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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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All sourcesNASA NTRSDOE OSTI
NASA NTRS1993

Fabrication techniques for very fast diffractive lenses

Aspheric lenses with arbitrary phase functions can be fabricated on thin light weight substrates via the binary optics fabrication technique. However, it is difficult and costly to fabricate a fast lens (f/number less than 1) for use as the shorter wavelengths. The pitch of the masks and the alignment accuracy must be very fine. For a large lens, the space-bandwidth product of the element can also become impractically large. In this paper, two alternate approaches for the fabrication of fast aspheric diffractive lenses are described. The first approach fabricates the diffractive lens interferometrically, utilizing a spherical wavefront to provide the optical power of the lens and a computer generated hologram to create the aspheric components. The second approach fabricates the aspheric diffractive lens in the form if a higher order kinoform which trades groove profile fidelity for coarser feature size. The design and implementation issues for these two fabrication techniques are discussed.

Tai, Anthony M.↗
NASA NTRS1972

Broadening of fast-beam spectral lines due to diffraction at the entrance slit of a spectrometer.

Experimental and theoretical demonstration of the necessity to take into account the effects of diffraction at a spectrometer's entrance slit in adjusting the spectrometer for observation of fast-beam spectral lines under conditions of minimum linewidth. An approximate expression is obtained for the optimum entrance slit width to be used in order to avoid the pronounced broadening of the spectral lines that occurs for very narrow entrance slits.

Leavitt, J. A.↗
NASA NTRS2019

Advanced Diffractive MetaFilm Sailcraft

A fast-tracked multifaceted approach that integrated NASA, industry, and academia was successfully executed to advance the novel concept of radiation pressure by means of a thin diffractive film. This pioneering new approach to light sailing was found to offer advantages over reflective sails - especially for missions that include close orbits or a close fly-by of the sun.The research effort included experiments, numerical modeling, and an "incubator meeting" that brought together over 35 researchers and stakeholders to uncover some of the most feasible means of advancing both the TRL and mission capabilities of diffractive sailcraft. One of the outcomes of the incubator meeting was to focus this Phase I research on a solar polar orbiter mission for heliophysics experiments. NASA decadal surveys and other reports have repeatedly pointed out that scientists have only a paucity of information about the sun beyond the ecliptic plane. The TRL has been advanced from 1 to 3 during this Phase I research with the help of experiments that have verified the predicted force and mechanical control afforded by diffractive sails. Knowledge gained from the experiments and numerical models was not only disseminated in peer reviewed publications and conferences, but it also resulted in a patent disclosure.

Diffractive↗
NASA NTRS2008

Polarization/Spatial Combining of Laser-Diode Pump Beams

A breadboard version of an optical beam combiner is depicted which make it possible to use the outputs of any or all of four multimode laser diodes to pump a non-planar ring oscillator (NPRO) laser. The output of each laser diode has a single-mode profile in the meridional plane containing an axis denoted the 'fast' axis and a narrower multimode profile in the orthogonal meridional plane, which contains an axis denoted the 'slow' axis and a narrower multimode profile in the orthogonal meridional plane, which contains an axis denoted the 'slow' axis. One of the purposes served by the beam-combining optics is to reduce the fast-axis numerical aperture (NA) of the laser-diode output to match the NA of the optical fiber. Along the slow axis, the unmodified laser-diode NA is already well matched to the fiber optic NA, so no further slow-axis beam shaping is needed. In this beam combiner, the laser-diode outputs are collimated by aspherical lenses, then half-wave plates and polarizing beam splitters are used to combine the four collimated beams into two beams. Spatial combination of the two beams and coupling into the optical fiber is effected by use of anamorphic prisms, mirrors, and a focusing lens. The anamorphic prisms are critical elements in the NA-matching scheme, in that they reduce the fast-axis beam width to 1/6 of its original values. Inasmuch as no slow-axis beam shaping is needed, the collimating and focusing lenses are matched for 1:1 iumaging. Because these lenses are well corrected for infinite conjugates the combiner offers diffraction-limited performance along both the fast and slow axes.

