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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Comparison of high temperature storage bake and operating burn-in as screening techniques for semiconductor devices used in Nimbus satellite
Boiling refrigerant provides simple temperature control for newly manufactured power transistors. Heat-transfer liquid is Fluorinert FC-77 (or equivalent). Liquid boils at 100 degrees C, which is specified temperature at which transistor cases should be maintained during burn-in with this technique.
Statistical estimation procedures for identifying and eliminating poor quality or defective items
Data accumulated during 4 years of research and evaluation of ceramic chip capacitors, ceramic carrier mounted active devices, beam-lead transistors, and chip resistors are presented. Life and temperature coefficient test data, and optical and scanning electron microscope photographs of device failures are presented and the failure modes are described. Particular interest is given to discrete component qualification, power burn-in, and procedures for testing and screening discrete components. Burn-in requirements and test data will be given in support of 100 percent burn-in policy on all NASA flight programs.
Terminal burn-in or baking step time in the processing of planar silicon devices is extended to reduce their inversion tendencies. The collector-base junction of the device is also cyclically biased during the burn-in.
Flight specifications effects on failure rates of semiconductor parts in Apollo Guidance Computer, detailing procurement, screen, burn-in and field history
Tests were conducted on 20-Ah sealed nickel cadmium cells to evaluate initial and long-term performance at various charge rates, temperatures and voltage-control levels. An average ampere-hour recharge of 103 percent per orbit at 13 C was able to maintain cell capacity; required watt-hour recharge on an orbital basis was 8 to 10 percent greater than required ampere-hour recharge. Cells exhibited an early life burn-in characteristic. A discharge after periods of repetitive cycling yielded two voltage plateaus which were temporarily eliminated by the discharge.
Quality, reliability, and design standards for microwave hybrid microcircuits were established. The MSFC Standard 85M03926 for hybrid microcircuits was reviewed and modifications were generated for use with microwave hybrid microcircuits. The results for reliability tests of microwave thin film capacitors, transistors, and microwave circuits are presented. Twenty-two microwave receivers were tested for 13,500 unit hours. The result of 111,121 module burn-in and operating hours for an integrated solid state transceiver module is reported.
The guidelines for selecting hardware to be used in manned spacecraft to obtain a five year operational lifetime without maintenance were developed. An analysis was conducted on the design, application, failure mechanisms, manufacturing processes and controls, screen and burn-in techniques, and quality control of hardware items. The equipment considered for evaluation include: (1) electric motors and bearings; (2) accelerometers; (3) gyroscopes and bearings; (4) compressors and pumps, (5) magnetic tape recorders; (6) plumbing components and tubing; (7) check valves; (8) pressure regulators and solenoid valves; (9) thermal control valves; (10) pressure vessels and positive expulsion devices; (11) nickel cadmium batteries; and (12) transducers.
The design of a previously developed basic variable R load simulator was entended to increase its power dissipation and transient handling capabilities. The delivered units satisfy all design requirements, and provides for a high power, modular simulation capability uniquely suited to the simulation of complex load responses. In addition to presenting conclusions and recommendations and pertinent background information, the report covers program accomplishments; describes the simulator basic circuits, transfer characteristic, protective features, assembly, and specifications; indicates the results of simulator evaluation, including burn-in and acceptance testing; provides acceptance test data; and summarizes the monthly progress reports.
This paper describes the design and development of a set of multifunction VHF/UHF integrated circuits aimed at providing a major improvement in spacecraft radio reliability through low stress operation and the processing of these circuits in beam-lead form. The methods evolved for the high frequency characterization of the devices are discussed together with the design of suitable test fixtures. Typical test results and the distribution of test parameters are presented. A unique carrier for beam-lead devices is described, and the need for such a device is discussed. The application of the carrier to device screening, burn-in and drift measurements is discussed together with the incentives for providing these capabilities. An overview of the integration of the devices into the spacecraft radio is given and candidate assembly processes are discussed. The technology impact of this approach upon future spacecraft radio systems is qualitatively examined.
