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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Binary pseudo-random array standards for calibration of 3D optical surface profilers used for metrology with significantly curved x-ray optics

High-accuracy metrology is vitally important in manufacturing ultra-high-quality free-form mirrors designed to manipulate X-ray light with nanometer-scale wavelengths. The current capabilities and possibility for improvements in X-ray mirror manufacturing are limited by inherent imperfections of the integrated metrology tools. In the case of Fizeau interferometry, metrology tools are currently calibrated with super-polished flat test-standard/reference mirrors. This is acceptable for measuring slightly curved X-ray optics. However, for even moderately curved aspherical X-ray mirrors the flat-reference calibration is not sufficiently accurate and stitching Fizeau interferometer-based surface metrology is used to mitigate the problem. But still, the retrace and aberration errors, as well as the limited spatial resolution, described with the instrument transfer function (ITF), can be transferred into the optical surface topography of X-ray mirrors obtained in stitching metrology. For ITF calibration, we have developed an original technique, based on test standards structured as two-dimensional (2D) highly-randomized (HR) binary pseudo-random arrays (BPRAs). The technique employs the unique properties of the HR BPRA patterns in the spatial frequency domain., i.e. the inherent 2D power spectral density of the HR BPRA pattern has a deterministic white-noise-like character that allows direct determination of the ITF with uniform sensitivity over the entire spatial frequency range and field-of-view of an instrument. Here, we explore technological, metrological, and analytical aspects essential for calibration of the retrace and aberration errors of Fizeau interferometers using different types of tilted test samples, including a super-polished reference mirror for the re-trace calibration and the uniformly redundant array (URA) BPRA standards for the geometrical distortion (aberration) calibration. While the first method was previously demonstrated by researchers at DIAMOND Light Source, a method based on the URA BPRA is described and demonstrated here for the first time. We outline the design and fabrication process used in fabrication of URA BPRA test standards, and present the results of application of the URA BPRA standards demonstrating the high efficacy of our approach to geometrical distortion calibration of Fizeau interferometers. We also discuss the possible sources of unexpected peculiarities of the systematic errors, including an astigmatic character of the retrace error, observed with Fizeau interferometers at the Advanced Light Source X-Ray Optics Laboratory.

Munechika, Keiko↗
DOE OSTI2025

Noise Constraints on Sensitivity Scaling in Quantum Nonlinear Metrology

Quantum-enhanced metrology surpasses classical metrology by improving estimation precision scaling with a resource 𝑁 (e.g., particle number or energy) from 1/√𝑁 to 1/𝑁. Through the use of nonlinear effects, Roy and Braunstein [Exponentially enhanced quantum metrology, Phys. Rev. Lett. 100, 220501 (2008)] derived a 1/𝑁 2 scaling. However, later works argued this exponential improvement is unphysical and that even modest gains, like 1/𝑁 2 , may vanish under noise. We show that, in the presence of small errors, the nonlinear interactions enabling metrological enhancement induce emergent errors. Here, the errors propagate through the sensing protocol and are magnified proportional to any intended nonlinear enhancement. We identify a critical value of the parameter to be estimated, for a fixed error, below which the emergent errors can be avoided.

Quantum Fisher information↗
DOE OSTI2026

Advancing extreme pulsed lasers through measurements: summary of the pulsed laser metrology workshop

In this report we present consensus findings produced during the pulsed laser metrology (PLM) workshop (Boulder, CO, USA, August 2025). The workshop was a meeting of 35 scientists from private industry, academia, and U.S. government to compile a list of the metrology needs to support extreme pulsed laser development and implementation. We define ‘extreme pulsed lasers’ loosely as those with peak powers above 1 TW or multi-Joule pulse energies. Such lasers are being increasingly used and investigated for use in high energy particle acceleration, short wavelength radiation generation, laser-based fusion, etc. The rapid growth of these fields and the proliferation of extreme lasers for these applications, coupled with the extreme electric fields they generate and relative scarcity of such lasers, presents unique challenges to accuracy in their measurement. The PLM workshop was a two-day event designed to hear from users, developers, and researchers on the current state of optical metrology associated with these extreme pulsed lasers. The goal was to identify the most important measurement challenges limiting development and implementation of these lasers in practical applications. We report here the conclusions and recommendations of this workshop. The hope is that this document will become the first of many iterations which track the status of measurement needs supporting extreme pulsed lasers.

