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Results for “depth profiling techniques”

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NASA NTRS1978

Direct measurement of surface carbon concentrations for lunar soil breccias

A nuclear reaction depth profiling technique previously described by Filleux et al. (1977) has been used to measure the depth distribution of C on grain surfaces for Apollo 11, 15, 16 and 17 soil breccias. The surface C concentration of all samples studied lies between 2 and 8 times 10 to the 15th atoms per sq cm, showing no correlation with the volume C, which varies over an order of magnitude. If the observed variation represents the presence of unexposed grains on the surfaces studied, these results indicate a steady state surface C concentration of 5 to 10 times 10 to the 15th atoms per sq cm, accumulated over a time scale short compared with that required for the formation of volume-related C and with the mean lifetime of grains at the lunar surface. About one-third to one-half of the total C in lunar soil seems to be surface-correlated.

Filleux, C.↗

NASA NTRS2006

Modeling Ellipsometry Measurements of Molecular Thin-Film Contamination on Genesis Array Samples

The discovery of a molecular thin-film contamination on Genesis flown array samples changed the course of preliminary assessment strategies. Analytical techniques developed to measure solar wind elemental abundances must now compensate for a thin-film contamination. Currently, this is done either by experimental cleaning before analyses or by depth-profiling techniques that bypass the surface contamination. Inside Johnson Space Center s Genesis dedicated ISO Class 4 (Class 10) cleanroom laboratory, the selection of collector array fragments allocated for solar wind analyses are based on the documentation of overall surface quality, visible surface particle contamination greater than 1 m, and the amount of thin film contamination measured by spectroscopic ellipsometry. Documenting the exact thickness, surface topography, and chemical composition of these contaminates is also critical for developing accurate cleaning methods. However, the first step in characterization of the molecular film is to develop accurate ellipsometry models that will determine an accurate thickness measurement of the contamination film.

Calaway, Michael J.↗

NASA NTRS1979

Evaluation and auger analysis of a zinc-dialkyl-dithiophosphate antiwear additive in several diester lubricants

The wear of pure iron in sliding contact with hardened M-2 tool steel was measured for a series of synthetic diester fluids, both with and without a zinc dialkyl dithiophosphate (ZDP) antiwear additive, as test lubricants. Selected wear scars were analyzed by an Auger emission spectroscopy (AES) depth profiling technique in order to assess the surface film elemental composition. The ZDP was an effective antiwear additive for all the diesters except dibutyl oxalate and dibutyl sebacate. The high wear measured for the additive-containing oxalate was related to corrosion; the higher wear measured for the additive-containing sebacate was due to an oxygen interaction. The AES of dibutyl sebacate surfaces run in dry air and in dry nitrogen showed large differences only in the amount of oxygen present. The AES of worn surfaces where the additive was effective showed no zinc, only a little phosphorus, and large amounts of sulfur.

Brainard, W. A.↗

NASA NTRS1980

Cosmic ray production curves below reworking zones

A method is presented for calculating cosmic ray production profiles below reworking zones. The method uses an input reworking depth determined from data such as signatures in the depth profile of ferromagnetic resonance intensity and input cosmic ray production profiles for an undisturbed surface. Reworking histories are simulated using Monte Carlo techniques, and depth profiles are used to determine cosmic ray exposure age limits with a specified probability. It is shown that the track density profiles predict cosmic ray exposure ages in lunar cores that are consistent with values determined by other methods. Results applied to neutron fluence and spallation rare gases eliminate the use of reworking depth as an adjustable parameter and give cosmic ray exposure ages that are compatible with each other.

Blanford, G. E.↗

NASA NTRS1981

Chemical composition of the SiO2/InSb interface as determined by X-ray photoelectron spectroscopy

In connection with the relatively poor insulating characteristics of the native oxides of most III-V compound semiconductors, there has been interest in the development of deposited dielectric layers for surface passivation and MOS device fabrication on III-V compound semiconductor substrates. The chemical system of SiO2 deposited on single-crystal InSb substrates has been proposed for the fabrication of IR CCD. The considered investigation is concerned with a detailed examination of the chemical nature of the interactions between deposited and native oxides using X-ray photoelectron spectroscopy (XPS) in conjunction with a chemical-etching technique for depth profiling. The compositional structure of the interfaces obtained in the SiO2/native oxide/InSb system is derived on the basis of an intensity analysis of XPS spectra. Thermal oxidation of the InSb substrate is found to result in an In-rich native oxide and excess elemental Sb at the native oxide/substrate interface.

