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Radioactive tracer technique to measure yield and angular distribution of copper sputtered from monocystalline target subject to cesium ion bombardment
Radioactive tracer technique to measure yield and angular distribution of copper sputtered from monocrystalline target subject to cesium ion bombardment
Yield and angular distribution of cesium ion- sputtered copper, noting dependence on angle of incidence, target temperature and energy
Radioactive tracer technique to measure yield and angular distribution of cesium ion sputtered copper
It has been demonstrated that the suppression of secondary electron emission significantly improves the performance of electron beam collectors (ref. 1). However, a complete analysis of the effects of secondary electron emission with respect to collector performance has not been possible because of the lack of quantitative data on angular distributions of secondary electrons. Secondary electrons are emitted with energies ranging from near zero to the energy of the incident primary. For our purposes, we define elastically scattered electrons as secondary electrons within 20 percent of the incident energy. Elastically scattered electrons are of great concern because their energy allows them to follow trajectories that can carry them almost anywhere within the vacuum envelope. If these secondaries leave the collector and reenter the slow wave circuit, they can produce undesired signal distortion and oscillation.This apparatus, which was built by Krainsky (ref. 2), was used at the NASA Lewis Research Center to obtain detailed measurements of the angular distributions of elastically scattered secondaries. Data were obtained for three surfaces of significant interest to collector applications: highly polished copper, copper roughened by ion sputtering, and isotropic graphite. Lewis researchers discovered that elastically scattered electrons have a complex angular distribution that is strongly dependent on the atomic number and surface morphology of the target material, as well as the energy and angle of incidence of the primary beam. At low energies, secondary emission from polished copper in the chosen energy range is primarily directed back to the source of primary electrons (backscattering). Forward scattering increases with primary energy until, at high energies, forward scattering dominates the angular distribution. Although back-scattered secondaries dominate the distributions of the textured copper surface, the yield is substantially lower. From the standpoint of secondary emission, isotropic graphite is the most attractive material because it exhibits low yield and little back scattering.
Spectrometric determination of angular distributions and energy spectra of electrons transmitted through and reflected from carbon, aluminum, copper, silver, and gold foils
Cu single crystal sputtering yield and angular distribution for bombardment by Ar ions
Particle accelerator radiation measurements are applied to the problem of calculating biological dose from radiation produced in the walls of a spacecraft by various ions in space. Neutrons, one of the products of the interactions of energetic ions with matter, are usually quite penetrating and have large values of Q.F. or R.B.E. Ions of helium, boron, carbon, nitrogen, and oxygen were accelerated and directed onto target materials of copper or tantalum. The secondary neutron production was determined. Studies were made of the angular distribution and an inferred neutron spectrum was calculated from activities of threshold reaction detectors.
Beams of 42-MeV alpha particles were elastically and inelastically scattered from Cu-65 in an attempt to excite states which may be described in terms of an excited core model. Angular distributions were measured for 17 excited states. Seven of the excited states had angular distributions similar to a core quadrupole excitation and eight of the excited states had angular distributions similar to a core octupole excitation. The excited state at 2.858 MeV had an angular distribution which suggests that it may have results from the particle coupling to a two-phonon core state. An extended particle-core coupling calculation was performed and the predicted energy levels and reduced transition probabilities compared to the experimental data. The low lying levels are described quite well and the wavefunctions of these states explain the large spectroscopic factors measured in stripping reactions. For Cu-65 the coupling of the particle to the core is no larger weak as in the simpler model, and configuration mixing results.
The plastic flow field in the vicinity of the pin-tool during Friction Stir Welding (FSW) needs to be understood if a theoretical understanding of the process is to be attained. The structure of welds does not exhibit the flow field itself, but consists in a residue of displacements left by the plastic flow field. The residue requires analysis to extract from it the instantaneous flow field around the pin-tool. A simplified merry-go-round model makes sense of some tracer experiments reported in the literature. A quantitative comparison is made of the displacements of copper wire markers with displacements computed from a hypothetical plastic flow field. The hypothetical plastic flow field consists in a circular rotation field about a translating pin tool with angular velocity varying with radius from the pin centerline. A sharply localized rotational field comprising slip on a surface around the tool agreed better with observations than a distributed slip field occupying a substantial volume around the tool. Both the tracer and the wire displacements support the "rotating plug" model, originally invoked or thermal reasons, of the FSW process.