Solving inverse problems in process-structure-property linkage with Gaussian process regression.
Abstract not provided.
Tran, Anh↗
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Use of Graph Theory and Neural Networks for Microstructural Classification
Recent advances in materials data analytics have provided new avenues for determining process-structure-property (PSP) linkages in a variety of materials. Machine learning techniques including few-shot learning have increased the efficiency of classifying microscopy images for the purposes of material characterization. Modifications in segmentation also show potential in improving the accuracy of our current pyCHIP classifier. Replacing previous encoders trained on ImageNet with those trained on microscopy images like MicroNet has initially shown better performance at classifying images of irradiated samples. Additionally, different normalization approaches were tested to show no discernable effect on classification. The Louvain method for community detection is analyzed on a set of irradiated samples with different parameters to determine which proved beneficial under what circumstances. We suggest that microscopy experiments be automated in the future using a combination of these techniques to enable high-throughput analyses.
36 MATERIALS SCIENCE↗
Development of Multimodal Few-Shot Analytics for Electron Micrographs
Recent advances in materials data analytics have provided new avenues for determining process-structure-property (PSP) linkages in a variety of materials. Machine learning techniques including few-shot learning have increased the efficiency of classifying microscopy images for the purposes of material characterization. Attempts at creating a multimodal approach can provide further improvements to current models and help extract more salient features from data. In this vein, raw spectrum data was taken to provide an additional modality to our current pyCHIP classifier. Modifications in segmentation also show potential in improving the accuracy of the pyCHIP classifier. Classifier output was analyzed using network graphs and unsupervised clustering algorithms such as spectral clustering to detect better segmentation methods than the current “chipping” approach. We suggest that the chip selection process can be automated in the future using a combination of these techniques to enable high-throughput analyses.
36 MATERIALS SCIENCE↗
Localized Defect Detection from Spatially Mapped, In-Situ Process Data With Machine Learning
In powder bed fusion additive manufacturing, machines are often equipped with in-situ sensors to monitor the build environment as well as machine actuators and subsystems. The data from these sensors offer rich information about the consistency of the fabrication process within a build and across builds. This information may be used for process monitoring and defect detection; however, little has been done to leverage this data from the machines for more than just coarse-grained process monitoring. In this work we demonstrate how these inherently temporal data may be mapped spatially by leveraging scan path information. We then train a XGBoost machine learning model to predict localized defects—specifically soot–using only the mapped process data of builds from a laser powder bed fusion process as input features. The XGBoost model offers a feature importance metric that will help to elucidate possible relationships between the process data and observed defects. Finally, we analyze the model performance spatially and rationalize areas of greater and lesser performance.
3D printing↗