber as a function of time, electric potential maps and magnetic field maps are presented. A primary electron number density plot from PRIMA is given in this paper so that the results of XOOPIC can be compared to it. PRIMA is a computer code that the present investigators have used in much of their previous work that provides results that compare well to experimental results. PRIMA only models the primary electrons in the discharge chamber. Modeling ions and secondary electrons, as well as the primary electrons, will greatly increase our ability to predict different characteristics of the plasma discharge used in an ion engine.

Mahalingam, Sudhakar↗
NASA NTRS1979

Secondary electron effects on spacecraft charging

Calculations were conducted to determine the effects of electron-produced secondary electrons on the net charging current and the equilibrium voltage of spacecraft surfaces immersed in hot (keV) plasmas. The effects of secondary electrons produced by the primary plasma electrons were examined for aluminum, Teflon, Mylar, and Kapton. The results indicate that it is the primary electron energy region over which the secondary electrons are emitted (rather than the ratio of secondary to primary electrons) which determines the effectiveness of the secondary electrons in limiting the net charging current. While the electron-produced secondary electrons decreased the charging current, they had little effect upon the equilibrium voltages attained.

Haffner, J. W.↗
NASA NTRS1966

Secondary electron emission

Secondary electron emission from porous tungsten surfaces to determine mechanisms of beam enhancement in ion rocket thrust augmentor

ION BEAM↗
NASA NTRS1981

Secondary electron emission from electrically charged fluorinated-ethylene-propylene Teflon for normal and non-normal electron incidence

The secondary electron emission coefficient was measured for a charged polymer (FEP-Teflon) with normally and obliquely incident primary electrons. Theories of secondary emission are reviewed and the experimental data is compared to these theories. Results were obtained for angles of incidence up to 60 deg in normal electric fields of 1500 V/mm. Additional measurements in the range from 50 to 70 deg were made in regions where the normal and tangential fields were approximately equal. The initial input angles and measured output point of the electron beam could be analyzed with computer simulations in order to determine the field within the chamber. When the field is known, the trajectories can be calculated for impacting electrons having various energies and angles of incidence. There was close agreement between the experimental results and the commonly assumed theoretical model in the presence of normal electric fields for angles of incidence up to 60 deg. High angle results obtained in the presence of tangential electric fields did not agree with the theoretical models.

Budd, P. A.↗
NASA NTRS2010

Lunary Dust Grain Charging by Electron Impact: Complex Role of Secondary Electron Emissions in Space Environments

Dust grains in various astrophysical environments are generally charged electrostatically by photoelectric emissions with radiation from nearby sources, or by electron/ion collisions by sticking or secondary electron emissions (SEES). The high vacuum environment on the lunar surface leads to some unusual physical and dynamical phenomena involving dust grains with high adhesive characteristics, and levitation and transportation over long distances. Knowledge of the dust grain charges and equilibrium potentials is important for understanding a variety of physical and dynamical processes in the interstellar medium, and heliospheric, interplanetary/ planetary, and lunar environments. It has been well recognized that the charging properties of individual micron-/submicron-size dust grains are expected to be substantially different from the corresponding values for bulk materials. In this paper, we present experimental results on the charging of individual 0.2-13 m size dust grains selected from Apollo 11 and 17 dust samples, and spherical silica particles by exposing them to mono-energetic electron beams in the 10-200 eV energy range. The dust charging process by electron impact involving the SEES discussed is found to be a complex charging phenomenon with strong particle size dependence. The measurements indicate substantial differences between the polarity and magnitude of the dust charging rates of individual small-size dust grains, and the measurements and model properties of corresponding bulk materials. A more comprehensive plan of measurements of the charging properties of individual dust grains for developing a database for realistic models of dust charging in astrophysical and lunar environments is in progress.