Lasers↗
DOE OSTI2026

Comprehensive assessment of metrology techniques for heliostat efficiency and performance evaluation

Concentrating solar power plants, specifically central receiver type systems and their heliostat field, are struggling with negative reputation in the USA, due to perceived underperformance and reliability issues. This is in part due to a lack of standards for performance assessment as well as overly simplified techno-economical models. A better understanding of influences and losses along the solar radiation path from the sun, across the solar collector to the receiver, increases the fidelity of heliostat efficiency assessment as well as solar field performance predictions. Such data are currently scarce and require a complete set of metrology capabilities to evaluate direct solar irradiance, sun shape, atmospheric attenuation, reflectance, collector shape, slope errors and total beam dispersion. In preparation for establishing a 3rd party metrology platform in collaboration with Sandia National Labs, NLR conducted a scoping study on available metrology. We present an extensive overview of techniques and commercial systems for each category. Our work includes an analysis to increase understanding of strengths and limitations of the many techniques used for surface shape and slope measurement. This applies to a controlled, indoor or outdoor laboratory environment assessing a single heliostat.

14 SOLAR ENERGY↗
DOE OSTI2025

Current-based metrology with two-terminal mesoscopic conductors

The traditional approach to quantum parameter estimation focuses on the quantum state, deriving fundamental bounds on precision through the quantum Fisher information. In most experimental settings, however, performing arbitrary quantum measurements is highly unfeasible. In open quantum systems, an alternative approach to metrology involves the measurement of stochastic currents flowing from the system to its environment. However, the present understanding of current-based metrology is mostly limited to Markovian master equations. Considering a parameter estimation problem in a two-terminal mesoscopic conductor, we identify the key elements that determine estimation precision within the Landauer-Büttiker formalism. Crucially, this approach allows us to address arbitrary coupling and temperature regimes. Furthermore, we obtain analytical results for the precision in linear-response and zero-temperature regimes. For the specific parameter estimation task that we consider, we demonstrate that the boxcar transmission function is optimal for current-based metrology in all parameter regimes.

Landauer formula↗
DOE OSTI2025

Ground Truth for CSP Mirror Metrology (Full-Length)

The high optical accuracy required for concentrating solar power (CSP) systems in turn requires accurate metrology to assess mirror optical parameters during design, manufacturing, and operation. To meet this need, researchers have developed a variety of CSP optical metrology systems, which include complex calculations and calibration terms. This raises the question: How do we know these methods’ accuracy? One approach is to compare metrology system measurements against a ground truth reference.

14 SOLAR ENERGY↗
DOE OSTI2026

Low-Temperature Plasma-Based Metrology of Lithium-Ion Battery Electrode Materials (CRADA Final Report)

As part of the Cyclotron Road program, SirenOpt Inc. evaluated its low-temperature plasma-based metrology sensor prototype for measuring multiple critical properties of lithium-ion battery electrode materials in parallel and in real-time. Cost-effective, minimal-waste manufacturing of high-performance battery electrode materials will be vital for achieving society’s net-zero carbon emission goals. Because existing electrode metrology sensors cannot operate within most sections of manufacturing lines, manufacturers often complete hundreds of processing steps before they can test their products and detect problems. When manufacturers perform these offline tests, they typically only test a small portion of the manufactured products. Current electrode manufacturing thus often yields many low-quality products, or off-spec products that must be thrown away all together. For example, at least 6% of the total lithium-ion battery manufacturing cost (i.e., over $250 million/year for the average gigafactory) is devoted to processing defective electrodes that are not scrapped until performance tests are failed during late-stage quality control checks. Electrode variability also leads manufacturers to build extra cells into battery packs to reduce the risk of poor performance. For example, many electric vehicle (EV) manufacturers include up to 10% more cells than needed, which substantially increases the cost and weight of the final EV product. The SirenOpt sensor can potentially enable early detection of poorly manufactured electrodes and allow them to be removed earlier from manufacturing lines, which can save battery manufacturers (hundreds of) millions of dollars per year. The sensor can further be used to improve product quality by accelerating R&D and process optimization, improving quality control, and enabling real-time process control. Overall, a real-time, in-situ metrology strategy can create unprecedented opportunities for implementation of smart manufacturing practices and advanced quality and process control solutions to realize higher battery electrode throughput and performance.

