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Results for “dielectric breakdown”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1992

Current flow in a plasma caused by dielectric breakdown

Spacecraft with a thin dielectric coating on the outer surface of the structure which are biased (-200 V) negative relative to the atmospheric plasma are susceptible to dielectric breakdown. This paper will present experimental tests designed to measure the electron current flow from the structure through the plasma during the arc. The current path was examined in three parts: the electrons supplied through the structure and the arc to the outer structure, the expansion of the arc into the ambient plasma, and the return current through the ambient plasma. The measured electron current either flowing from the plasma or supplied to the plasma by the arc in each case was compared to the random thermal electron current which could be collected. The results of the tests show a spacecraft is capable of supporting arcs with peak currents greater than thermal electron currents, and these currents will be dependent upon the amount of stored charge in the structure (i.e., the structure's surface area and dielectric thickness). Also, the results of these tests show that it is possible for structures with a self capacitance of 10 microFarads to see peak currents of 90 A and structures with 1000 microFarads (i.e., capacitance of one Space Station Freedom module) to produce peak currents of 1000 A.

Vaughn, J. A.↗
NASA NTRS1975

Inherent time delay for dielectric breakdown in shock-loaded x-cut quartz

Dielectric breakdown in shock-loaded x-cut quartz is examined under conditions of both impact loading and Q-switched laser-irradiation loading. It is observed that breakdown is characterized by an inherent time delay which depends on the magnitude of the electric field. For pulse duration less than about 30 ns, dielectric breakdown is not observed.

Graham, R. A.↗
DOE OSTI2024

Computational prediction of dielectric breakdown strength of a transformer paper in oil with uncertainty quantification

The determination of the dielectric breakdown strengths of microstructurally heterogeneous materials has been a primarily experimental endeavor. We report the development of a microstructure-level model for computationally predicting the breakdown strength and analyzing the interactions between electromagnetic pulses (EMP) and the constituents in a composite of cellulose-based paper and mineral oil found in electrical transformers. The model allows explicit simulation of the material breakdown process by tracking the transition of dielectric constituents from non-conductive to conductive states. The focus is on the electric fields induced in the materials and the overall conditions for dielectric breakdown (defined as the onset of avalanche) caused by the electric field induced in the composite. Responses to three distinct pulse shapes, i.e., Steep Front (SF), Lightning (L), and AC with spectra spanning 60–9 × 105 Hz are considered. It is found that the breakdown strength of the material is significantly affected by microstructure heterogeneities, the spatial variations of the constituent properties, and the pulse shapes. A probabilistic characterization of the breakdown strength is computationally obtained and compared with experimental measurements. Although one particular material is analyzed, the model and approach are applicable to other heterogeneous materials as well.

breakdowns↗
DOE OSTI2020

Direct Observations of Field-Intensity-Dependent Dielectric Breakdown Mechanisms in TiO 2 Single Nanocrystals

One of the main challenges for next-generation electric power systems and electronics is to avoid premature dielectric breakdown in insulators and capacitors and to ensure reliable operations at higher electric fields and higher efficiencies. However, dielectric breakdown is a complex phenomenon and often involves many different processes simultaneously. Here we show distinctly different defect-related and intrinsic breakdown processes by studying individual, single crystalline TiO 2 nanoparticles using in-situ transmission electron microscopy (TEM). As the applied electric field intensity rises, rutile-to-anatase phase transition, local amorphization/melting, or ablation are identified as the corresponding breakdown processes, the field intensity thresholds of which are found to be related to the position of the intensified field and the duration of the applied bias relative to the time of charged defects accumulation. Our observations reveal an intensity-dependent dielectric response of crystalline oxides at breakdown and suggest possible routes to suppress the iniation of premature dielectric breakdown. Hence, they will aid the design and development of next generation robust and efficient solid dielectrics.

36 MATERIALS SCIENCE↗
DOE OSTI2025

Effect of Transverse Compression on the Dielectric Breakdown of Power Cable with Ethylene Propylene Rubber Insulation

Understanding of the failure mechanisms of submarine dynamic power cables (SDPC) is critical for innovative design to meet the 2035 cost reduction target of U.S. DOE Floating Offshore Wind Shot. This is important because the current design suffers a significant failure rate in the field. This project explored a multiphysics approach and conducted systematic electro-thermo-mechanical (ETM) experimental study on the power cores extracted from a 15 kV power cable. The power cable had three cores of copper conductor and ethylene propylene rubber (EPR) insulation. An ETM testing system with transverse compression capability was developed. Mechanical loading induced dielectric breakdown. Increasing temperature from room temperature (RT, 22 degrees Celsius) to 90 degrees Celsius resulted in the 67% decrease in the failure mechanical load as defined by the dielectric breakdown. With the same temperature rise, the creep mechanical load was reduced by 70% at a given dielectric breakdown time. The post-test measurement revealed an impressive recovery of electrical resistance, although the dielectric breakdown occurred in the ETM test that would not be captured without the use of ETM testing.