Abbas, M. M.↗
NASA NTRS2024

Secondary Electron Suppression with Carbonized Aerogels

The goal addressed by this project is reduced DC power for high data rate RF communications by increasing the efficiency of traveling Wave Tubes (TWT) for RF communication, which are used by most space missions for communication and radio science at microwave frequencies. The capability needed is a robust electron collector surface with a secondary electron emission lower than ordinary graphite, which is the state of the art. While it is known that replacing a smooth surface with a textured one will reduce secondary electron emission, no robust textured surface is known. Carbonized polyimide aerogels promise the necessary robustness along with reduced secondary electron emission, allowing further improvement of TWT efficiency, achieving a very good return on the low investment made. Aerogels are known to be robust materials, and carbon aerogels are expected to have low secondary electron emission because of their open surface structure. The objective of this proposal is to demonstrate the low secondary electron emission of carbon aerogels and their robustness.

Secondary electron sippression↗
NASA NTRSDate not supplied

Measurement of Secondary Electron Yield from Dielectric Materials

Secondary Electron Yield (SEY) is a material property that plays a fundamental role in material and spacecraft charging. SEY values for dielectric materials (insulators) are crucial inputs to models used to assess mission risk posed by high differential voltages and electrostatic discharge (ESD) on spacecraft. There are only two (non-NASA) facilities that attempt such measurements. The lack of NASA capability results in high cost and long, unpredictable schedules to obtain measurements. Future Artemis crewed lunar surface missions will involve the first use of many insulating materials for which SEY properties are poorly understood or absent entirely. Unconstrained SEY values in models increase uncertainty in charging/ESD risk assessment. The capability for reliable SEY determination will lead to improved charging and ESD risk assessments. We are developing a new capability, using pulsed ultralow (<femtoampere) incident electron beam intensity to eliminate sample charging, coupled with sensitive non-contact surface potential measurements, to measure secondary electron yield (SEY) from insulating materials. Present methods for SEY measurement on insulators suffer from highly inconsistent results due to sample charging from the incident electron beam during the measurement. In this first phase we are leveraging existing EM41 instrumentation, facilities, and expertise to perform proof-of-concept tests.

secondary electron emission↗
NASA NTRS1985

Textured carbon on copper: A novel surface with extremely low secondary electron emission characteristics

Experimentally determined values of true secondary electron emission and relative values of reflected primary electron yield for a range of primary electron beam energies and beam impingement angles are presented for a series of novel textured carbon surfaces on copper substrates. (All copper surfaces used in this study were oxygen-free, high-conductivity grade). The purpose of this investigation is to provide information necessary to develop high-efficiency multistage depressed collectors (MDC's) for microwave amplifier traveling-wave tubes (TWT's) for communications and aircraft applications. To attain the highest TWT signal quality and overall efficiency, the MDC electrode surface must have low secondary electron emission characteristics. While copper is the material most commonly used for MDC electrodes, it exhibits relatively high levels of secondary electron emission unless its surface is treated for emission control. The textured carbon surface on copper substrate described in this report is a particularly promising candidate for the MDC electrode application. Samples of textured carbon surfaces on copper substrates typical of three different levels of treatment are prepared and tested for this study. The materials are tested at primary electron beam energies of 200 to 2000 eV and at direct (0 deg) to near-grazing (85 deg) beam impingement angles. True secondary electron emission and relative reflected primary electron yield characteristics of the textured surfaces are compared with each other and with those of untreated copper. All the textured carbon surfaces on copper substrate tested exhibited sharply lower secondary electron emission characteristics than those of an untreated copper surface.

Curren, A. N.↗
NASA NTRS1992

Secondary electron yields of solar system ices

The secondary electron yields of H2O, CO2, NH3, and CH3OH ices have been measured as a function of electron beam energy in the 2- to 30-keV energy range. The ices were produced on a liquid-nitrogen-cooled cold finger and transferred under vacuum to a SEM where the yield measurements were made. The imaging capabilities of the SEM provide a means of correlating the yield measurements with the morphology of the ices and are also used to monitor charging effects. The yields were determined by measuring the amplified current from a secondary electron detector and calibrating this current signal with the amplified current signal from samples of metals with known secondary electron yields. Each of the measured yields is found to decrease with an increase in energy in the 2- to 30-keV range. Estimates are given for the maximum secondary electron yield Y(max) of each ice and the energy at which this maximum yield occurs. Implications for the charging of solar system ice grains are discussed.

