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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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All sourcesNASA NTRSDOE OSTI
NASA NTRSDate not supplied

Measurement of Secondary Electron Yield from Dielectric Materials

Secondary Electron Yield (SEY) is a material property that plays a fundamental role in material and spacecraft charging. SEY values for dielectric materials (insulators) are crucial inputs to models used to assess mission risk posed by high differential voltages and electrostatic discharge (ESD) on spacecraft. There are only two (non-NASA) facilities that attempt such measurements. The lack of NASA capability results in high cost and long, unpredictable schedules to obtain measurements. Future Artemis crewed lunar surface missions will involve the first use of many insulating materials for which SEY properties are poorly understood or absent entirely. Unconstrained SEY values in models increase uncertainty in charging/ESD risk assessment. The capability for reliable SEY determination will lead to improved charging and ESD risk assessments. We are developing a new capability, using pulsed ultralow (<femtoampere) incident electron beam intensity to eliminate sample charging, coupled with sensitive non-contact surface potential measurements, to measure secondary electron yield (SEY) from insulating materials. Present methods for SEY measurement on insulators suffer from highly inconsistent results due to sample charging from the incident electron beam during the measurement. In this first phase we are leveraging existing EM41 instrumentation, facilities, and expertise to perform proof-of-concept tests.

secondary electron emission↗
DOE OSTI2020

Differential electron yield imaging with STXM

In this report total electron yield (TEY) imaging is an established scanning transmission X-ray microscopy (STXM) technique that gives varying contrast based on a sample's geometry, elemental composition, and electrical conductivity. However, the TEY-STXM signal is determined solely by the electrons that the beam ejects from the sample. A related technique, X-ray beam-induced current (XBIC) imaging, is sensitive to electrons and holes independently, but requires electric fields in the sample. Here we report that multi-electrode devices can be wired to produce differential electron yield (DEY) contrast, which is also independently sensitive to electrons and holes, but does not require an electric field. Depending on whether the region illuminated by the focused STXM beam is better connected to one electrode or another, the DEY-TXM contrast changes sign. DEY-STXM images thus provide a vivid map of a device's connectivity landscape, which can be key to understanding device function and failure. To demonstrate an application in the area of failure analysis, we image a 100 nm, lithographically-defined aluminum nanowire that has failed after being stressed with a large current density.

47 OTHER INSTRUMENTATION↗
NASA NTRS1992

Secondary electron yields of solar system ices

The secondary electron yields of H2O, CO2, NH3, and CH3OH ices have been measured as a function of electron beam energy in the 2- to 30-keV energy range. The ices were produced on a liquid-nitrogen-cooled cold finger and transferred under vacuum to a SEM where the yield measurements were made. The imaging capabilities of the SEM provide a means of correlating the yield measurements with the morphology of the ices and are also used to monitor charging effects. The yields were determined by measuring the amplified current from a secondary electron detector and calibrating this current signal with the amplified current signal from samples of metals with known secondary electron yields. Each of the measured yields is found to decrease with an increase in energy in the 2- to 30-keV range. Estimates are given for the maximum secondary electron yield Y(max) of each ice and the energy at which this maximum yield occurs. Implications for the charging of solar system ice grains are discussed.

Suszcynsky, David M.↗
DOE OSTI2022

Digging deeper: Buried layers and interfaces studied by modified total electron yield and soft x-ray absorption spectroscopy

We report on the soft x-ray absorption spectroscopy investigation of thin film capacitors using a modified total electron yield detection mode. This mode utilizes two ammeters instead of one as commonly employed in the classical total electron yield scheme to measure photocurrents of devices under soft x-ray irradiation. The advantage of this configuration over the surface sensitive classical total electron yield mode is that it can provide information from buried layers and interfaces up to a thickness equal to the penetration depth of soft x-rays. The method can be easily adapted to existing synchrotron end stations. We investigate dielectric capacitors with dissimilar electrodes to assess the feasibility of the modified total electron yield method. Furthermore, in operando soft x-ray absorption spectroscopy measurements are performed on ferroelectric capacitors under bias and using two ammeters. The experimental results are discussed in terms of the external and internal photoemission processes and their distribution in thin film capacitors under an external bias condition. The proposed detection method opens the way to perform electronic and chemical state analyses of the buried interfaces and layers in various devices like multiferroic tunnel junctions, memristive devices, etc., during operation under an applied bias.

Kröger, E.↗
DOE OSTI2023

The influence of secondary electron yield uncertainty on the single-sided multipacting in dielectrics

Multipacting is an electrical discharge caused by the emission of secondary electrons which can occur in vacuum radio frequency systems. Generally multipacting is highly undesirable obstacle, which increases the noise level as well as the return loss of radio frequency systems. Therefore, a prediction of multipacting is necessary to avoid it during radio frequency system design. In this regard, the accurate evaluation of the factors that affect multipacting is required. One of the critical factors determining the multipacting development is the secondary electron yield of the material. In practice the emission properties of materials are not known very accurately. There are uncertainties in the measured values of this yield. In this paper, the generalized Polynomial Chaos (gPC) method is used to quantify uncertainty of the secondary electron yield. This method is verified by Monte Carlo simulation. The effect of uncertainty for two secondary electron yield parameters is then investigated on the multipacting using gPC method.