Wang, Hong [ORNL] (ORCID:0000000201730545)↗
NASA NTRS2018

How Dielectric Breakdown May Contribute to the Global Weathering of Regolith on the Moon

Space weathering is an important process on airless bodies, and it must be considered when interpreting data from planetary missions. Previous work has shown that solar energetic particles may cause dielectric breakdown in regolith within permanently shadowed regions near the poles of the Moon. Here, we predict that dielectric breakdown weathering could have melted and/or vaporized 2 − 9% of gardened (i.e., thoroughly mixed) regolith at the equator and 5 − 11% near the poles. If so, then ∼ 3 − 10% of all gardened regolith on the Moon may have experienced dielectric breakdown, and this process must be considered when analyzing remote sensing data or soil samples returned by the Luna and Apollo missions.

Jordan, A P.↗
DOE OSTI2022

Controlled Dielectric Breakdown to Form Pinhole Passivated Contacts

This contribution explores a low-temperature route to forming dielectric pinholes to form poly-Si/dielectric/c-Si passivated contacts. The method utilizes controlled dielectric breakdown to form nanoscale pinholes in a thick (non-tunnelling) dielectric which, when annealed, allows dopant atoms to pass from doped poly-Si through the dielectric and into the c-Si wafer forming conductive pathways. We show that the pinholes can be repassivated with dopants and H diffusion which results in increased PL signals after processing. The method can be expanded to optimized dielectric passivation stacks (not just a single layer) and can be formed in parallel over the faces of the wafer in selected areas (only under the grid).

controlled dielectric breakdown↗
DOE OSTI2022

On the initiation and evolution of dielectric breakdown in auto-magnetizing liner experiments

Auto-magnetizing (AutoMag) liners are cylindrical tubes composed of discrete metallic helices encapsulated in insulating material; when driven with a ~2 MA, ~100-ns prepulse on the 20 MA, 100-ns rise time Z accelerator, AutoMag targets produced >150 T internal axial magnetic fields. Once the current rise rate of the pulsed power driver reaches sufficient magnitude, the induced electric fields in the liner cause dielectric breakdown of the insulator material and, with sufficient current, the cylindrical target radially implodes. The dielectric breakdown process of the insulating material in AutoMag liners has been studied in experiments on the 500–900 kA, ~100-ns rise time Mykonos accelerator. Multi-frame gated imaging enabled the first time-resolved observations of photoemission from dynamically evolving plasma distributions during the breakdown process in AutoMag targets. Using magnetohydrodynamic simulations, we calculate the induced electric field distribution and provide a detailed comparison to the experimental data. We find that breakdown in AutoMag targets does not primarily depend on the induced electric field in the gaps between conductive helices as previously thought. Finally, to better control the dielectric breakdown time, a 12–32 mJ, 170 ps ultraviolet (λ = 266 nm) laser was implemented to irradiate the outer surface of AutoMag targets to promote breakdown in a controlled manner at a lower internal axial field. Here, the laser had an observable effect on the time of breakdown and subsequent plasma evolution, indicating that pulsed UV lasers can be used to control breakdown timing in AutoMag.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
NASA NTRS2016

The Rate of Dielectric Breakdown Weathering of Lunar Regolith in Permanently Shadowed Regions

Large solar energetic particle events may cause dielectric breakdown in the upper 1 mm of regolith in permanently shadowed regions (PSRs). We estimate how the resulting breakdown weathering compares to meteoroid impact weathering. Although the SEP event rates measured by the Cosmic Ray Telescope for the Effects of Radiation (CRaTER) on the Lunar Reconnaissance Orbiter (LRO) are too low for breakdown to have significantly affected the regolith over the duration of the LRO mission, regolith gardened by meteoroid impacts has been exposed to SEPs for approx.10(exp 6 yr. Therefore, we estimate that breakdown weathering's production rate of vapor and melt in the coldest PSRs is up to 1.8−3. 5 ×10(exp −7) kg/sq m/yr, which is comparable to that produced by meteoroid impacts. Thus, in PSRs, up to 10-25% of the regolith may have been melted or vaporized by dielectric breakdown. Breakdown weathering could also be consistent with observations of the increased porosity ("fairy castles") of PSR regolith. We also show that it is con- ceivable that breakdown-weathered material is present in Apollo soil samples. Consequently, breakdown weathering could be an important process within PSRs, and it warrants further investigation.