Gelsinger, Paul↗
NASA NTRS2000

Recent Trends in the Analysis of Quasioptical Systems

The recent trend in microwave instruments is the use of multiple millimeter and submillimeter wavelength bands. These systems are typically analyzed by using physical optics, Gaussian beams or ray tracing techniques. Physical optics offers high accuracy at the expense of computation time. This trade-off becomes particularly apparent in the analysis of multiple reflector antennas, such as beam waveguide antennas, where physical optics is used to compute the current on each reflector from the current on the previous reflector. At the other end of the spectrum is ray tracing approaches that ignore diffraction effects entirely. These methods are fast but sacrifice the ability to predict some effects accurately. An intermediate approach is to use an appropriate set of expansion functions to model the field between the reflectors. If the set is chosen wisely only a few coefficients need to be determined from each reflector current. The field is then computed at the next reflector through the use of the expansion functions and their coefficients rather than by using the previous reflector current. For a beam waveguide system with no enclosing tubes an excellent set of expansion functions is the Gaussian beam mode set. In many cases a preliminary design which includes the effects on diffraction may be obtained by considering only the fundamental mode and a thin lens model for the reflectors. Higher-order modes are included to model the effects of the curved reflector, which include asymmetric distortion of the beam, cross polarization, and beam truncation. This paper describes a computer code implementing higher-order Gaussian beam scattering by multiple reflector systems. There are four essential steps in the algorithm. (1) Compute the current on the first reflector using physical optics using either a feed model or by an incident set of Gaussian beam modes. (2) Find the direction of propagation for the reflected Gaussian beam-set using ray tracing. (3) Determine the waist size and location for the output beam set by examining the amplitude and phase distribution of the current on the reflector. (4) Compute the amplitudes of the individual modes in the output mode set. These steps are then repeated for each addition reflector in the chain. In each of these cases the previous Gaussian beam set provides the input field for the current calculation. Details of the four steps discussed above will be discussed. Examples will compare results from the Gaussian beam approach to pure physical optics, illustrating both its merits and limitations. Hybrid approaches capable of eliminating some of the limitations will also be discussed.

Hoppe, D. J.↗
NASA NTRS2005

Beamline Electrostatic Levitator (BESL) for in-situ High Energy K-Ray Diffraction Studies of Levitated Solids and Liquids at High Temperature

Determinations of the phase formation sequence, the crystal structures and the thermodynamic properties of materials at high temperatures are difficult because of contamination from the sample container and environment. Containerless processing techniques, such as electrostatic (ESL), electromagnetic (EML), aerodynamic, and acoustic levitation, are most suitable these studies. An adaptation of ESL for in-situ structural studies of a wide range of materials, including metals, semiconductors, insulators using high energy (125 keV) synchrotron x-rays is described here. This beamline ESL (BESL) allows the in-situ determination of the atomic structures of equilibrium solid and liquid phases, including undercooled liquids, as well as real-time studies of solid-solid and liquid-solid phase transformations. The use of image plate (MAR345) or GE-Angio detectors enables fast (30 ms - 1s) acquisition of complete diffraction patterns over a wide q-range (4 - 140/mm). The wide temperature range (300 - 2500 K), containerless processing under high vacuum (10(exp -7) - 10(exp -8) torr), and fast data acquisition, make BESL particularly suitable for phase diagram studies of high temperature materials. An additional, critically important, feature of BESL is the ability to also make simultaneous measurement of a host of thermo-physical properties, including the specific heat, enthalpy of transformation, solidus and liquidus temperatures, density, viscosity, and surface tension; all on the same sample and simultaneous with the structural measurements.

Gangopadhyay, A. K.↗
NASA NTRS1972

New coding technique for computer generated holograms.

A coding technique is developed for recording computer generated holograms on a computer controlled CRT in which each resolution cell contains two beam spots of equal size and equal intensity. This provides a binary hologram in which only the position of the two dots is varied from cell to cell. The amplitude associated with each resolution cell is controlled by selectively diffracting unwanted light into a higher diffraction order. The recording of the holograms is fast and simple.

Haskell, R. E.↗
NASA NTRS2016

Reaching the Diffraction Limit - Differential Speckle and Wide-Field Imaging for the WIYN Telescope

Speckle imaging allows telescopes to achieve diffraction limited imaging performance. The technique requires cameras capable of reading out frames at a very fast rate, effectively 'freezing out' atmospheric seeing. The resulting speckles can be correlated and images reconstructed that are at the diffraction limit of the telescope. These new instruments are based on the successful performance and design of the Differential Speckle Survey Instrument (DSSI).The instruments are being built for the Gemini-N and WIYN telescopes and will be made available to the community via the peer review proposal process. We envision their primary use to be validation and characterization of exoplanet targets from the NASA, K2 and TESS missions and RV discovered exoplanets. Such targets will provide excellent follow-up candidates for both the WIYN and Gemini telescopes. We expect similar data quality in speckle imaging mode with the new instruments. Additionally, both cameras will have a wide-field mode and standard SDSS filters. They will be highly versatile instruments and it is that likely many other science programs will request time on the cameras. The limiting magnitude for speckle observations will remain around 13-14th at WIYN and 16-17th at Gemini, while wide-field, normal CCD imaging operation should be able to go to much fainter, providing usual CCD imaging and photometric capabilities. The instruments will also have high utility as scoring cameras for telescope engineering purposes, or other applications where high time resolution is needed. Instrument support will be provided, including a software pipeline that takes raw speckle data to fully reconstructed images.

