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All sourcesNASA NTRSDOE OSTI
DOE OSTI2017

Could a neuroscientist understand a microprocessor?

There is a popular belief in neuroscience that we are primarily data limited, and that producing large, multimodal, and complex datasets will, with the help of advanced data analysis algorithms, lead to fundamental insights into the way the brain processes information. These datasets do not yet exist, and if they did we would have no way of evaluating whether or not the algorithmically-generated insights were sufficient or even correct. To address this, here we take a classical microprocessor as a model organism, and use our ability to perform arbitrary experiments on it to see if popular data analysis methods from neuroscience can elucidate the way it processes information. Microprocessors are among those artificial information processing systems that are both complex and that we understand at all levels, from the overall logical flow, via logical gates, to the dynamics of transistors. We show that the approaches reveal interesting structure in the data but do not meaningfully describe the hierarchy of information processing in the microprocessor. This suggests current analytic approaches in neuroscience may fall short of producing meaningful understanding of neural systems, regardless of the amount of data. Furthermore, we argue for scientists using complex non-linear dynamical systems with known ground truth, such as the microprocessor as a validation platform for time-series and structure discovery methods.

60 APPLIED LIFE SCIENCES↗
DOE OSTI2017

Bristol Ridge: A 28-nm $\times$ 86 Performance-Enhanced Microprocessor Through System Power Management

Power management techniques can be effective at extracting more performance and energy efficiency out of mature systems on chip (SoCs). For instance, the peak performance of microprocessors is often limited by worst case technology (Vmax), infrastructure (thermal/electrical), and microprocessor usage assumptions. Performance/watt of microprocessors also typically suffers from guard bands associated with the test and binning processes as well as worst case aging/lifetime degradation. Similarly, on multicore processors, shared voltage rails tend to limit the peak performance achievable in low thread count workloads. In this paper, we describe five power management techniques that maximize the per-part performance under the before-mentioned constraints. Using these techniques, we demonstrate a net performance increase of up to 15% depending on the application and TDP of the SoC, implemented on 'Bristol Ridge,' a 28-nm CMOS, dual-core x 86 accelerated processing unit.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2022

Node Monitoring as a Fault Detection Countermeasure against Information Leakage within a RISC-V Microprocessor

Advanced, superscalar microprocessors (μP) are highly susceptible to wear-out failures because of their highly complex, densely packed circuit structure and extreme operational frequencies. Although many types of fault detection and mitigation strategies have been proposed, none have addressed the specific problem of detecting faults that lead to information leakage events on I/O channels of the μP. Information leakage can be defined very generally as any type of output that the executing program did not intend to produce. In this work, we restrict this definition to output that represents a security concern, and in particular, to the leakage of plaintext or encryption keys, and propose a counter-based countermeasure to detect faults that cause this type of leakage event. Fault injection (FI) experiments are carried out on two RISC-V microprocessors emulated as soft cores on a Xilinx multi-processor System-on-chip (MPSoC) FPGA. The μP designs are instrumented with a set of counters that records the number of transitions that occur on internal nodes. The transition counts are collected from all internal nodes under both fault-free and faulty conditions, and are analyzed to determine which counters provide the highest fault coverage and lowest latency for detecting leakage faults. We show that complete coverage of all leakage faults is possible using only a single counter strategically placed within the branch compare logic of the μPs.

42 ENGINEERING↗
DOE OSTI2017

V and V techniques for FPGA-based I and C systems - How do they compare with techniques for microprocessors? - 355

We compare verification and validation (V and V) techniques for FPGA and microprocessor-based instrumentation and control (I and C) systems from the point of view of standards compliance, an approach based on behavioural properties, and the analysis of vulnerabilities. We found that the non-technology-specific elements of the standards considered are very similar. Differences are more marked when considering behavioural properties and vulnerabilities: the amount of effort required and confidence level obtained depend on a number of properties of the particular design under verification. (authors)

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2024

An Engineered Minimal-Set Stimulus for Periodic Information Leakage Fault Detection on a RISC-V Microprocessor

Recent evaluations of counter-based periodic testing strategies for fault detection in Microprocessor (μP) have shown that only a small set of counters is needed to provide complete coverage of severe faults. Severe faults are defined as faults that leak sensitive information, e.g., an encryption key on the output of a serial port. Alternatively, fault detection can be accomplished by executing instructions that periodically test the control and functional units of the μP. In this paper, we propose a fault detection method that utilizes an ’engineered’ executable program combined with a small set of strategically placed counters in pursuit of a hardware Periodic Built-In-Self-Test (PBIST). We analyze two distinct methods for generating such a binary; the first uses an Automatic Test Generation Pattern (ATPG)-based methodology, and the second uses a process whereby existing counter-based node-monitoring infrastructure is utilized. We show that complete fault coverage of all leakage faults is possible using relatively small binaries with low latency to fault detection and by utilizing only a few strategically placed counters in the μP.

42 ENGINEERING↗
DOE OSTI2021

Information Leakage Analysis using a Co-design-Based Fault Injection Technique on a RISC-V Microprocessor

The RISC-V instruction set architecture open licensing policy has spawned a hive of development activity, making a range of implementations publicly available. The environments in which RISC-V operates have expanded correspondingly, driving the need for a generalized approach to evaluating the reliability of RISC-V implementations under adverse operating conditions or after normal wear-out periods. Fault injection (FI) refers to the process of changing the state of registers or wires, either permanently or momentarily, and then observing execution behavior. The analysis provides insight into the development of countermeasures that protect against the leakage or corruption of sensitive information which might occur because of unexpected execution behavior. In this paper, we develop a hardware-software co-design architecture that enables fast, configurable fault emulation and utilize it for information leakage and data corruption analysis. Modern System-on-chip FPGAs enable building an evaluation platform where control elements run on a processor(s) (PS) simultaneously with the target design running in the programmable logic (PL). Software components of the FI system introduce faults and report execution behavior. A pair of RISC-V FI-instrumented implementations are created and configured to execute the Advanced Encryption Standard and Twister algorithms. Key and plaintext information leakage and degraded pseudo-random sequences are both observed in the output for a subset of the emulated faults.

42 ENGINEERING↗