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2024

Analysis of multipacting threshold sensitivity to the random distributions of the secondary electron yield parameters

The way multipacting develops, depends strongly on the secondary emission property of the surface material. The knowledge of secondary electron yield is crucial for accurate prediction of the multipacting threshold. Variations in secondary electron yield parameters from experimental measurements create uncertainty, stemming from handling and surface preparation, and these uncertainties significantly affect multipacting threshold predictions. Despite their significance, the previous studies on the multipacting phenomenon did not adequately address the effect of an assumed random distribution of the secondary emission parameters on the multipacting threshold. Therefore, this paper aims to provide a comprehensive statistical study on how the different random distributions of the secondary emission parameters and, as a result, the uncertainty in the secondary electron yield affect multipacting thresholds. We focus on three commonly used distributions, namely uniform, normal, and truncated normal distributions, to define the uncertainty of random inputs. We use the chaos polynomial expansion method to determine how much each of the random parameters contributes to the multipacting threshold uncertainty. Additionally, we calculate Sobol sensitivity indices to evaluate the impact of the individual parameters or groups of parameters on the model outputs and study how different random distributions of these parameters affected the Sobol index results.

physics↗
NASA NTRS2005

Evolution of the Electron Yield Curves of Insulators as a Function of Impinging Electron Fluence and Energy

Electron emission and concomitant change accumulation near the surface of insulators in central to understanding spacecraft charging. We present a study of changes in electron emission yields as a result of internal charge build up due to electron dose. Evolution of total, backscattered and secondary yield results over a broad range of incident energies are presented for two representative insulators, Kapton(trademark) and Al2O3. Reliable yield curves for uncharged insulators are measured and quantifiable changes in yield are observed due to < 100 fC/sq mm fluences. We find excellent agreement with a phenomenological argument based on insulator charging predicted by the yield curve; this includes a decrease in the rate of change of the yield as incident energies approach the crossover energies and as accumulated internal charge reduces the landing energy to asymptotically approach a steady state surface charge and unity yield. We also find that the exponential decay of yield curves with fluence exhibit an energy dependent decay constant, alpha(E). Finally, we discuss physics based models for this energy dependence. To understand fluence and energy dependence of these charging processes requires knowledge of how charge is deposited within the insulator, the mechanisms for charge trapping and transport within the insulator, and how the profile of trapped charge affects the transport and emission of charges from insulators.

Sim, Alec↗
DOE OSTI2025

A fully contained sample holder capable of electron-yield detection at soft X-ray energies

A holder has been developed that enables electron yield-detected soft X-ray spectroscopy of fully contained samples at low temperature. Crucially, this design uses elements of the sample containment to collect ejected electrons, removing the need to expose samples directly to the vacuum environment of the spectrometer. The design is modular and should be adaptable to a number of different endstation configurations, enabling spectroscopy of air-sensitive, radioactive and vacuum-sensitive (biological) samples.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
NASA NTRS1985

Electron yields from spacecraft materials

Photoyields and secondary electron emission (SEE) characteristics were determined under UHV conditions for a group of insulating materials used in spacecraft applications. The SEE studies were carried out with a pulsed primary beam while photoyields were obtained with a chopped photon beam from a Kr resonance source with major emission at 123.6 nm. This provides a photon flux close to that of the Lyman alpha in the space environment. Yields per incident photon are obtained relative to those from a freshly evaporated and air oxidized Al surface. Results are presented for Kapton, FEP Teflon, the borosilicate glass covering of a shuttle tile, and spacesuit outer fabric.

Yang, K.↗
DOE OSTI2025

NOVEL METHODS FOR IN SITU HIGH DENSITY SURFACE CLEANING SCRUBBING OF ULTRAHIGH VAC LONG NARROW TUBES TO REDUCE SECONDARY ELECTRON YIELD AND OUT GASSING

This project developed new methods for cleaning the inside surfaces of very long, narrow vacuum tubes used in particle accelerators. Traditional cleaning approaches are expensive, slow, or difficult to implement in accelerator tunnels. We designed and tested a portable plasma discharge cleaning system that uses lower-cost microwave and magnetron technologies to reduce outgassing and secondary electron emission from stainless steel and copper surfaces. The system, called the Plasma Discharge Test System (PDTS), allows accelerator components to be scrubbed more efficiently, which can improve performance and reduce maintenance costs for research and industrial applications.

POOLE, JOE HENRY [PRESIDENT]↗
NASA NTRS1981

Secondary Electron Emission Yields

The secondary electron emission (SEE) characteristics for a variety of spacecraft materials were determined under UHV conditions using a commercial double pass CMA which permits sequential Auger electron electron spectroscopic analysis of the surface. The transparent conductive coating indium tin oxide (ITO) was examined on Kapton and borosilicate glass and indium oxide on FED Teflon. The total SEE coefficient ranges from 2.5 to 2.6 on as-received surfaces and from 1.5 to 1.6 on Ar(+) sputtered surfaces with 5 nm removed. A cylindrical sample carousel provides normal incidence of the primary beam as well as a multiple Faraday cup measurement of the approximately nA beam currents. Total and true secondary yields are obtained from target current measurements with biasing of the carousel. A primary beam pulsed mode to reduce electron beam dosage and minimize charging of insulating coatings was applied to Mg/F2 coated solar cell covers. Electron beam effects on ITO were found quite important at the current densities necessary to do Auger studies.

Krainsky, I.↗