25 ENERGY STORAGE↗
DOE OSTI2024

In situ Synchrotron X‐ray Metrology Boosted by Automated Data Analysis for Real‐time Monitoring of Cathode Calcination

Abstract Synchrotron X‐ray‐based in situ metrology is advantageous for monitoring the synthesis of battery materials, offering high throughput, high spatial and temporal resolution, and chemical sensitivity. However, the rapid generation of massive data poses a challenge to on‐site, on‐the‐fly analysis needed for real‐time process monitoring. Here, a weighted lagged cross‐correlation (WLCC) similarity approach is presented for automated data analysis, which merges with in situ synchrotron X‐ray diffraction metrology to monitor the calcination process of the archetypal nickel‐based cathode, LiNiO 2 . The WLCC approach, incorporating variables that account for peak shifts and width changes associated with structural transformations, enables rapid extraction of phase progression within 10 seconds from tens of diffraction patterns. Details are captured, from initial precursors to intermediates and the final layered LiNiO 2 , providing information for agile on‐site adjustments during experiments and complementing post hoc diffraction analysis by offering insights into early‐stage phase nucleation and growth. Expanding this data‐powered platform paves the way for real time calcination process monitoring and control, which is pivotal to quality control in battery cathode manufacturing.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Variational quantum state preparation for quantum-enhanced metrology in noisy systems

Here, we investigate optimized quantum state preparation for quantum metrology applications in noisy environments. Using the QFI-OPT package, we simulate a low-depth variational quantum circuit (VQC) composed of a sequence of global rotations and entangling operations applied to a chain of qubits that are subject to dephasing noise. The parameters controlling the VQC are numerically optimized to maximize the quantum Fisher information, which characterizes the ultimate metrological sensitivity of a quantum state with respect to a global rotation. We find that, regardless of the details of the entangling operation implemented in the VQC, the optimal quantum states can be broadly classified into a trio of qualitative regimes, i.e., catlike, squeezed like, and product states, associated with different dephasing rates. Our findings are relevant for designing optimal state-preparation strategies for next-generation quantum sensors exploiting entanglement, such as time and frequency standards and magnetometers, aimed at achieving state-of-the-art performance in the presence of noise and decoherence.

quantum Fisher information↗
DOE OSTI2025

Universal time scalings of sensitivity in Markovian quantum metrology

Assuming Markovian time evolution of a quantum sensing system, we study the general characterization of the optimal sensitivity scalings with time, under most general quantum control protocols. We allow the estimated parameter to influence both the Hamiltonian as well as the dissipative part of the quantum master equation and focus on the asymptotic-time along with the short-time sensitivity scalings. We find that via simple algebraic conditions (in terms of the Hamiltonian, the jump operators as well as their parameter derivatives), one can characterize the four classes of metrological models that represent: quadratic-linear, quadratic-quadratic, linear-linear, and linear-quadratic time scalings. We also investigate the relevant time scales on which the transition between the two regimes appears. Additionally, we provide universal numerical methods to obtain quantitative bounds on sensitivity that are the tightest that exist in the literature. Simplicity and universality of our results make it suitable for diverse applications in quantum metrology.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2025

Mechanical design of a parallel flexure-based RADSI instrument for curved x-ray mirror metrology

Modern synchrotron x-ray beamlines demand reflective optics with higher surface profile accuracy to achieve diffraction-limited focusing. This necessitates advanced metrology instruments capable of delivering repeatable measurements in the nanometer to sub-nanometer range. Slope ranges exceeding 15 mrad (0.86°) and greater pose significant challenges for mirror metrology using conventional interferometric methods. Here, to address this, we present a new relative angle determinable stitching interferometry instrument featuring a parallel flexure-based mechanical design. This approach enhances vibration and thermal stability while maintaining a compact and lightweight system. Initial measurements of a cylindrical mirror with a 16 m radius of curvature and a slope range of 5 mrad demonstrate nanometer-level repeatability. Comprehensive system characterization suggests the potential for achieving sub-nanometer repeatability with further refinement to the instrument.