Suszcynsky, David M.↗
NASA NTRS2006

Secondary Electron Emission and the Exploration of Space

The emission of secondary electrons from surfaces exposed to the space plasma and radiation environment is a process of great importance to space system engineering design and operations. A spacecraft will collect charge until it reaches an equilibrium potential gov,erned by the balance of incoming electron and ion currents from the space environment with outgoing secondary, backscattered, and photoelectron currents. Laboratory measurements of secondary electron yields are an important parameter for use in spacecraft charging analyses because the magnitude and sign of the equilibrium potential depends on both the energy spectrum of electrons and ions in the space environment and the electrical properties of the surface materials (including the energy dependent secondary electron yields). Typical benign equilibrium potentials range &om a few tens of volts positive in interplanetary space to a few volts negative in low Earth orbit. However, spacecraft are known to charge to negative potentials exceeding one to ten kilovolts in some environments and anomalies or system failures due to electrostatic discharges originating from highly charged surfaces becomes a serious concern. This presentation will provide a review of the spacecraft charging process with special emphasis on the role of secondary electrons in controlling the current balance process. Charging examples will include spacecraft in Earth orbit and interplanetary space as well as dust charging on the lunar surface, a phenomenon of importance to future lunar surface operations.

Minow, Joseph I.↗
NASA NTRS2008

Lunar Dust Charging by Secondary Electron Emission and its Complex Role in the Lunar Environment

The lunar surface is covered with a thick layer of micron/sub-micron size dust grains formed by billions of years of meteoritic impact. With virtually no atmosphere and exposed to the solar wind plasma and solar electromagnetic radiation, the lunar surface and the dust grains are electrostatically charged. The dominant charging processes include: photoelectric emissions (UV, X-rays), impact of solar wind electrons and ions, and secondary electron emissions (SEE) induced by energetic solar wind electrons. During the Apollo missions, the astronauts found the lunar dust to be extraordinarily high in its adhesive characteristics, sticking to the suits and the mechanical equipment. Electrostatically charged lunar dust is believed to be transported over long distances by the induced electric fields, as indicated by the observed dust streamers and the horizon glow [e.g., 1-3]. The hazardous effects of dust in the lunar environment are recognized to be one of the major issues that must be addressed in planning the forthcoming missions for robotic and human exploration of the Moon. Theoretical studies are being performed along with the development of analytical models and a variety of experimental investigations, to better understand the lunar dust phenomena. [e.g., 4-6]. The lunar dust is believed to be charged negatively on the lunar night-side by interaction With solar wind electrons. However, rigorous theoretical expressions for calculation of SEE yields and the sticking efficiencies of individual micron size dust grains are not yet available, and the information has to be obtained by experiment. On theoretical considerations, however, it is well recognized that SEE yields, similar to the photoelectric yields for small-size grains, would be totally different from the corresponding bulk values [e.g., 7-9]. Some theoretical models for charging of individual small spherical particles have been developed [e.g., 10], and some limited measurements on individual metallic dust grains at keV electron energies have been made [e.g., i 1]. In this paper, we present the first measurements of the secondary electron emission yields of individual micron/sub-micron size dust grains selected from sample returns of Apollo 11 and Apollo 17 missions.

Abbas, M. M.↗
NASA NTRS2013

Study of the Effects of the Electric Field on Charging Measurements on Individual Micron-size Dust Grains by Secondary Electron Emissions

The dust charging by electron impact is an important dust charging process in Astrophysical, Planetary, and the Lunar environments. Low energy electrons are reflected or stick to the grains charging the dust grains negatively. At sufficiently high energies electrons penetrate the grain leading to excitation and emission of electrons referred to as secondary electron emission (SEE). Available theoretical models for the calculation of SEE yield applicable for neutral, planar or bulk surfaces are generally based on Sternglass Equation. However, viable models for charging of individual dust grains do not exist at the present time. Therefore, the SEE yields have to be obtained by some experimental methods at the present time. We have conducted experimental studies on charging of individual micron size dust grains in simulated space environments using an electrodynamic balance (EDB) facility at NASA-MSFC. The results of our extensive laboratory study of charging of individual micron-size dust grains by low energy electron impact indicate that the SEE by electron impact is a very complex process expected to be substantially different from the bulk materials. It was found that the incident electrons may lead to positive or negative charging of dust grains depending upon the grain size, surface potential, electron energy, electron flux, grain composition, and configuration. In this paper we give a more elaborate discussion about the possible effects of the AC field in the EDB on dust charging measurements by comparing the secondary electron emission time-period (tau (sub em) (s/e)) with the time-period (tau (sub ac) (ms)) of the AC field cycle in the EDB that we have briefly addressed in our previous publication.