detector↗
NASA NTRS1984

Real-time X-ray Diffraction: Applications to Materials Characterization

With the high speed growth of materials it becomes necessary to develop measuring systems which also have the capabilities of characterizing these materials at high speeds. One of the conventional techniques of characterizing materials was X-ray diffraction. Film, which is the oldest method of recording the X-ray diffraction phenomenon, is not quite adequate in most circumstances to record fast changing events. Even though conventional proportional counters and scintillation counters can provide the speed necessary to record these changing events, they lack the ability to provide image information which may be important in some types of experiment or production arrangements. A selected number of novel applications of using X-ray diffraction to characterize materials in real-time are discussed. Also, device characteristics of some X-ray intensifiers useful in instantaneous X-ray diffraction applications briefly presented. Real-time X-ray diffraction experiments with the incorporation of image X-ray intensification add a new dimension in the characterization of materials. The uses of real-time image intensification in laboratory and production arrangements are quite unlimited and their application depends more upon the ingenuity of the scientist or engineer.

Rosemeier, R. G.↗
NASA NTRS1993

Photorefractive Semiconductors and Applications

Photorefractive semiconductors are attractive for information processing, becuase of fast material response, compatibility with semiconductor lasers, and availability of cross polarization diffraction for enhancing signal-to-noise ration. This paper presents recent experimental results on information processing using photorefractive GaAs, InP and CdTe, including image processing with semiconductor lasers.

Photorefractive Semiconductors↗
NASA NTRS2009

Modern Material Analysis Instruments Add a New Dimension to Materials Characterization and Failure Analysis

Modern analytical tools can yield invaluable results during materials characterization and failure analysis. Scanning electron microscopes (SEMs) provide significant analytical capabilities, including angstrom-level resolution. These systems can be equipped with a silicon drift detector (SDD) for very fast yet precise analytical mapping of phases, as well as electron back-scattered diffraction (EBSD) units to map grain orientations, chambers that admit large samples, variable pressure for wet samples, and quantitative analysis software to examine phases. Advanced solid-state electronics have also improved surface and bulk analysis instruments: Secondary ion mass spectroscopy (SIMS) can quantitatively determine and map light elements such as hydrogen, lithium, and boron - with their isotopes. Its high sensitivity detects impurities at parts per billion (ppb) levels. X-ray photo-electron spectroscopy (XPS) can determine oxidation states of elements, as well as identifying polymers and measuring film thicknesses on coated composites. This technique is also known as electron spectroscopy for chemical analysis (ESCA). Scanning Auger electron spectroscopy (SAM) combines surface sensitivity, spatial lateral resolution (10 nm), and depth profiling capabilities to describe elemental compositions of near and below surface regions down to the chemical state of an atom.

Panda, Binayak↗
NASA NTRS2013

Laboratory Instruments Available to Support Space Station Researchers at Marshall Space Flight Center

A number of research instruments are available at NASA's Marshall Space Flight Center (MSFC) to support ISS researchers and their investigations. These modern analytical tools yield valuable and sometimes new informative resulting from sample characterization. Instruments include modern scanning electron microscopes equipped with field emission guns providing analytical capabilities that include angstron-level image resolution of dry, wet and biological samples. These microscopes are also equipped with silicon drift X-ray detectors (SDD) for fast yet precise analytical mapping of phases, as well as electron back-scattered diffraction (EBSD) units to map grain orientations in crystalline alloys. Sample chambers admit large samples, provide variable pressures for wet samples, and quantitative analysis software to determine phase relations. Advances in solid-state electronics have also facilitated improvements for surface chemical analysis that are successfully employed to analyze metallic materials and alloys, ceramics, slags, and organic polymers. Another analytical capability at MSFC is a mganetic sector Secondary Ion Mass Spectroscopy (SIMS) that quantitatively determines and maps light elements such as hydrogen, lithium, and boron along with their isotopes, identifies and quantifies very low level impurities even at parts per billion (ppb) levels. Still other methods available at MSFC include X-ray photo-electron spectroscopy (XPS) that can determine oxidation states of elements as well as identify polymers and measure film thicknesses on coated materials, Scanning Auger electron spectroscopy (SAM) which combines surface sensitivity, spatial lateral resolution (approximately 20 nm), and depth profiling capabilities to describe elemental compositions in near surface regions and even the chemical state of analyzed atoms. Conventional Transmission Electron Microscope (TEM) for observing internal microstructures at very high magnifications and the Electron Probe Micro-analyzer (EPMA) for very precise microanalysis are available as needed by the researcher. Space Station researchers are invited to work with MSFC in analyzing their samples using these techniques.