A description is presented of a test program which has shown that well-constructed bubble memories can operate reliably over long periods of time and at low error rates. Even the relatively high error rate of one memory during burn-in can be considered acceptable if compared with tape recorder standards. No wear-out mechanism or aging could be detected. Bubble memories are now considered suitable for long-duration space missions and certainly are suitable for many military and commercial applications. It must be recognized, however, that bubble memories are complex devices and not yet fully understood. While the particular memory tested may never find practical applications, it nevertheless has provided insight into performance characteristics considered typical of bubble memories.
Twenty-five Hughes HCMP 1852D and 25 RCA CDP1852D 8-bit, CMOS, I/O port microcircuits underwent electrical characterization tests. All electrical measurements were performed on a Tektronix S-3260 Test System. Before electrical testing, the devices were subjected to a 168-hour burn-in at 125 C with the inputs biased at 10V. Four of the Hughes parts became inoperable during testing. They exhibited functional failures and out-of-range parametric measurements after a few runs of the test program.
The premission failure of a Voyager spacecraft capacitor has prompted an investigation into the use of polycarbonate capacitors in high impedance circuits, during which capacitor failures were induced by thermal cycling together with extended periods at high temperature. Measurement of leakage path temperature coefficients indicates that there are two distinct leakage types whose mechanisms are complicated by movement within the capacitor during temperature changes. A novel system for pulse detection during capacitor burn-in and ramp testing has proven to be beneficial.
A low power, dc arcjet thruster was tested for starting reliability using hydrogen-nitrogen mixtures simulating the decomposition products of hydrazine. More than 300 starts were accumulated in phases with extended burn-in periods interlaced. A high degree of flow stabilization was built into the arcjet and the power supply incorporated both rapid current regulation and a high voltage, pulsed starting circuit. A nominal current level of 10 A was maintained throughout the test. Photomicrographs of the cathode tip showed a rapid recession to a steady-state operating geometry. A target of 300 starts was selected, as this represents significantly more than anticipated (150 to 240), in missions of 10 yr or less duration. Weighings showed no apparent mass loss. Some anode erosion was observed, particularly at the entrance to the constrictor. This was attributed to the brief period during startup the arc mode attachment point spends in the high pressure region upstream of the nozzle. Based on the results obtained, startup does not appear to be performance or life limiting for the number of starts typical of operational satellite applications.
A low power, dc arcjet thruster was tested for starting reliability using hydrogen-nitrogen mixtures simulating the decomposition products of hydrazine. More than 300 starts were accumulated in phases with extended burn-in periods interlaced. A high degree of flow stabilization was built into the arcjet and the power supply incorporated both rapid current regulation and a high voltage, pulsed starting circuit. A nominal current level of 10 A was maintained throughout the test. Photomicrographs of the cathode tip showed a rapid recession to a steady-state operating geometry. A target of 300 starts was selected, as this represents significantly more than anticipated (150 to 240), in missions of 10 yr or less duration. Weighings showed no apparent mass loss. Some anode erosion was observed, particularly at the entrance to the constrictor. This was attributed to the brief period during startup the arc mode attachment point spends in the high pressure region upstream of the nozzle. Based on the results obtained, startup does not appear to be performance or life limiting for the number of starts typical of operational satellite applications.
The problem of the optimization of the design of real-time distributed systems is examined with reference to a class of computer architectures similar to the continuously reconfigurable multiprocessor flight control system structure, CM2FCS. Particular attention is given to the impact of processor replacement and the burn-in time on the probability of dynamic failure and mean cost. The solution is obtained numerically and interpreted in the context of real-time applications.
A cyclic lifetest of a low power dc arcjet thruster using a hydrogen/nitrogen propellant mixture simulating hydrazine is currently in progress. Over 300 hr of operation have been accumulated to date in 2 hr duty cycles at a power level of about 1.15 kW, approximating that available on commercial communications satellites. A burn-in period was carried out before consistent operation was attained. After this period, the arcjet operated in a very stable fashion from cycle to cycle. At the beginning of each cycle, there was a brief starting transient followed by a rapid rise to a steady-state voltage. The steady-state voltage increased by about 5 V over the first 95 cycles. After this, it increased by only 1 V through the remainder of the test. Thrust measurements taken before the life test and again after the completion of the 144th cycle showed that both thrust, specific impulse, and arc voltage had increased over this period of operation. No life limiting mechanisms were observed during the course of the testing.