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The abcd Reliability Growth Model

This paper presents a modification of the well-known Duane-Crow reliability growth model. In the abcd reliability growth model, the initial period of exponential decline of the failure rate in the Duane-Crow model may be followed by a period of constant failure rate. Data often show that an exponential decline in failures is followed by a constant failure rate. If a growth model including only the initial period of exponential decline is applied to increasingly longer failure rate data sets, the data will include longer periods of constant failure rate, and the estimated reliability growth rate will decline from an initially high value down toward zero. Using the Duane-Crow model without extending it to include a possible period of constant failure rate may create the mistaken impression that the initial reliability growth continues forever, but at an ever decreasing rate.

Reliability growth

The abcd Reliability Growth Model

This paper presents a modification of the well-known Duane-Crow reliability growth model. In the abcd reliability growth model, the initial period of exponential decline of the failure rate in the Duane-Crow model may be followed by a period of constant failure rate. Data often show that an exponential decline in failures is followed by a constant failure rate. If a growth model including only the initial period of exponential decline is applied to increasingly longer failure rate data sets, the data will include longer periods of constant failure rate, and the estimated reliability growth rate will decline from an initially high value down toward zero. Using the Duane-Crow model without extending it to include a possible period of constant failure rate may create the mistaken impression that the initial reliability growth continues forever, but at an ever decreasing rate.

Reliability growth

A Misperception in Reliability Growth Modelling

The Duane reliability growth model is n(t)/t = k t^-alpha (1) The reliability growth rate is alpha, the downward slope of n(t)/t versus t. It usually varies from 0.2 to 0.6. k is a constant. Crow used a 56-failure data set to illustrate reliability growth.1 A graphical Duane model fit to this data gives n(t)/t = 0.640 t^-0.283 (2) A problem in using the Duane-Crow reliability growth model is that it assumes that reliability growth continues and the failure rate decreases throughout the test period. It is more usual that reliability growth stops when the failure rated is low enough. Growth testing is often followed by testing with a low constant failure rate due to rare or uncorrectable failure modes. As more and more low constant rate acceptable failures accumulate after the period of reliability growth, the reliability growth time exponent alpha decreases toward zero. This occurs if constant rate failures are treated as occurring during the reliability growth period. It is more accurate to model a period of initial reliability growth followed by testing without repair to more accurately determine the final constant failure rate. This is done in the abcd model. n(t)/t = a t^-b + c from t = 0 to td (3) = c + d after td, where d = a td^-b (4) The term a t^-b describes the continuous reliability growth that continues out to time td and c is the constant uncorrected failure rate. The parameter d represents an additional constant failure rate due to correctable but uncorrected failure modes. After the reliability growth process is terminated, the failure rate n(t)/t = c + d.

Harry W Jones

Gaussian Process Regression Method for Costing SmallSat Bus Capabilities

NASA is responding to the growing interest in, andcapabilities of, small satellites for science applications with an increasingnumber and frequency of Announcements of Opportunityfor small satellite space missions. Estimating the probabilitythat these mission concepts will fit within the small cost capsof these opportunities is largely driven by the probability thatone of the burgeoning number of small satellite providers will beable to meet the payload’s accommodation requirements withinthe budget for the spacecraft. JPL has collected a databasecontaining technical specifications and cost of commerciallyavailable Smallsat buses across various vendors. The primarypurpose of the database is for use in JPL’s Team X architecturestudies to inform cost estimates of a spacecraft bus which fitsthe customer’s technical requirements for their payload andmission. Customer needs are often unique and don’t alignperfectly with an off-the-shelf commercial spacecraft bus, whichmotivates the need to develop a cost model across the continuoustechnical parameter space.Al’s Bus Cost Distribution Estimator (ABCDE) uses Gaussianprocess regression (GPR) to predict commercial Smallsat spacecraftbus cost based on a subset of a customer’s technicalrequirements (payload mass, payload power, delta V, pointingcontrol, and downlink rate). GPR is implemented in ABCDE asa Bayesian method which fits an implied multivariate regressionon the technical parameters and uses kriging to intentionally“overfit” the residuals. Overfitting the residuals allows costestimates to collapse in uncertainty closer to the data pointswhile maintaining larger uncertainty intervals in regions of parameterspace with fewer data records. The data used to fit thismodel is sensitive and represents cost estimates for off-the-shelfcommercial buses. GPR simultaneously protects the sensitivityof the database and uses the sparse nature of the database toaccount for uncertainty in cost in a useful way. For a givenset of customer technical requirements, the tool provides a costestimate distribution, the percentiles of which can be interpretedas a confidence level of finding a commercial bus under a specifiedcost cap. ABCDE dramatically pushes the boundaries ofspacecraft cost estimation models due to its Bayesian methodology(accounting for the maximum uncertainty in the underlyingregression), the mathematically advanced kriging methodology,and the novelty of its application in Team X architecture tradestudies.

Austin, Alex