Panda, Binayak↗
NASA NTRS2004

Faster Processing for Inverting GPS Occultation Data

A document outlines a computational method that can be incorporated into two prior methods used to invert Global Positioning System (GPS) occultation data [signal data acquired by a low-Earth-orbiting satellite as either this or the GPS satellite rises above or falls below the horizon] to obtain information on altitude-dependent properties of the atmosphere. The two prior inversion methods, known as back propagation and canonical transform, are computationally expensive because for each occultation, they involve numerical evaluation of a large number of diffraction-like spatial integrals. The present method involves an angular-spectrum-based phase-extrapolation approximation in which each data point is associated with a plane-wave component that propagates in a unique direction from the orbit of the receiving satellite to intersect a straight line tangent to the orbit at a nearby point. This approximation enables the use of fast Fourier transforms (FFTs), which apply only to data collected along a straight-line trajectory. The computation of the diffraction-like integrals in the angular-spectrum domain by use of FFTs takes only seconds, whereas previously, it took minutes.

Ao, Chi↗
NASA NTRS1990

Task reports on developing techniques for scattering by 3D composite structures and to generate new solutions in diffraction theory using higher order boundary conditions

There are two tasks described in this report. First, an extension of a two dimensional formulation is presented for a three dimensional body of revolution. With the introduction of a Fourier expansion of the vector electric and magnetic fields, a coupled two dimensional system is generated and solved via the finite element method. An exact boundary condition is employed to terminate the mesh and the fast fourier transformation is used to evaluate the boundary integrals for low O(n) memory demand when an iterative solution algorithm is used. Second, the diffraction by a material discontinuity in a thick dielectric/ferrite layer is considered by modeling the layer as a distributed current sheet obeying generalized sheet transition conditions (GSTC's).

Volakis, John L.↗
NASA NTRS1984

Secondary pattern computation of an arbitrarily shaped main reflector

The secondary pattern of a perfectly conducting offset main reflector being illuminated by a point feed at an arbitrary location was studied. The method of analysis is based upon the application of the Fast Fourier Transform (FFT) to the aperture fields obtained using geometrical optics (GO) and geometrical theory of diffraction (GTD). Key features of the reflector surface is completely arbitrary, the incident field from the feed is most general with arbitrary polarization and location, and the edge diffraction is calculated by either UAT or by UTD. Comparison of this technique for an offset parabolic reflector with the Jacobi-Bessel and Fourier-Bessel techniques shows good agreement. Near field, far field, and scan data of a large reflector are presented.

Lam, P. T. C.↗
NASA NTRS1985

Secondary pattern computation of an arbitrarily shaped main reflector

The secondary pattern of a perfectly conducting offset main reflector being illuminated by a point feed at an arbitrary location is studied. The method of analysis is based upon the application of the Fast Fourier Transform (FFT) to the aperture fields obtained using geometrical optics (GO) and geometrical theory of diffraction (GTD). Key features of the present work are (1) the reflector surface is completely arbitrary, (2) the incident field from the feed is most general with arbitrary polarization and location, and (3) the edge diffraction is calculated by either UAT or by UTD. Comparison of this technique for an offset parabolic reflector with the Jacobi-Bessel and Fourier-Bessel techniques shows good agreement. Near field, far field, and scan data of a large refelctor are presented.

Lee, S. W.↗
NASA NTRS1985

Secondary pattern computation of an offset reflector antenna

Reflector antennas are widely used in communications satellite systems because they provide high gain at low cost. In analyzing reflector antennas the computation of the secondary pattern is the main concern. A computer program for calculating the secondary pattern of an offset reflector has been developed and implemented at the NASA Lewis Research Center. The theoretical foundation for this program is based on the use of geometrical optics to describe the fields from the feed to the reflector surface and to the aperture plane. The resulting aperture field distribution is then transformed to the far-field zone by the fast Fourier transform algorithm. Comparing this technique with other well-known techniques (the geometrical theory of diffraction, physical optics (Jacobi-Bessel), etc.) shows good agreement for large (diameter of 100 lambda or greater) reflector antennas.

Acosta, R. J.↗