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At least 19 records

Differential electron yield imaging with STXM

In this report total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental composition, and electrical conductivity. However, the TEY-STXM signal is determined solely by the electrons that the beam ejects from the sample. A related technique, X-ray beam-induced current (XBIC) imaging, is sensitive to electrons and holes independently, but requires electric fields in the sample. Here we report that multi-electrode devices can be wired to produce differential electron yield (DEY) contrast, which is also independently sensitive to electrons and holes, but does not require an electric field. Depending on whether the region illuminated by the focused STXM beam is better connected to one electrode or another, the DEY-TXM contrast changes sign. DEY-STXM images thus provide a vivid map of a device's connectivity landscape, which can be key to understanding device function and failure. To demonstrate an application in the area of failure analysis, we image a 100 nm, lithographically-defined aluminum nanowire that has failed after being stressed with a large current density.

47 OTHER INSTRUMENTATION↗

Digging deeper: Buried layers and interfaces studied by modified total electron yield and soft x-ray absorption spectroscopy

We report on the soft x-ray absorption spectroscopy investigation of thin film capacitors using a modified total electron yield detection mode. This mode utilizes two ammeters instead of one as commonly employed in the classical total electron yield scheme to measure photocurrents of devices under soft x-ray irradiation. The advantage of this configuration over the surface sensitive classical total electron yield mode is that it can provide information from buried layers and interfaces up to a thickness equal to the penetration depth of soft x-rays. The method can be easily adapted to existing synchrotron end stations. We investigate dielectric capacitors with dissimilar electrodes to assess the feasibility of the modified total electron yield method. Furthermore, in operando soft x-ray absorption spectroscopy measurements are performed on ferroelectric capacitors under bias and using two ammeters. The experimental results are discussed in terms of the external and internal photoemission processes and their distribution in thin film capacitors under an external bias condition. The proposed detection method opens the way to perform electronic and chemical state analyses of the buried interfaces and layers in various devices like multiferroic tunnel junctions, memristive devices, etc., during operation under an applied bias.

Kröger, E.↗

The influence of secondary electron yield uncertainty on the single-sided multipacting in dielectrics

Multipacting is an electrical discharge caused by the emission of secondary electrons which can occur in vacuum radio frequency systems. Generally multipacting is highly undesirable obstacle, which increases the noise level as well as the return loss of radio frequency systems. Therefore, a prediction of multipacting is necessary to avoid it during radio frequency system design. In this regard, the accurate evaluation of the factors that affect multipacting is required. One of the critical factors determining the multipacting development is the secondary electron yield of the material. In practice the emission properties of materials are not known very accurately. There are uncertainties in the measured values of this yield. In this paper, the generalized Polynomial Chaos (gPC) method is used to quantify uncertainty of the secondary electron yield. This method is verified by Monte Carlo simulation. The effect of uncertainty for two secondary electron yield parameters is then investigated on the multipacting using gPC method.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

The way multipacting develops, depends strongly on the secondary emission property of the surface material. The knowledge of secondary electron yield is crucial for accurate prediction of the multipacting threshold. Variations in secondary electron yield parameters from experimental measurements create uncertainty, stemming from handling and surface preparation, and these uncertainties significantly affect multipacting threshold predictions. Despite their significance, the previous studies on the multipacting phenomenon did not adequately address the effect of an assumed random distribution of the secondary emission parameters on the multipacting threshold. Therefore, this paper aims to provide a comprehensive statistical study on how the different random distributions of the secondary emission parameters and, as a result, the uncertainty in the secondary electron yield affect multipacting thresholds. We focus on three commonly used distributions, namely uniform, normal, and truncated normal distributions, to define the uncertainty of random inputs. We use the chaos polynomial expansion method to determine how much each of the random parameters contributes to the multipacting threshold uncertainty. Additionally, we calculate Sobol sensitivity indices to evaluate the impact of the individual parameters or groups of parameters on the model outputs and study how different random distributions of these parameters affected the Sobol index results.

physics↗

A fully contained sample holder capable of electron-yield detection at soft X-ray energies

A holder has been developed that enables electron yield-detected soft X-ray spectroscopy of fully contained samples at low temperature. Crucially, this design uses elements of the sample containment to collect ejected electrons, removing the need to expose samples directly to the vacuum environment of the spectrometer. The design is modular and should be adaptable to a number of different endstation configurations, enabling spectroscopy of air-sensitive, radioactive and vacuum-sensitive (biological) samples.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗

NOVEL METHODS FOR IN SITU HIGH DENSITY SURFACE CLEANING SCRUBBING OF ULTRAHIGH VAC LONG NARROW TUBES TO REDUCE SECONDARY ELECTRON YIELD AND OUT GASSING

This project developed new methods for cleaning the inside surfaces of very long, narrow vacuum tubes used in particle accelerators. Traditional cleaning approaches are expensive, slow, or difficult to implement in accelerator tunnels. We designed and tested a portable plasma discharge cleaning system that uses lower-cost microwave and magnetron technologies to reduce outgassing and secondary electron emission from stainless steel and copper surfaces. The system, called the Plasma Discharge Test System (PDTS), allows accelerator components to be scrubbed more efficiently, which can improve performance and reduce maintenance costs for research and industrial applications.

POOLE, JOE HENRY [PRESIDENT]↗

Do Impulsive Solar-Energetic-Electron (SEE) Events Drive High-Voltage Charging Events on the Nightside of the Moon?

When the Earth’s moon is in the supersonic solar wind, the darkside of the Moon and the lunar plasma wake can be very dangerous charging environments. In the absence of photoelectron emission (dark) and in the absence of cool plasma (wake), the emission or collection of charge to reduce electrical potentials is difficult. Unique extreme charging events may occur during impulsive solar-energetic-electron (SEE) events when the lunar wake is dominated by relativistic electrons, with the potential to charge and differentially charge objects on and above the lunar surface to very-high negative electrical potentials. In this report the geometry of the magnetic connections from the Sun to the lunar nightside are explored; these magnetic connections are the pathways for SEEs from the Sun. Rudimentary charging calculations for objects in the relativistic-electron environment of the lunar wake are performed. To enable these charging calculations, secondary-electron yields for impacts by relativistic electrons are derived. Needed lunar electrical-grounding precautions for SEE events are discussed. Calls are made 1) for future dynamic simulations of the plasma wake in the presence of time-varying SEE-event relativistic electrons and time-varying solar-wind magnetic-field orientations and 2) for future charging calculations in the relativistic-electron wake environment and on the darkside lunar surface.

79 ASTRONOMY AND ASTROPHYSICS↗

Scintillation yield from electronic and nuclear recoils in superfluid He 4

Superfluid $^4$He is a promising target material for direct detection of light ($<$ 1 GeV) dark matter. Possible signal channels available for readout in this medium include prompt photons, triplet excimers, and roton and phonon quasiparticles. The relative yield of these signals has implications for the sensitivity and discrimination power of a superfluid $^4$He dark matter detector. Using a 16~cm$^3$ volume of 1.75~K superfluid $^4$He read out by six immersed photomultiplier tubes, we measured the scintillation from electronic recoils ranging between 36.3 and 185~keV$_\mathrm{ee}$, yielding a mean signal size of $1.25^{+0.03}_{-0.03}$~phe/keV$_\mathrm{ee}$, and nuclear recoils from 53.2 to 1090~keV$_\mathrm{nr}$. We compare the results of our relative scintillation yield measurements to an existing semiempirical model based on helium-helium and electron-helium interaction cross sections. As a result, we also study the behavior of delayed scintillation components as a function of recoil type and energy, a further avenue for signal discrimination in superfluid $^4$He.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗

Characterization of a LaB6 tip as a thermionically enhanced photoemitter

There is a widespread interest in time-resolved electron spectroscopies such as ultrafast electron diffraction, ultrafast electron microscopy, and ultrafast electron energy loss spectroscopy. These techniques require pulsed electron beams with both high current and brightness. LaB6 is commonly used as a thermionic emitter because of its low work function and high electron yield. However, its use as a pulsed photocathode has not been widely explored. Here, we present measurements of the electron yield from a LaB6 filament exposed to 392 nm UV ultrafast laser pulses under a wide range of filament temperatures. We find that sample heating strongly enhances photoelectron yield, an effect known as thermionically enhanced photoemission. However, it also creates potentially undesirable, continuous thermionic background. We conclude that the ideal optimal operating conditions strongly depend on the type of measurement and require defining and quantifying an appropriate figure of merit.