Meteoroid↗
NASA NTRS1985

Water permeation and dielectric breakdown. Water permeability in Pub Tedlar. Pub/Tedlar as a function of temperature and humidity

Moisture transport and dielectric breakdown of polyvinyl butyral (PVB), Tedlar, and PVB/Tedlar composites were addressed. Data for the temperature range between 20 and 80 C showed that the moisture flux through the composite is governed by the slower material; and that the composite permeability is intermediate to those of the component material, as predicted by theory. Data for Tedlar at 71 C, showing the dependence of moisture flux on relative humidity, was also presented. Dielectric breakdown data were less precise and less conclusive. The generally applied theoretical model does not match the experimental data. The PVB/Tedlar composite exhibited greater voltage breakdown resistance than either component. Testing of EVA and EVA/Tedlar composites is underway.

Orehotsky, J.↗
NASA NTRS1977

Record dielectric breakdown automatically

Automatic Monitoring System for time-dependent dielectric breakdown tests ninety-nine metal-oxide semiconductor capacitors simultaneously. Each breakdown generates voltage spike registered on readouts and indicated by LED. Latching circuit prevents recording of possible subsequent breakdowns in same capacitor. In addition to research use, system could also be adapted for quality control.

Bates, E. T., Jr.↗
NASA NTRS1972

Dielectric breakdown in a dilute plasma: A 20 kilovolt limited study

A dielectric breakdown study was made of several materials proposed for high-voltage (16-kV) use on solar-cell arrays at space conditions. The tests were made in an argon plasma whose electron density and temperature approximately simulated conditions at an altitude of 300 km. The maximum voltage used was 20 kV. The results indicate that the breakdown voltages of the materials tested are larger than those quoted in the literature for dielectric between two metal electrodes.

Mckinzie, D. J., Jr.↗
NASA NTRS2018

The Possible Contribution of Dielectric Breakdown to Space Weathering on Phobos

The origins of Phobos and Deimos are uncertain; both are so space weathered that their surface compositions are difficult to determine using spectral reflectance measurements. We show how the winter temperatures and associated conditions in the polar regions of Phobos could make the regolith susceptible to space weathering from dielectric breakdown caused by solar energetic particles (SEPs). During SEP events, charged particles accumulate throughout the top ~ 1 mm of the regolith, which has low condukctivity, and create subsurface electric fields that act to dissipate any net buildup of charge. The faster the net charge accumulates, the larger the electric field needed to dissipate it. If the magnitude of the subsurface electric field exceeds ~10 6 V m -1, then dielectric breadkown is likely. This process rapidly dissipates the buildup of charge by vaporizing electrically conducting channels through the regolith. Dielectric breakdown

Space Weathering↗
NASA NTRS1974

A measurement technique of time-dependent dielectric breakdown in MOS capacitors

The statistical nature of time-dependent dielectric breakdown characteristics in MOS capacitors was evidenced by testing large numbers of capacitors fabricated on single wafers. A multipoint probe and automatic electronic visual display technique are introduced that will yield statistical results which are necessary for the investigation of temperature, electric field, thermal annealing, and radiation effects in the breakdown characteristics, and an interpretation of the physical mechanisms involved. It is shown that capacitors of area greater than 0.002 sq cm may yield worst-case results, and that a multipoint probe of capacitors of smaller sizes can be used to obtain a profile of nonuniformities in the SiO2 films.

Li, S. P.↗
DOE OSTI2022

Multiscale Characterization of the Influence of the Organic–Inorganic Interface on the Dielectric Breakdown of Nanocomposites

Nanoscale engineered materials such as nanocomposites can display or be designed to enhance their material properties through control of the internal interfaces. In this report we unveil the nanoscale origin and important characteristics of the enhanced dielectric breakdown capabilities of gold nanoparticle/polymer nanocomposites. Our multiscale approach spans from the study of a single chemically designed organic/inorganic interface to micrometer-thick films. At the nanoscale, we relate the improved breakdown strength to the interfacial charge retention capability by combining scanning probe measurements and density functional theory calculations. At the meso- and macroscales, our findings highlight the relevance of the nanoparticle concentration and distribution in determining and enhancing the dielectric properties, as well as identifying this as a crucial limiting factor for the achievable sample size.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
DOE OSTI2023

Controlled Dielectric Breakdown to Form Pinhole Passivating Contacts

This contribution explores an alternate route to forming pinhole-based poly-Si/dielectric/c-Si passivating contacts. The method utilizes controlled dielectric breakdown or electroforming to produce nanoscale pinholes in a thick (non-tunnelling) dielectric which, when annealed, allows dopant atoms to pass from doped poly-Si through the pinholes and into the c-Si wafer, forming conductive pathways. We show that the pinholes lose passivation after electroforming but can be repassivated with a forming gas anneal. N-type contacts show contact resistivities of ~20 mOhm-cm2, but p-type contacts are ~100 mOhm-cm2. Devices show a distinct kink in the J-V curve indicative of a barrier to transport. The method can be expanded to optimized dielectric passivation stacks (not just thin, single layers) and can be formed in parallel over the faces of the wafer in selected areas (pinholes only under the grid lines).

CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SU↗