The determination of thermal diffusivities of thermal energy storage materials. I.
Thermal diffusivities of thermal energy storage materials from solid surface temperature measurements, discussing advantages of transient method
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Thermal diffusivities of thermal energy storage materials from solid surface temperature measurements, discussing advantages of transient method
Method for determining thermal diffusivity of thermal energy storage solid materials with high melting points
A field investigation using thermal remote sensing was performed to test the feasibility of detecting the surface topography of granite bedrock beneath a thin cover of alluvium. Imagery of a region of the Mojave Desert were taken with an airborne multispectral scanner with thermal spectral bandwidths of 10.4 and 12.5 microns an instantaneous field of view of 2.5 mrad. It is suggested that a buried high thermal diffusivity horizon measurably lowers the surface temperature of the overlying lower diffusivity material during the peak of the annual heating cycle.
Apollo 11 lunar specimen thermal diffusivity, conductivity and inertia in breccias and crystalline igneous rocks measured over wide temperature range
Minima and maxima in composition dependence of thermal diffusion factor and conductivity of gas mixtures
An inductive heating technique for making thermal diffusivity images of disbonds between thermal protective coatings and their substrates is presented. Any flaw in the bonding of the coating and the substrate shows as an area of lowered values in the diffusivity image. The benefits of the inductive heating approach lie in its ability to heat the conductive substrate without directly heating the dielectric coating. Results are provided for a series of samples with fabricated disbonds, for a range of coating thicknesses.
Thermal diffusivities of solid boron nitrate, and liquid sodium nitrate and lithium fluoride
Thermal diffusivity of molten and solid mercury cadmium telluride measured with aid of new apparatus. Knowledge gained from such measurements help efforts to grow high-quality single crystals of this semiconductor for use in infrared detectors: Without knowledge of thermal diffusivity, difficult to control growth rate of solid from molten material.
A novel pulsed dual-beam thermal lens technique for the determination of thermal diffusivity of liquids and solids was developed. In this technique a transient thermal lens is formed in the test specimen by using a dye laser pulse as a heating source and the thermal lens decay is monitored by means of a CW He-Ne laser. The technique is fast and contactless and avoids some of the major difficulties of conventional methods. Thermal diffusivities for water and a polycarbonate plastic were measured and found to be in agreement with literature values. Considerable simplification and minimization of certain errors was achieved by use of a reference material.
Knowledge of thermal diffusivity data for high-temperature materials (solids and liquids) is very important in analyzing a number of processes, among them solidification, crystal growth, and welding. However, reliable thermal diffusivity versus temperature data, particularly those for high-temperature liquids, are still far from complete. The main measurement difficulties are due to the presence of convection and the requirement for a container. Fortunately, the availability of levitation techniques has made it possible to solve the containment problem. Based on the feasibility of the levitation technology, a new laser flash technique which is applicable to both levitated liquid and solid samples is being developed. At this point, the analysis for solid samples is near completion and highlights of the technique are presented here. The levitated solid sample which is assumed to be a sphere is subjected to a very short burst of high power radiant energy. The temperature of the irradiated surface area is elevated and a transient heat transfer process takes place within the sample. This containerless process is a two-dimensional unsteady heat conduction problem. Due to the nonlinearity of the radiative plus convective boundary condition, an analytic solution cannot be obtained. Two options are available at this point. Firstly, the radiation boundary condition can be linearized, which then accommodates a closed-form analytic solution. Comparison of the analytic curves for the temperature rise at different points to the experimentally-measured values will then provide the thermal diffusivity values. Secondly, one may set up an inverse conduction problem whereby experimentally obtained surface temperature history is used as the boundary conditions. The thermal diffusivity can then be elevated by minimizing the difference between the real heat flux boundary condition (radiation plus convection) and the measurements. Status of an experimental study directed at measuring the thermal diffusivity of high-temperature solid samples of pure Nickel and Inconel 718 superalloys are presented. Preliminary measurements showing surface temperature histories are discussed.
Temperature rises of samples compared with reference sample. Apparatus quickly measures thermal diffusivities of ceramics at high temperatures. Produces data on relative thermal diffusivities of as many as six ceramic specimens per hour. Thermal-diffusivity tester makes it easy to determine thermal diffusivities of ceramics. Pronounced effects of processing parameters on thermal properties of ceramics evaluated quickly.
