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Results for “device characterization”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2023

Design of a High Flux Beam Characterization Device for Falling Particle Receivers

This paper outlines the design and error analysis for a flux characterization device (i.e. flux wand) which traverses the aperture of a falling particle receiver cavity providing the incident power measurement needed for the calculation of receiver efficiency without significantly disrupting receiver output. The design features a linear actuator, water cooled extension arm, and refractory bar. The refractory bar/flux wand is a diffusely reflective surface which reflects light as it is translated across the receiver aperture to provide a light intensity distribution that is correlated to a measured flux. The component sizing, constrained by a typical 30 frame per second camera and a 4-point average of the measured reflectance, is presented. Simulation reveals the error that results from a 5% variation in flux wand reflectance is within 4% of the true value.

Schroeder, Nathan↗
NASA NTRS2003

High-Temperature RF Probe Station For Device Characterization Through 500 deg C and 50 GHz

A high-temperature measurement system capable of performing on-wafer microwave testing of semiconductor devices has been developed. This high temperature probe station can characterize active and passive devices and circuits at temperatures ranging from room temperature to above 500 C. The heating system uses a ceramic heater mounted on an insulating block of NASA shuttle tile material. The temperature is adjusted by a graphical computer interface and is controlled by the software-based feedback loop. The system is used with a Hewlett-Packard 8510C Network Analyzer to measure scattering parameters over a frequency range of 1 to 50 GHz. The microwave probes, cables, and inspection microscope are all shielded to protect from heat damage. The high temperature probe station has been successfully used to characterize gold transmission lines on silicon carbide at temperatures up to 540 C.

Schwartz, Zachary D.↗
NASA NTRS2009

Visco Jet Joule-Thomson Device Characterization Tests in Liquid Methane

Joule-Thomson (J-T) devices have been identified as critical components for Thermodynamic Vent Systems (TVS) planned for future space exploration missions. Lee Visco Jets (The Lee Company) (Ref. 4) are one type of J-T device that may be used for LCH4 propellant systems. Visco Jets have been previously tested and characterized in LN2 and LH2 (Refs. 6 and 7), but have not been characterized in LOX or LCH4. Previous Visco Jet tests with LH2 resulted in clogging of the Visco Jet orifice under certain conditions. It has been postulated that this clogging was due to the presence of neon impurities in the LH2 that solidified in the orifices. Visco Jets therefore require testing in LCH4 to verify that they will not clog under normal operating conditions. This report describes a series of tests that were performed at the NASA Glenn Research Center to determine if Visco Jets would clog under normal operating conditions with LCH4 propellant. Test results from this program indicate that no decrease in flow rate was observed for the Visco Jets tested, and that current equation used for predicting flow rate appears to under-predict actual flow at high Lohm ratings.

Jurns, John M.↗
DOE OSTI2024

DECAF Cross-device characterization of tokamak disruptions indicated by abnormalities in plasma vertical position and current

Abnormal (deviating from target) variations in the plasma vertical position Z and current I p (such as vertical displacements, transient I p 'spikes' and quenches) constitute common elements of a disruption, a phenomenon that is to be mitigated, or ultimately avoided in future reactor-relevant tokamaks. While those abnormalities are generally recognized cross-shot and cross-device, details in terms of appearance (or not) and order of those abnormalities in disruption event chains is bound with the plasma state at the time of the chain initiation. Detection of those abnormalities is thus indicative not only of the onset of the plasma collapse itself, but also of the disruption driving cause that is promoted at the particular plasma state. Here, occurrence of disruptions, explored via detection of a Ip quench, and analysis of disruption event chains constituted by Ip and Z abnormalities, is reported for in total 7 full years of operation of 3 devices (KSTAR, MAST-U and NSTX-U) using the DECAFTM code expanded tools and capabilities. It is shown that the disruption occurrence depends not only on details of the plasma state, but also on (device-dependent) technical elements of the shot exit scenario. A year-to-year change in main disruption causes and a reduction of the disruptivity rate, bound with device and operation upgrades, are reported. Particular trigger instances of disruption event chains (and the full chains, when applicable) are shown to occupy different parts of the operation space diagrams, in accordance with prior expectation. Plasma elongation is identified as an important factor influencing details of the chains and its role will be further explored.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
NASA NTRS1984

Diffused junction p(+)-n solar cells in bulk GaAs. II - Device characterization and modelling

The photovoltaic characteristics of p(+)-n junction solar cells fabricated on bulk GaAs by an open tube diffusion technique are presented in detail. Quantum efficiency measurements were analyzed and compared to computer simulations of the cell structure in order to determine material parameters such as diffusion length, surface recombination velocity and junction depth. From the results obtained it is projected that proper optimization of the cell parameters can increase the efficiency of the cells to close to 20 percent.