Vasquez, R. P.↗

NASA NTRS1981

XPS study of interface formation of CVD SiO2 on InSb

The interfacial chemistry of CVD SiO2 films deposited on thin native oxides grown on InSb substrates is examined using X-ray photoemission spectroscopy (XPS) and a relatively benign chemical etching technique for depth profiling. An intensity analysis of XPS spectra is used to derive the compositional structure of the interfaces obtained in the SiO2/native oxide/InSb system. Peak positions in these spectra are used to follow the change in substrate surface potential during the etch sequence, and to establish the chemical nature of the species formed during deposition and subsequent processing. Reaction of the substrate with oxygen resulted in an In-rich native oxide and 1-2 monolayers of excess elemental Sb at the native-oxide/substrate interface, incompletely oxidized silane reduced the native oxide, leaving less than 1 monolayer of elemental In at the SiO2/native oxide interface. Etch removal of this thin In-rich layer leads to a change in the substrate surface potential of 0.06 eV, corresponding to a net increase in positive charge. The results are consistent with simple thermodynamic considerations; they are also compared to previously reported studies of deposited dielectrics on III-V compound semiconductors.

Vasquez, R. P.↗

NASA NTRS2005

X-Ray Fluorescence Solvent Detection at the Substrate-Adhesive Interface

With environmental regulations limiting the use of volatile organic compounds, low-vapor pressure solvents have replaced traditional degreasing solvents for bond substrate preparation. When used to clean and prepare porous bond substrates such as phenolic composites, low vapor pressure solvents can penetrate deep into substrate pore networks and remain there for extended periods. Trapped solvents can interact with applied adhesives either prior to or during cure, potentially compromising bond properties. Currently, methods for characterizing solvent time-depth profiles in bond substrates are limited to bulk gravimetric or sectioning techniques. While sectioning techniques such as microtome allow construction of solvent depth profiles, their depth resolution and reliability are limited by substrate type. Sectioning techniques are particularly limited near the adhesive-substrate interface where depth resolution is further limited by adhesive-substrate hardness and, in the case of a partially cured adhesive, mechanical properties differences. Additionally, sectioning techniques cannot provide information about lateral solvent diffusion. Cross-section component mapping is an alternative method for measuring solvent migration in porous substrates that eliminates the issues associated with sectioning techniques. With cross-section mapping, the solvent-wiped substrate is sectioned perpendicular rather than parallel to the wiped surface, and the sectioned surface is analyzed for the solvent or solvent components of interest using a two-dimensional mapping or imaging technique. Solvent mapping can be performed using either direct or indirect methods. With a direct method, one or more solvent components are mapped using red or Raman spectroscopy together with a moveable sample stage and/or focal plane array detector. With an indirect method, an elemental "tag" not present in the substrate is added to the solvent before the substrate is wiped. Following cross sectioning, the tag element can then be mapped by its characteristic x-ray emission using either x-ray fluorescence, or electron-beam energy-and wavelength-dispersive x-ray spectrometry. The direct mapping techniques avoid issues of different diffusion or migration rates of solvents and elemental tags, while the indirect techniques avoid spectral resolution issues in cases where solvents and substrates have adjacent or overlapping peaks. In this study, cross-section component indirect mapping is being evaluated as a method for measuring migration of d-limonene based solvents in glass-cloth phenolic composite (GCP) prior to and during subsequent bonding and epoxy adhesive cure.

Wurth, Laura↗

NASA NTRS1989

Mechanical and SEM analysis of artificial comet nucleus samples

Since 1987 experiments dealing with comet nucleus phenomena have been carried out in the DFVLR space simulation chambers. The main objective of these experiments is a better understanding of thermal behavior, surface phenomena and especially the gas dust interaction. As a function of different sample compositions and exposure to solar irradiation (xenon-bulbs) crusts of different hardness and thickness were measured. The measuring device consists of a motor driven pressure foot (5 mm diameter), which is pressed into the sample. The applied compressive force is electronically monitored. The microstructure of the crust and dust residuals is investigated by scanning electron microscopy (SEM) techniques. Stress-depth profiles of an unirradiated and an irradiated model comet are given.