36 MATERIALS SCIENCE↗
DOE OSTI2026

Geometric invariants of quantum metrology

Here, we establish a conservation law for the Quantum Fisher Information Matrix (QFIM) expressed as follows; when the QFIM is constructed from a set of observables closed under commutation, i.e., a Lie algebra, the spectrum of the QFIM is invariant under unitary dynamics generated by these same operators. Each Lie algebra therefore endows any quantum state with a fixed “budget” of metrological sensitivity—an intrinsic resource that we show, like optical squeezing in interferometry, cannot be amplified by symmetry-preserving operations. The Uhlmann curvature tensor naturally inherits the same symmetry group, and so quantum incompatibility is similarly fixed. As a result, a metrological analog to Liouville's theorem appears; statistical distances, volumes, and curvatures are invariant under the evolution generated by the Lie algebra. We discuss this as it relates to the quantum analogs of classical optimality criteria. This enables one to efficiently classify useful classes of quantum states at the level of Lie algebras through geometric invariants.

Wilson, Christopher [University of Colorado, Bould↗
DOE OSTI2024

Dual-Image Color Normalization to Enable High-Performance Concentrating Solar Optical Metrology

Concentrating Solar Power (CSP) requires precision mirrors, and these in turn require metrology systems to measure their optical slope. In this project we studied a color-based approach to the correspondence problem, which is the association of points on an optical target with their corresponding points seen in a reflection. This is a core problem in deflectometry-based metrology, and a color solution would enable important new capabilities. We modeled color as a vector in the [R,G,B] space measured by a digital camera, and explored a dual-image approach to compensate for inevitable changes in illumination color. Through a series of experiments including color target design and dual-image setups both indoors and outdoors, we collected reference/measurement image pairs for a variety of configurations and light conditions. We then analyzed the resulting image pairs by selecting example [R,G,B] pixels in the reference image, and seeking matching [R,G,B] pixels in the measurement image. Modulating a tolerance threshold enabled us to assess both match reliability and match ambiguity, and for some configurations, orthorectification enabled us to assess match accuracy. Using direct-direct imaging, we demonstrated color correspondence achieving average match accuracy values of 0.004 h, where h is the height of the color pattern. We found that wide-area two-dimensional and linear one-dimensional color targets outperformed hybrid linear/lateral gradient targets in the cases studied. Introducing a mirror degraded performance under our current techniques, and we did not have time to evaluate whether matches could be reliably achieved despite varying light conditions. Nonetheless, our results thus far are promising.

14 SOLAR ENERGY↗
DOE OSTI2026

Improvements in optical metrology for high-performance variable-line-spacing x-ray gratings

Here, we discuss a project to develop a precision metrology system for variable-line-spacing x-ray gratings using interferometric microscopes. We are developing test standards and calibration techniques to measure and correct for geometrical distortion and blur, and data processing techniques to combine multiple measurements and measure line spacing with high accuracy.

