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Results for “SOFT X RADIATION”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1994

Impulsive behavior in solar soft X-radiation

The Yohkoh soft X-ray telescope has observed impulsive, thermal, soft X-ray emission at the footpoints of magnetic loops during solar flares. The soft X-ray (thermal) time profiles at the footpoints closely match the hard X-ray (nonthermal) time profiles, directly demonstrating the heating of the lower solar atmosphere on short timescales during the interval of nonthermal energy release. This phenomenon is the rule, rather than the exception, occurring in the majority of flares that we have examined with the Yohkoh data. We illustrate the impulsive behavior with data from the major flare of 1992 January 26. For this flare, the soft X-ray peak times matched the hard X-ray peak times within the time resolution of the soft X-ray measurements (about 10 s), and the soft and hard X-ray locations match within the resolution of the hard X-ray imager. The impulsive soft X-ray emission clearly has a thermal spectral signature, but not at the high temperature of a 'superhot' source. We conclude that the impulsive soft X-ray emission comes from material heated by precipitating electrons at loop footpoints and evaporating from the deeper atmosphere into the flaring flux tube.

Hudson, H. S.↗
NASA NTRS1970

Solar soft X-radiation Final report

Relationships between solar soft X radiation and emissions at other wavelengths based on data from ion chamber phototometer aboard OSO-3

Thomas, R. J.↗
DOE OSTI2016

THE MULTI-WAVELENGTH CHARACTERISTICS OF THE TeV BINARY LS I+61°303

We study the characteristics of the TeV binary LS I+61°303 in radio, soft X-ray, hard X-ray, and gamma-ray (GeV and TeV) energies. The long-term variability characteristics are examined as a function of the phase of the binary period of 26.496 days as well as the phase of the superorbital period of 1626 days, dividing the observations into a matrix of 10 × 10 phases of these two periods. We find that the long-term variability can be described by a sine function of the superorbital period, with the phase and amplitude systematically varying with the binary period phase. We also find a definite wavelength-dependent change in this variability description. To understand the radiation mechanism, we define three states in the orbital/superorbital phase matrix and examine the wideband spectral energy distribution. The derived source parameters indicate that the emission geometry is dominated by a jet structure showing a systematic variation with the orbital/superorbital period. We suggest that LS I+61°303 is likely a microquasar with a steady jet.

79 ASTRONOMY AND ASTROPHYSICS↗
NASA NTRS1998

Ground Laboratory Soft X-Ray Durability Evaluation of Aluminized Teflon FEP Thermal Control Insulation

Metallized Teflon fluorinated ethylene propylene (FEP) thermal control insulation is mechanically degraded if exposed to a sufficient fluence of soft x-ray radiation. Soft x-ray photons (4-8 A in wavelength or 1.55 - 3.2 keV) emitted during solar flares have been proposed as a cause of mechanical properties degradation of aluminized Teflon FEP thermal control insulation on the Hubble Space Telescope (HST). Such degradation can be characterized by a reduction in elongation-to-failure of the Teflon FER Ground laboratory soft x-ray exposure tests of aluminized Teflon FEP were conducted to assess the degree of elongation degradation which would occur as a result of exposure to soft x-rays in the range of 3-10 keV. Tests results indicate that soft x-ray exposure in the 3-10 keV range, at mission fluence levels, does not alone cause the observed reduction in elongation of flight retrieved samples. The soft x-ray exposure facility design, mechanical properties degradation results and implications will be presented.

Banks, Bruce A.↗
NASA NTRS1998

Ground Laboratory Soft X-Ray Durability Evaluation of Aluminized Teflon FEP Thermal Control Insulation

Metallized Teflon fluorinated ethylene propylene (FEP) thermal control insulation is mechanically degraded if exposed to a sufficient fluence of soft x-ray radiation. Soft x-ray photons (4-8 A in wavelength or 1.55 - 3.2 keV) emitted during solar flares have been proposed as a cause of mechanical properties degradation of aluminized Teflon FEP thermal control insulation on the Hubble Space Telescope (HST). Such degradation can be characterized by a reduction in elongation-to-failure of the Teflon FEP. Ground laboratory soft x-ray exposure tests of aluminized Teflon FEP were conducted to assess the degree of elongation degradation which would occur as a result of exposure to soft x-rays in the range of 3-10 keV. Tests results indicate that soft x-ray exposure in the 3-10 keV range, at mission fluence levels, does not alone cause the observed reduction in elongation of flight retrieved samples. The soft x-ray exposure facility design, mechanical properties degradation results and implications will be presented.