Thiel, K.↗

NASA NTRS1973

Solar flare proton spectrum averaged over the last 5000 years

The solar flare differential energy spectrum and integral proton flux above 10 MeV averaged over the last several thousand years are derived from thermoluminescence (TL) data. The dose-rate depth profile is obtained using a new TL equilibrium technique which is independent of the TL decay kinetics. The dose-rate depth profile produced by solar flare protons with a differential energy spectrum of the form dJ/dE = KE to the minus gamma power is calculated for arbitrary gamma. The best fit to the TL data in rock 14310 is obtained for gamma = 2.3 plus or minus 0.2 and an omnidirectional (4 pi) integral flux above 10 MeV of 40 to 80 prot/sq cm/sec. The TL half-life is determined to be 2000 yr. These results are compared to those for Na-22 (half-life of. 2.6 yr) and Al-26 (half-life of 740,000 yr) obtained by Wahlen et al. (1972) and Rancitelli et al. (1972), and it is concluded that the spectral shape and flux of protons in the interval from 25 to 100 MeV is the same within experimental errors when averaged over these three very different time periods.

Hoyt, H. P., Jr.↗

NASA NTRS1990

High spatial resolution mapping of the Cepheus A region at 20, 50, and 100 microns

The Cepheus A region at 20 microns has been mapped, and a bright, unresolved central source with a peak flux of 41 Jy into a 4.0 arcsec x 4.3 arcsec beam has been detected. One-dimensional slit scans have been obtained in two perpendicular directions across Cepheus A at 50 and 100 microns using a high spatial-resolution sampling technique. The temperature and optical depth profile of the far-IR emission are determined, and a peak temperature of 46 K and peak 100 micron optical depth of 0.4 are derived. Maximum entropy deconvolution of the far-IR scans indicate that there is a bright central core with clumpy extended emission. Within errors the position of the 50/100 micron peak is the same as the 20-micron source; this is interpreted as indicating that the 20 micron radiation represents the short-wavelength emission from the core of the dust cloud seen in the far-IR. It is concluded that an embedded source provides the major source of luminosity in the Cepheus A region.

Ellis, H. B., Jr.↗

NASA NTRS1998

Aerosol analysis techniques and results from micro pulse lidar

The effect of clouds and aerosol on the atmospheric energy balance is a key global change problem. Full knowledge of aerosol distributions is difficult to obtain by passive sensing alone. Aerosol and cloud retrievals in several important areas can be significantly improved with active remote sensing by lidar. Micro Pulse Lidar (MPL) is an aerosol and cloud profilometer that provides a detailed picture of the vertical structure of boundary layer and elevated dust or smoke plume aerosols. MPL is a compact, fully eyesafe, ground-based, zenith pointing instrument capable of full-time, long-term unattended operation at 523 nm. In October of 1993, MPL began taking full-time measurements for the Atmospheric Radiation Measurement (ARM) program at its Southern Great Plains (SGP) site and has since expanded to ARM sites in the Tropical West Pacific (TWP) and the North Slope of Alaska (NSA). Other MPL's are moving out to some of the 60 world-wide Aerosol Robotic Network (AERONET) sites which are already equipped with automatic sun-sky scanning spectral radiometers providing total column optical depth measurements. Twelve additional MPL's have been purchased by NASA to add to the aerosol and cloud database of the EOS ground validation network. The original MPL vertical resolution was 300 meters but the newer versions have a vertical resolution of 30 meters. These expanding data sets offer a significant new resource for atmospheric radiation analysis. Under the direction of Jim Spinhirne, the MPL analysis team at NASA/GSFC has developed instrument correction and backscatter analysis techniques for ARM to detect cloud boundaries and analyze vertical aerosol structures. A summary of MPL applications is found in Hlavka (1997). With the aid of independent total column optical depth instruments such as the Multifilter Rotating Shadowband Radiometer (MFRSR) at the ARM sites or sun photometers at the AERONET sites, the MPL data can be calibrated, and time-resolved vertical profiles of aerosol optical depth as well as aerosol extinction can be calculated. The techniques used to calibrate the lidar, calculate the aerosol extinction-to-backscatter ratio, and produce profiles of aerosol extinction and aerosol optical depths, will be described. Results using these techniques will be presented for case studies at the ARM site in the Tropical West Pacific and later in the Southern Great Plains.

