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Results for “parametric DIPS”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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5 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1991

Comparison of dynamic isotope power systems for distributed planet surface applications

Dynamic isotope power system (DIPS) alternatives were investigated and characterized for the surface mission elements associated with a lunar base and subsequent manned Mars expedition. System designs based on two convertor types were studied. These systems were characterized parametrically and compared over the steady-state electrical output power range 0.2 to 20 kWe. Three methods of thermally integrating the heat source and the Stirling heater head were considered, depending on unit size. Figures of merit were derived from the characterizations and compared over the parametric range. Design impacts of mission environmental factors are discussed and quantitatively assessed.

Bents, David J.↗
NASA NTRS1991

On the scale of surface features in hypersonic swept shock boundary-layer interactions

A parametric study of a Mach 8 fin-induced shock interaction with a turbulent boundary layer was performed in a shock tunnel using surface oil-dot visualization and surface pressure measurements. The study showed that the interaction was separated and secondary separation was detected for the strongest cases studied. Although the inviscid shock wave was close to the fin, the interaction was spread over large angular extents. The interaction showed inception to conical symmetry at the highest shock strengths. Additionally, the surface pressure distribution showed an extensive plateau region, with no distinct dip associated with strongly separated interactions. Between the fin and the inviscid shock, the surface pressure rose rapidly but did not approach the downstream inviscid shock, the surface pressure rose rapidly but did not approach the downstream inviscid value.

Pace, E. G.↗
NASA NTRS2004

Orbit Optimization For The Geospace Electrodynamics Connections (GEC) Mission

Part of NASA's Solar Terrestrial Probe line of missions, the Geospace Electrodynamics Connections (GEC) mission will deploy a formation of three spacecraft to perform in-situ atmospheric research in the low Ionosphere-Thermosphere region. These spacecraft will fly together in a %tring-of-pearls formation with variable spacings ranging from 10 seconds to one-quarter of an orbit at perigee. Over the course of its two-year mission, the three spacecraft will perform ten, 1-week dipping campaigns whereby they maneuver to lower their perigee to near 134 km. Using available launch vehicle performance data, an optimal parking orbit of 222 x 1525 km was found to maximize the dry mass available while providing enough propellant to perform the ten deep-dipping campaigns over its two-year mission. The results were used to create multi-variable contour plots containing the orbit perigee, the orbit apogee, spacecraft dry mass, propellant mass, and T500 (a science data collection figure of merit that tabulates the cumulative time spent below 500 km). These plots illustrate how the mission can trade off science return relative to the cost in dry mass and propellant. Other optimal solutions such as minimum propellant or maximum T500 were found to either limit the science data collection or to be dry mass limiting, respectively. Sensitivity analyses were performed to find new optimal (maximum dry mass) solutions if the number of campaigns changed, if the coefficient of drag (CD) were different, and if the propellant specific impulse were increased. A surprising result showed that the dry mass and T500 were both increased if the number of campaigns decreased. Changes in CD provided the expected results - raising CD lowered both the dry mass and T500 while lowering CD raised both the dry mass and T500. Increases in the propellant specific impulse had the expected outcome of raising the dry mass and lowering the propellant load but there was no change in the T500 figure of merit. The orbit optimization was performed parametrically using a Matlab(TradeMark) script and validated using FreeFlyer(TradeMark), a commercial orbit analysis tool. ,

Mesarch, Michael A.↗
NASA NTRS2002

Evaluation of Data Retention and Imprint Characteristics of FRAMs Under Environmental Stresses for NASA Applications

A major reliability issue for all advanced nonvolatile memory (NVM) technology devices including FRAMs is the data retention characteristics over extended period of time, under environmental stresses and exposure to total ionizing dose (TID) radiation effects. For this testing, 256 Kb FRAMs in 28-pin plastic DIPS, rated for industrial grade temperature range of -40 C to +85 C, were procured. These are two-transistor, two-capacitor (2T-2C) design FRAMs. In addition to data retention characteristics, the parts were also evaluated for imprint failures, which are defined as the failure of cells to change from a "preferred" state, where it has been for a significant period of time to an opposite state (e.g., from 1 to 0, or 0 to 1). These 256 K FRAMs were subjected to scanning acoustic microscopy (C-SAM); 1,000 temperature cycles from -65 C to +150 C; high temperature aging at 150 C, 175 C, and 200 C for 1,000 hours; highly accelerated stress test (HAST) for 500 hours; 1,000 hours of operational life test at 125 C; and total ionizing dose radiation testing. As a preconditioning, 10 K read/write cycles were performed on all devices. Interim electrical measurements were performed throughout this characterization, including special imprint testing and final electrical testing. Some failures were observed during high temperature aging test at 200 C, during HAST testing, and during 1,000 hours of operational life at 125 C. The parts passed 10 Krad exposure, but began showing power supply current increases during the dose increment from 10 Krad to 30 Krad, and at 40 Krad severe data retention and parametric failures were observed. Failures from various environmental group testing are currently being analyzed.

Sharma, Asbok K.↗
NASA NTRS2000

Evaluation of Data Retention and Imprint Characteristics of FRAMs Under Environmental Stresses for NASA Applications

A major reliability issue for all advanced nonvolatile memory (NVM) technology devices including FRAMs (Ferroelectric random access memories) is the data retention characteristics over extended period of time, under environmental stresses and exposure to total ionizing dose (TID) radiation effects. For this testing, 256 Kb FRAMs in 28-pin plastic DIPS, rated for industrial grade temperature range of -40 C to +85 C, were procured. These are two-transistor, two-capacitor (2T-2C) design FRAMs. In addition to data retention characteristics, the parts were also evaluated for imprint failures, which are defined as the failure of cells to change from a "preferred" state, where it has been for a significant period of time to an opposite state (e.g., from 1 to 0, or 0 to 1). These 256 K FRAMs were subjected to scanning acoustic microscopy (C-SAM); 1,000 temperature cycles from -65 C to +150 C; high temperature aging at 150 C, 175 C, and 200 C for 1,000 hours; highly accelerated stress test (HAST) for 500 hours; 1,000 hours of operational life test at 125 C; and total ionizing dose radiation testing. As a preconditioning, 10 K read/write cycles were performed on all devices. Interim electrical measurements were performed throughout this characterization, including special imprint testing and final electrical testing. Some failures were observed during high temperature aging test at 200 C, during HAST testing, and during 1,000 hours of operational life at 125 C. The parts passed 10 Krad exposure, but began showing power supply current increases during the dose increment from 10 Krad to 30 Krad, and at 40 Krad severe data retention and parametric failures were observed. Failures from various environmental group testing are currently being analyzed.

Sharma, Ashok K.↗