Keeney, R.↗
NASA NTRS1985

Addressable inverter matrix for process and device characterization

The addressable inverter matrix consists of 222 inverters each accessible with the aid of a shift register. The structure has proven useful in characterizing the variability of inverter transfer curves and in diagnosing processing faults. For good 3-micron CMOS bulk inverters investigated, the percent standard deviation of the inverter threshold voltage was less than one percent and the inverter gain (the slope of the inverter transfer curve at the inverter threshold vltage) was less than 3 percent. The average noise margin for the inverters was near 2 volts for a power supply voltage of 5 volts. The specific faults studied included undersize pull-down transistor widths and various open contacts in the matrix.

Buehler, M. G.↗
NASA NTRS1985

Addressable inverter matrix for process and device characterization

The addressable inverter matrix consists of 222 inverters each accessible with the aid of a shift register. The structure has proven useful in characterizing the variability of inverter transfer curves and in diagnosing processing faults. For good 3-micron CMOS bulk inverters investigated in this study, the percent standard deviation of the inverter threshold voltage was less than one percent and the inverter gain (the slope of the inverter transfer curve at the inverter threshold voltage) was less than 3 percent. The average noise margin for the inverters was near 2 volts for a power supply voltage of 5 volts. The specific faults studied included undersize pull-down transistor widths and various open contacts in the matrix.

Buehler, M. G.↗
NASA NTRS1995

Report on twisted nematic and supertwisted nematic device characterization program

In this study we measured the optical characteristics of normally white twisted nematic (NWTN) and super twisted nematic (STN ) cells. Though no dynamic computer model was available, the static observations were compared with computer simulated behavior. The measurements were taken as a function of both viewing angle and applied voltage and included in the static case not only luminance but also contrast ratio and chromaticity . We employed the computer model Twist Cell Optics, developed at Kent State in conjunction with this study, and whose optical modeling foundation, Iike the ViDEOS program, is the 4 x 4 matrix method of Berreman. In order to resolve discrepancies between the experimental and modeled data the optical parameters of the individual cell components, where not known, were determined using refractometry, profilometry, and various forms of ellipsometry. The resulting agreement between experiment and model is quite good due primarily to a better understanding of the structure and optics of dichroic sheet polarizers. A description of the model and test cells employed are given in section 2. Section 3 contains the experimental data gathered and section 4 gives examples of the fit between model and experiment. Also included with this report are a pair of papers which resulted from the research and which detail the polarizer properties and some of the cell characterization methods.

Source record↗
NASA NTRS2026

Parabolic Deformable Mirror Project Development and Device Characterization

Existing state-of-the-art wavefront sensing and control setups for the imaging of exoplanets utilize two high-actuator count flat deformable mirrors (DMs) to control both phase and amplitude aberrations. One of the objectives of the Exoplanet Spectroscopy (ExoSpec) project at Goddard Space Flight Center (GSFC) is to improve upon this regime through the development of parabolic deformable mirrors (PDMs), which can address several of the key limitations in existing setups. Specifically, the need for flat DMs to be located in conjugate pupil planes drives unique packaging challenges that can be overcome by allowing the off-axis imaging elements to be controllable as well. In addition, simulations show that the use of deformable powered elements will increase the overall controllable bandwidth, up to 35% over 5-12 lambda/D. To pursue this effort, the ExoSpec group has begun testing a first-generation parabolic DM, which is already informing a second generation design. This paper will provide a comprehensive update on its characterization, including influence function measurements, linearity analysis, closed-loop wavefront control performance, and thermal stability assessment.

spectroscopy↗
DOE OSTI2026

Research and Development Related to the Commercialization of Perovskite Radiation Detectors (CRADA Final Report)

This work will focus on the development of perovskite radiation detectors fabricated with nanocrystal, thick polycrystalline films, or single crystal materials. This will harness NREL’s instrumentation and expertise in a variety of research areas including but not limited to metal halide perovskites, device characterization, device packaging, accelerated lifetime testing, and ink chemistry development.

14 SOLAR ENERGY↗
DOE OSTI2022

Characterizing the Reproducibility of Noisy Quantum Circuits

The ability of a quantum computer to reproduce or replicate the results of a quantum circuit is a key concern for verifying and validating applications of quantum computing. Statistical variations in circuit outcomes that arise from ill-characterized fluctuations in device noise may lead to computational errors and irreproducible results. While device characterization offers a direct assessment of noise, an outstanding concern is how such metrics bound the reproducibility of a given quantum circuit. Here, we first directly assess the reproducibility of a noisy quantum circuit, in terms of the Hellinger distance between the computational results, and then we show that device characterization offers an analytic bound on the observed variability. We validate the method using an ensemble of single qubit test circuits, executed on a superconducting transmon processor with well-characterized readout and gate error rates. The resulting description for circuit reproducibility, in terms of a composite device parameter, is confirmed to define an upper bound on the observed Hellinger distance, across the variable test circuits. This predictive correlation between circuit outcomes and device characterization offers an efficient method for assessing the reproducibility of noisy quantum circuits.

97 MATHEMATICS AND COMPUTING↗