Tankosic, D.↗
NASA NTRS1981

Secondary Electron Emission Yields

The secondary electron emission (SEE) characteristics for a variety of spacecraft materials were determined under UHV conditions using a commercial double pass CMA which permits sequential Auger electron electron spectroscopic analysis of the surface. The transparent conductive coating indium tin oxide (ITO) was examined on Kapton and borosilicate glass and indium oxide on FED Teflon. The total SEE coefficient ranges from 2.5 to 2.6 on as-received surfaces and from 1.5 to 1.6 on Ar(+) sputtered surfaces with 5 nm removed. A cylindrical sample carousel provides normal incidence of the primary beam as well as a multiple Faraday cup measurement of the approximately nA beam currents. Total and true secondary yields are obtained from target current measurements with biasing of the carousel. A primary beam pulsed mode to reduce electron beam dosage and minimize charging of insulating coatings was applied to Mg/F2 coated solar cell covers. Electron beam effects on ITO were found quite important at the current densities necessary to do Auger studies.

Krainsky, I.↗
NASA NTRS1991

Procedures for Including Secondary Electron Emission in Numerical Simulations of Plasma-Insulator Interactions

Previous Monte Carlo simulations provide a data base for properties of secondary electron emission (SEE) from insulators and metals. Incident primary electrons are considered at energies up to 1200 eV. The behavior of secondary electrons is characterized by (1) yield vs. primary energy E(sub p), (2) distribution vs. secondary energy E(sub s), and (3) distribution vs. angle of emission theta. Special attention is paid to the low energy range E(sub p) up to 50 eV, where the number and energy of secondary electrons is limited by the finite band gap of the insulator. For primary energies above 50 eV the SEE yield curve can be conveniently parameterized by a Haffner formula. The energy distribution of secondary electrons is described by an empirical formula with average energy about 8.0 eV. The angular distribution of secondaries is slightly more peaked in the forward direction than the customary cos theta distribution. Empirical formulas and parameters are given for all yield and distribution curves. Procedures and algorithms are described for using these results to find the SEE yield, and then to choose the energy and angle of emergence of each secondary electron. These procedures can readily be incorporated into numerical simulations of plasma-solid surface interactions in low earth orbit.

Beyst, Brian↗
NASA NTRS1984

Secondary electron emission characteristics of ion-textured copper and high-purity isotropic graphite surfaces

Experimentally determined values of true secondary electron emission and relative values of reflected primary electron yield for untreated and ion textured oxygen free high conductivity copper and untreated and ion textured high purity isotropic graphite surfaces are presented for a range of primary electron beam energies and beam impingement angles. This investigation was conducted to provide information that would improve the efficiency of multistage depressed collectors (MDC's) for microwave amplifier traveling wave tubes in space communications and aircraft applications. For high efficiency, MDC electrode surfaces must have low secondary electron emission characteristics. Although copper is a commonly used material for MDC electrodes, it exhibits relatively high levels of secondary electron emission if its surface is not treated for emission control. Recent studies demonstrated that high purity isotropic graphite is a promising material for MDC electrodes, particularly with ion textured surfaces. The materials were tested at primary electron beam energies of 200 to 2000 eV and at direct (0 deg) to near grazing (85 deg) beam impingement angles. True secondary electron emission and relative reflected primary electron yield characteristics of the ion textured surfaces were compared with each other and with those of untreated surfaces of the same materials. Both the untreated and ion textured graphite surfaces and the ion treated copper surface exhibited sharply reduced secondary electron emission characteristics relative to those of untreated copper. The ion treated graphite surface yielded the lowest emission levels.

Curren, A. N.↗