Banks, Bruce A.↗
DOE OSTI2015

Diagnosing x-ray power and energy of tungsten wire array z-pinch with a flat spectral response x-ray diode

Fast z-pinch is a very efficient way of converting electromagnetic energy to radiation. With an 8-10 MA current on primary test stand facility, about 1 MJ electromagnetic energy is delivered to vacuum chamber, which heats z-pinch plasma to radiate soft x-ray. To develop a pulsed high power x-ray source, we studied the applicability of diagnosing x-ray power from tungsten wire array z-pinch with a flat spectral response x-ray diode (FSR-XRD). The detector was originally developed to diagnose radiation of a hohlraum in SG-III prototype laser facility. It utilized a gold cathode XRD and a specially configured compound gold filter to yield a nearly flat spectral response in photon energy range of 0.1-4 keV. In practice, it was critical to avoid surface contamination of gold cathode. It is illustrated that an exposure of an XRD to multiple shots caused a significant change of response. Thus, in diagnosing x-ray power and energy, we used each XRD in only one shot after calibration. In a shot serial, output of FSR-XRD was compared with output of a nickel bolometer. In these shots, the outputs agreed with each other within their uncertainties which were about 12% for FSR-XRD and about 15% for bolometer. Moreover, the ratios between the FSR-XRD and the bolometer among different shots were explored. In 8 shots, the standard deviation of the ratio was 6%. It is comparable to XRD response change of 7%.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2018

Aperiodic reflection diffraction gratings for soft X-ray radiation and their application

We briefly review the works concerned with the development and experimental use of the spectral instruments based on aperiodic reflection gratings whose spacing varies monotonically across the aperture according to a prescribed law (VLS gratings). The review considers the employment of VLS-grating instruments intended for the spectroscopy of laboratory and astrophysical plasmas, including the diagnostics of relativistic laser plasmas, for measuring X-ray laser linewidths, for recording the high-order harmonics of laser radiation, the radiation of fast electric discharges and other laboratory X-ray sources, as well as in reflectometry, X-ray fluorescence analysis and microscopy with the use of synchrotron radiation and laser-plasma radiation, and in emission spectroscopy combined with an electron microscope. Also discussed are achievements in the recently undertaken design and development of special-purpose VLS spectrometers intended for the investigation of the electronic structure of different materials and molecules by the spectroscopic technique of resonant inelastic X-ray scattering of synchrotron radiation. We describe flat-field grazing-incidence spectrometers with concave VLS gratings, which are compatible with modern CCD detectors, as well as plane VLS gratings, which are the key elements of scanning high- and ultrahigh-resolution spectrometers/monochromators with a constant deviation angle and stigmatic (imaging) spectrometers, which are also compatible with CCD detectors. (paper)

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
DOE OSTI2022

Spectral studies of soft x-ray radiation of laser-produced plasma of various target materials in a wide spectral range

Here, the work is devoted to experimental study of soft X-ray radiation spectra of laser produced plasma in a wide spectral range 5–100 Å at the “Kamerton” facility (GPI) with pulse duration 70 ps, pulse energy 1–5 J, wavelength 0.53 microns at which the laser intensity (power flux density) of 7×10 14 – 3.5×10 15 W/cm 2 was achieved. A spectrograph was used, which had transmission diffraction gratings with a ratio of the elementary gap to the period of the structure of 0.25 and 0.41. Detection was performed on both UV-4 X-ray photo film and Fuji TR fluorescent imaging plate. Solid samples from Al, Si, Ti, Cu, Ta and W were used as targets. The ionization states of the plasma corresponding to various electron temperatures were calculated, which made it possible to estimate the electron temperature by comparison these calculation results with the experimentally obtained spectra. The estimated electron temperature, which depends on the laser pulse energy and the target material, varied within the range of 100–450 eV. To verify the correctness of the temperature estimations obtained by such comparison a numerical simulation of plasma radiation was carried out by the use of PrismSPECT computer program. It was found that the results of this simulation are in a good agreement with estimations on the base of experimentally obtained spectra. The analysis of these spectra showed that tantalum, tungsten or titanium targets are the best candidates among the tested ones for the use of laser produced plasma as a radiation source in the "water window" spectral range (23–44 Å) for applications in biology and medicine.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
NASA NTRS1978

Annual Conference on Nuclear and Space Radiation Effects, 15th, University of New Mexico, Albuquerque, N. Mex., July 18-21, 1978, Proceedings

Radiation effects in MOS devices and circuits are considered along with radiation effects in materials, space radiation effects and spacecraft charging, SGEMP, IEMP, EMP, fabrication of radiation-hardened devices, radiation effects in bipolar devices and circuits, simulation, energy deposition, and dosimetry. Attention is given to the rapid anneal of radiation-induced silicon-sapphire interface charge trapping, cosmic ray induced errors in MOS memory cells, a simple model for predicting radiation effects in MOS devices, the response of MNOS capacitors to ionizing radiation at 80 K, trapping effects in irradiated and avalanche-injected MOS capacitors, inelastic interactions of electrons with polystyrene, the photoelectron spectral yields generated by monochromatic soft X radiation, and electron transport in reactor materials.

Simons, M.↗