Hlavka, Dennis L.↗

NASA NTRSDate not supplied

Airborne Lidar Measurements of Ozone and Aerosol Profiles Over Major US Metropolitan Areas

During field missions in 2021 and 2023, the airborne NASA Langley Research Center High Spectral Resolution Lidar 2 (HSRL 2) measured the temporal and spatial evolution of ozone and aerosol distributions impacting urban air quality over the four most populated cities in the United States. HSRL-2 measurements in 2021 were acquired over the Houston metropolitan region, including Galveston Bay and the Houston Ship Channel, as part of the NASA Tracking Aerosol Convection Experiment – Air Quality (TRACER-AQ) mission conducted in collaboration with the Department of Energy. HSRL-2 measurements were acquired over Los Angeles, Chicago, and New York City in 2023 as part of the NASA Synergistic TEMPO Air Quality Science (STAQS) mission conducted in collaboration with the NOAA Atmospheric Emissions and Reactions Observed from Megacities to Marine Areas (AEROMMA) mission. HSRL 2 provided nadir vertical profiles of ozone, aerosol backscatter, extinction, and depolarization as the aircraft flew lawnmower type patterns at 9 km for several hours over these urban areas. HSRL-2 measured profiles of aerosol extinction and aerosol optical depth (AOD) via the HSRL technique at 355 and 532 nm and profiles of aerosol backscatter and depolarization at 355, 532, and 1064 nm. Mixed Layer Heights (MLH) were derived by locating sharp vertical gradients in the profiles of aerosol backscatter. The flights were comprised of up to three repeating lawnmower patterns over each city showing the evolution of the ozone and aerosol distributions from the morning through the afternoon. The HSRL-2 measurements reveal ozone enhancements near the surface as well as in the free troposphere above the mixed layer. Some lidar measurements over Chicago and New York City show the daytime boundary layer growing into elevated layers of biomass burning aerosol. These layers complicate efforts to use column-integrated satellite measurements to infer surface air quality. As expected, mixed layer height (MLH) typically increased significantly during the day; however, during some flights, particularly over the Houston area, MLH also showed large spatial variability associated with changes in surface cover and/or small scale circulations. Often HSRL-2 measurements of AOD also showed large spatial and temporal variability throughout the day over these cities. We discuss how the ozone and aerosol profiles are averaged over different vertical and horizontal scales near the surface for use in assessments of regional air quality models and near-surface ozone retrievals from NASA’s recently launched Tropospheric Emissions: Monitoring Pollution (TEMPO) satellite.

Lidar↗

NASA NTRSDate not supplied

HSRL-2 Observations over the Houston, TX Region during TRACER-AQ

Lidar↗

NASA NTRS2002

Characterization of Space Environmental Effects on Candidate Solar Sail Material

The National Aeronautics and Space Administration's (NASA) Marshall Space Flight Center (MSFC) is concentrating research into the utilization of photonic materials for spacecraft propulsion. Spacecraft propulsion, using photonic materials, will be achieved using a solar sail. A solar sail operates on the principle that photons, originating from the sun, impart pressure to the sail and therefore provide a source for spacecraft propulsion. The pressure imparted to a solar sail can be increased, up to a factor of two if the sunfacing surface is perfectly reflective. Therefore, these solar sails are generally composed of a highly reflective metallic sun-facing layer, a thin polymeric substrate and occasionally a highly emissive back surface. The Space Environmental Effects Team, at MSFC, is actively characterizing candidate solar sail material to evaluate the thermo-optical and mechanical properties after exposure to radiation environments simulating orbital environments. This paper describes the results of three candidate materials after exposure to a simulated Geosynchronous Transfer Orbit (GTO). This is the first known characterization of solar sail material exposed to space simulated radiation environments. The technique of radiation dose versus material depth profiling was used to determine the orbital equivalent exposure doses. The solar sail exposure procedures and results of the material characterization will be discussed.

Edwards, David↗

NASA NTRS2002

Characterization of Space Environmental Effects on Candidate Solar Sail Material

The National Aeronautics and Space Administration's (NASA) Marshall Space Flight Center (MSFC) is concentrating research into the utilization of photonic materials for spacecraft propulsion. Spacecraft propulsion, using photonic materials, will be achieved using a solar sail. A sail operates on the principle that photons, originating from the sun, impart pressure and provide a source of spacecraft propulsion. The pressure can be increased, by a factor of two if the sun-facing surface is perfectly reflective. Solar sails are generally composed of a highly reflective metallic front layer, a thin polymeric substrate, and occasionally a highly emissive back surface. The Space Environmental Effects Team at MSFC is actively characterizing candidate solar sail materials to evaluate the thermo-optical and mechanical properties after exposure to a simulated Geosynchronous Transfer Orbit (GTO) radiation environment. The technique of radiation dose verses material depth profiling was used to determine the orbital equivalent exposure doses. The solar sail exposure procedures and results of the material characterization will be discussed.

