DOE OSTI2022
The market share for bifacial modules is projected to be doubled from 30% to 60% in the next ten years. For the monofacial crystalline silicon glass/backsheet (G/B) modules, extensive reliability data has been available for over 40 years. However, practically little/no long-term field or accelerated reliability test data is available for the new generation glass/glass (G/G) bifacial modules and glass/transparent (G/T) bifacial modules. Therefore, the primary motivation of this project was to identify the reliability strengths and weaknesses of new generation G/G modules compared to G/B modules. In this 3-year project, the goal was to objectively recommend the best construction materials for the new generation G/G (bifacial) modules through a systematic experimental approach with appropriate tasks including: Evaluation of field retrieved old-generation G/G modules; Inspection of new-generation G/G modules installed in the plants; Evaluation of new-generation G/G, G/B and G/T modules using EAST (Extended Accelerated Stress Testing), CAST (Combined Accelerated Stress Testing) and FAST (Field Accelerated Stress Testing); and, dynamic literature search and review. Major accomplishments and outcomes of this project are: Accomplishments: Evaluated more than 60 field retrieved modules and constructed and characterized more than 135 mini-modules with three substrate types (G, B, and T), two encapsulant types (EVA and POE), and two cell types (monofacial and bifacial) as well as evaluated more than 30 commercial G/G and G/B modules; Subjected all the modules to multitude characterization tests and various indoor and outdoor accelerated stress tests including FAST (Field Accelerated Stress Testing), EAST (Extended Accelerated Stress Testing), and CAST (Combined Accelerated Stress Testing) to identify and correlate the failure modes in both field and lab tests. Outcomes: Based on the accelerated test results and handling/mounting experience obtained in this project, the recommended best construction for the glass/glass modules is: “Framed GG modules with cut-cells and POE encapsulant (UVpass front; UVpass back).” However, from a statistical and manufacturing point of view (along with stakeholders surveys), the following cautionary notes are added to the above-mentioned recommendation: (i) Cut cells could introduce a higher level of manufacturing issues, including a higher number of cell interconnects; (ii) POE encapsulant is more expensive than EVA and could present a delamination risk and lower throughput during manufacturing due to lower adhesion strength. Other encapsulants, such as coextruded EPE (EVA/POE/EVA), are also recommended to be investigated. The potential public benefit of the proposed project is to present the strengths and weaknesses of glass/glass modules, so an informed procurement decision can be made.