Physics↗

Extreme Ultraviolet and Beyond Extreme Ultraviolet Lithography Using Amorphous Zeolitic Imidazolate Resists Deposited by Atomic/Molecular Layer Deposition

Amorphous zinc-imidazolate (aZnMIm) resists show potential to meet the demands for next-generation high-numerical aperture (high-NA) metal-containing extreme ultraviolet (EUV) resist materials, given their ease of deposition by atomic/molecular layer deposition (ALD/MLD) at thicknesses of 20 nm and below. Here, this study demonstrates that aZnMIm thin films, previously identified as high-resolution electron beam resists, can also function as negative-tone EUV photoresists. Water development achieves high sensitivity (5 mJ/cm 2 ) but leaves significant residue, while acetic acid development results in poor contrast. A hybrid approach─water followed by acetic acid─enables residue-free development with a sensitivity of 181 mJ/cm 2 . Dry development using 1,1,1,5,5,5-hexafluoroacetylacetone (hfacH) is also possible but shows lower sensitivity (375 mJ/cm 2 ) compared to wet development methods. EUV photoelectron spectroscopy (PES), reflectometry/EUV absorption, total electron yield (TEY), residual gas analysis (RGA), and time-of-flight secondary ion mass spectrometry (TOF-SIMS) were used to investigate the effects of EUV irradiation on aZnMIm resists. Reflectometry experiments reveal an aZnMIm EUV absorption coefficient of 6.2 μm –1 , while PES and TEY analyses show that, compared to poly(4-hydroxystyrene) (PHS), a polymer-based reference resist, aZnMIm emits more primary and secondary electrons but generates fewer slow electrons relative to its primary electron emission; its total electron yield is similar to that of poly(methyl methacrylate) (PMMA) resists. When exposed to EUV, aZnMIm predominantly outgasses H 2 , as determined by RGA. TOF-SIMS measurements demonstrate that high-dose EUV exposure only partially fragments the 2-methylimidazole (2MIm) organic linkers, unlike high-dose electron beam exposure, which is known to completely degrade them. Additionally, aZnMIm resists show promise for potential beyond EUV lithography (BEUVL) due to the presence of Zn, which provides higher sensitivity at a wavelength of 6.7 nm compared to other metal ions, such as Sn, that are currently used in the best-performing EUV metal–organic resists. TEY measurements demonstrate that aZnMIm emits nearly twice as many electrons as PHS at 6.7 nm. The BEUV TEY of aZnMIm also surpasses that of PMMA, poly(pentafluorostyrene), and poly(4-iodostyrene), with the latter two being known for their high EUV TEYs. This work provides insight into zeolitic imidazolate framework (ZIF)-based EUV and BEUV resists and highlights their potential for both wet and dry development.

lithography↗

High-fidelity modeling of breakdown in helium: initiation processes and secondary electron emission

Understanding the role of physical processes contributing to breakdown is critical for many applications in which breakdown is undesirable, such as capacitors, and applications in which controlled breakdown is intended, such as plasma medicine, lightning protection, and materials processing. The electron emission from the cathode is a critical source of electrons which then undergo impact ionization to produce electrical breakdown. In this study, the role of secondary electron yields due to photons (γ ph ) and ions (γ i ) in direct current breakdown is investigated using a particle-in-cell direct simulation Monte Carlo model. The plasma studied is a one-dimensional discharge in 50 Torr of pure helium with a platinum cathode, gap size of 1.15 cm, and voltages of 1.2–1.8 kV. The current traces are compared with experimental measurements. Larger values of γ ph generally result in a faster breakdown, while larger values of γ i result in a larger maximum current. The 58.4 nm photons emitted from He(2 1 P) are the primary source of electrons at the cathode before the cathode fall is developed. Of the values of γ ph and γ i investigated, those which provide the best agreement with the experimental current measurements are γ ph = 0.005 and γ i = 0.01. In this work, these values are significantly lower than those in the literature for pristine platinum or for a graphitic carbon film which we speculate may cover the platinum. This difference is in part due to the limitations of a one-dimensional model but may also indicate surface conditions and exposure to a plasma can have a significant effect on the secondary electron yields. The effects of applied voltage and the current produced by a UV diode which was used to initiate the discharge, are also discussed.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Advanced Diagnostics of Broad Spectrum Multipactor

Multipactor is a resonance event between electron emission and RF fields causing exponential secondary electron re-emission growth when the secondary electron yield of the primary electron impact energy exceeds unity. Multipactor is a serious problem in vacuum electron devices (VEDs) such as particle accelerators, radars, electronic warfare systems, directed energy devices, and even Hall effect thrusters. It also poses an even greater threat to space communication systems where high power, multi-channel links are required. The UC Davis and SLAC team will conduct basic research to advance the fundamental understanding of multipactor physics by developing and carrying out full spectrum, radio frequency (RF) laboratory tests aimed at understanding both single and two-surface multipactor phenomena and at evaluating novel multipactor mitigation approaches for accelerator, space-based RF systems, as well as high power microwave (HPM) applications.

36 MATERIALS SCIENCE↗