Thermal diffusion in topside ionosphere, stressing effect on ion density profiles
This report presents the status of current standard reference materials for thermal diffusivity testing. In most thermal properties testing systems, it is common to use standard reference materials to show the reproducibility of the tests and certify the instrument is producing results within expected uncertainty range. The definition of reference materials or standards vary depending on the quality control protocols of the project. For thermal diffusivity, although there were standards available by the National Bureau of Standards (NBS) 40 years ago, there has been no recent NIST standard reference material (SRM). There are only a few sources that produce and provide traceable reference standards for thermal diffusivity. The certificate typically expires in 5 years and only applies to the specific lot of materials. Other reference materials are provided by the testing systems manufacturers. They are mostly well-known reference materials or materials used by the equipment manufacturers with historic data. However, most these reference materials no longer carry valid certificates. Various reference materials will be discussed along with the industry practice when only secondary standards are available.
A laser pulse technique to measure the thermal diffusivity of diamond films deposited on a silicon substrate is developed. The effective thermal diffusivity of diamond film on silicon was measured by observing the phase and amplitude of the cyclic thermal waves generated by the laser pulses. An analytical model is developed to calculate the effective in-plane (face-parallel) diffusivity of a two layer system. The model is used to reduce the effective thermal diffusivity of the diamond/silicon sample to a value for the thermal diffusivity and conductivity of the diamond film. Phase and amplitude measurements give similar results. The thermal conductivity of the films is found to be better than that of type 1a natural diamond.
A new method for measuring the thermal diffusivity of materials at high temperatures is presented. The method is applicable to solids on Earth, and to liquids in the reduced gravity environment of space. It is especially suited to levitated liquid metals at elevated temperatures where thermal diffusivity data is not available. The method is applied in two parts, such that lumped analysis is valid in the first part, and Fourier's law of conduction is valid in the second. In both parts, the spherical specimen is assumed to have been heated to a desired temperature and cooled. An inverse conduction problem is then formulated and solved using Laplace transformation techniques. Using this solution, sample sizes, and experimentally obtained surface temperature history, the thermal diffusivity is determined by minimizing a function that satisifies the heat balance at the surface. Minimization is performed using a modified quasilinearization algorithm. Accuracy is very sensitive to error in the temperature data and increases with better curve fits to the temperature data. An error analysis is also performed, and the effect of errors in the various parameters on the evaluated thermal diffusivity is determined. An experimental study for solids on Earth is suggested, before development for implementation in space.
Improved data-acquisition and data-analysis system for thermal-diffusivity measurements using flash method incorporates digital oscilloscope and microcomputer for rapid reduction of experimental data. In thermal-diffusivity apparatus thin specimen heated on one face by pulsed xenon flashlamp, subsequent temperature rise on opposite face monitored by infrared detector. Thermal diffusivity estimated from thickness of specimen and from time after initial pulse during which temperature rise reaches half maximum value. Accuracy of estimate improved by correcting temperature measurements for radiative loss of heat from specimen and for finite duration and specific waveform of flashlamp pulse. System devised for use in high-temperature measurements of thermoelectric materials.
Polycrystalline diamond films were deposited using a microwave plasma-enhanced chemical vapor deposition process. A laser pulse technique was developed to measure the thermal diffusivity of diamond films deposited on a silicon substrate. The effective thermal diffusivity of a diamond film on silicon was measured by observing the phase and amplitude of the cyclic thermal waves generated by laser pulses. An analytical model is presented to calculate the effective in-plane (face-parallel) diffusivity of a two-layer system. The model is used to reduce the effective thermal diffusivity of the diamonds/silicon sample to a value for the thermal diffusivity and conductivity of the diamond film. The average effective diffusivity values are 1.47 + or - 0.03 and 1.83 + or - 0.10 yielding thermal diffusivity values of 7.46 + or - 0.90 and 7.33 + or - 0.70 sq cm/s respectively, for the two samples; the calculated thermal con ductivity values are 13.50 and 13.28 W/cmK, which are better than that of type 1a natural diamond. The phase and amplitude measurements give similar results.
A theory of the measurement of the thermal diffusivity of a sample by the modified Angstrom method is developed for the case in which radiative heat loss from the end surface of the sample is not negligible, and applied to measurements performed on lunar samples. Formulas allowing sample thermal diffusivity to be determined from the amplitude decay and phase lag of a temperature wave traveling through the sample are derived for a flat disk sample for which only heat loss from the end surface is important, and a sample of finite diameter and length for which heat loss through the end and side surfaces must be considered. It is noted that in the case of a flat disk, measurements at a single angular frequency of the temperature wave are sufficient, while the sample of finite diameter and length requires measurements at two discrete angular frequencies. Comparison of the values of the thermal diffusivities of two lunar samples of dimensions approximately 1 x 1 x 2 cm derived by the present methods and by the Angstrom theory for a finite bar reveals them to differ by not more than 5%, and indicates that more refined data are required as the measurement theory becomes more complicated.