Calibration methods↗
DOE OSTI2025

Interplay Between Time and Energy in Bosonic Noisy Quantum Metrology

Quantum entanglement and coherence often allow for protocols that outperform classical ones in estimating a system’s parameter. When using infinite-dimensional probes (such as a bosonic mode), one could, in principle, obtain infinite precision in a finite time for both classical and quantum protocols, which makes it hard to quantify potential quantum advantage. However, such a situation is unphysical, as it would require infinite resources, so one needs to impose some additional constraint: typically the average energy employed by the probe is finite. Here we treat both energy and time as a resource, showing that, in the presence of noise, there is a nontrivial interplay between the average energy and the time devoted to the estimation. Our results are valid for the most general metrological schemes (e.g., adaptive schemes, which may involve entanglement with external ancillae or any kind of continuous measurement). We apply recently derived precision bounds for all parameters characterizing the paradigmatic case of a bosonic mode, subject to Lindbladian noise. We show how the time employed in the estimation should be partitioned in order to achieve the best possible precision. In most cases, the optimal performance may be obtained without the necessity of adaptivity or entanglement with ancilla. We compare results with classical strategies. Interestingly, for temperature estimation, applying a fast-prepare-and-measure protocol with Fock states provides better scaling with the number of photons than any classical strategy.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2024

Static metrology of the meter-scale deformable heliostat

This paper describes a heliostat metrology system which is developed based on deflectometry, utilizing a static perforated panel instead of conventional dynamic monitor displays to provide incident rays. The developed method is named static screen deflectometry (SSD). This robust and scalable method is especially valuable for outdoor tests of large reflectors used in concentrating solar-thermal power (CSP) systems. The developed method has been successfully demonstrated on a 2.4 𝑚 × 3.3 𝑚 float glass deformable reflector bent to focus sunlight at 113 𝑚 distance throughout a day. From images obtained from a camera at 50𝑚 distance, the reflector surface was measured to an accuracy of less than 1 𝑚𝑟𝑎𝑑 rms slope error in the full test scope.

14 SOLAR ENERGY↗
DOE OSTI2025

Harnessing on-machine metrology data for prints with a surrogate model for laser powder directed energy deposition

In this study, we leverage the massive amount of multi-modal on-machine metrology data generated from Laser Powder Directed Energy Deposition (LP-DED) to construct a comprehensive surrogate model of the 3D printing process. By employing Dynamic Mode Decomposition with Control (DMDc), a data-driven technique, we capture the complex physics inherent in this extensive dataset. This physics-based surrogate model emphasizes thermodynamically significant quantities, enabling us to accurately predict key process outcomes. The model ingests 21 process parameters, including laser power, scan rate, and position, while providing outputs such as melt pool temperature, melt pool size, and other essential observables. Furthermore, it incorporates uncertainty quantification to provide bounds on these predictions, enhancing reliability and confidence in the results. We then deploy the surrogate model on a new, unseen part and monitor the printing process as validation of the method. Our experimental results demonstrate that the predictions align with actual measurements with high accuracy, confirming the effectiveness of our approach. Furthermore, this methodology not only facilitates real-time predictions but also operates at process-relevant speeds, establishing a basis for implementing feedback control in LP-DED.

Digital twins↗
DOE OSTI2026

Metrology for femtosecond pulsed x-ray heating in diamond anvil cell experiments at the European XFEL: Revisiting the iron phase diagram up to 150 GPa

The development of pulsed intense x-ray sources, such as free electron laser, offers new avenues for high pressure experiments. Here, we study the feasibility and metrology of x-ray heating in diamond anvil cells at the European x-ray free electron laser. This method enables one to volumetrically heat the sample while inhibiting chemical migration and probing the crystallographic structure of the sample throughout the heating with a high repetition rate. We focus our study on iron, whose phase diagram is well established up to 100 GPa, to explore the possibilities and limitations of this technique. We volumetrically heat iron samples at starting pressures ranging from 10 to 138 GPa, using the x-ray beam pulsed at 4.5 MHz in a serial pump-and-probe experimental design. Experimental challenges arise from temperature gradients within the sample, changes in temperature at the 100 ns timescale, the difficulty of direct temperature estimates, the effect of thermal pressure, and the presence of metastable crystallites due to rapid cycles of heating and cooling. Hence, we develop a multi-crystal-like data processing method that allows us to account for sample heterogeneity in probed conditions. We then calibrate our measurements using known physical properties of iron under pressure. Thermal pressure in our experiments increases from 4% of the isochoric prediction at 10 GPa to 23% at 138 GPa, and we show that our data are in agreement with most previous observations of iron in this pressure range. The method can now be implemented at higher pressures and temperatures and on materials with unknown phase diagrams.

Materials science↗