Edwards, David↗

NASA NTRSDate not supplied

Evaluating Combined Lidar and Polarimeter Measurements of Cloud Top Parameters (Extinction, Scattering Cross Sections, and Droplet Number Density, Liquid Water Content)

We present a new method to derive profiles of extinction from a lidar which is then combined with polarimeter measurements to derive cloud droplet number density (CDNC) in the tops of warm clouds. The method employs polarization-sensitive elastic backscatter lidar measurements to estimate attenuation of the lidar signal within the cloud and polarimeter estimates of cloud droplet size distributions. The measurements used for this demonstration are from NASA Langley Research Center’s High Spectral Resolution Lidar – Generation 2 (HSRL-2) and NASA GISS’s Research Scanning Polarimeter (RSP). The measurements were acquired on NASA’s ACTIVATE mission, during which the instruments were deployed in a down-looking mode from a high-altitude aircraft, which flew in coordination with a low-flying aircraft acquiring coincident in situ measurements of cloud droplet size and number. The high vertical (1.25 m) and horizontal (~50 m) sampling resolution of the HSRL-2 data enabled retrievals of single-scattering extinction profiles to within ~2.5 optical depths of cloud top. Another key feature of the method was the well-calibrated measurement of backscatter at cloud top due to using the HSRL technique. The RSP retrievals of cloud droplet effective radius and variance were accomplished using the “cloud-bow” technique. Overall, the technique provides extinction profile estimates for the top 2.5 optical depths of water clouds that can be used to estimate the cloud droplet number density in various types of warm clouds. The mean extinction values at cloud top (0-1 optical depth) are compared against cloud drop size and number concentration acquired from wing-mounted probes (e.g., DMT Cloud Droplet Probe - CDP, SPEC Fast Cloud Droplet Probe FCDP, and SPEC 2D Stereo Probe - 2DS) that were deployed on the low-flying aircraft. Comparisons between the effective radius and variance from the polarimeter, lidar ratio (extinction to backscatter) from the lidar and polarimeter, and LWC are also presented. All measurements were acquired over the Western North Atlantic over 3 years from 2020 to 2022.

lidar↗

NASA NTRS1993

Depth-diameter ratios for Martian impact craters: Implications for target properties and episodes of degradation

This study determines crater depth through use of photoclinometric profiles. Random checks of the photoclinometric results are performed using shadow estimation techniques. The images are Viking Orbiter digital format frames; in cases where the digital image is unusable for photoclinometric analysis, shadow estimation is used to determine crater depths. The two techniques provide depth results within 2 percent of each other. Crater diameters are obtained from the photoclinometric profiles and checked against the diameters measured from the hard-copy images using a digitizer. All images used in this analysis are of approximately 40 m/pixel resolution. The sites that have been analyzed to date include areas within Arabia, Maja Valles, Memnonia, Acidalia, and Elysium. Only results for simple craters (craters less than 5 km in diameter) are discussed here because of the low numbers of complex craters presently measured in the analysis. General results indicate that impact craters are deeper than average. A single d/D relationship for fresh impact craters on Mars does not exist due to changes in target properties across the planet's surface. Within regions where target properties are approximately constant, however, d/D ratios for fresh craters can be determined. In these regions, the d/D ratios of nonpristine craters can be compared with the fresh crater d/D relationship to obtain information on relative degrees of crater degradation. This technique reveals that regional episodes of enhanced degradation have occurred. However, the lack of statistically reliable size-frequency distribution data prevents comparison of the relative ages of these events between different regions, and thus determination of a large-scale episode (or perhaps several episodes) cannot be made at this time.

Barlow, N. G.↗

NASA NTRS1972

Profiling with the electron microscope.

Discussion of a profiling technique using a scanning electron microscope for obtaining depth information on a single micrograph of a small specimen. A stationary electron beam is used to form a series of contamination spots in a line across the specimen. Micrographs obtained by this technique are useful as a means of projection and display where stereo viewers are not practical.

Vedder, J. F.↗