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Results for “Resistivity measurements”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1989

Four-terminal connector for measuring resistance of a pyrotechnic initiator

A four-terminal electrical connector device (40) for testing and measuring unknown resistances of initiators (11) used for starting pyrotechnic events aboard a Space Transportation System. The testing device minimizes contact resistance degradation effects and so improves the reliability of resistance measurement taken with the device. Separate and independent voltage sensing (19) and current supply (20) circuits each includes a pair of socket contacts (13-16) for mating engagement with the pins (17,18) of the initiator. The unknown resistance that is measured by the device is the resistance of the bridgewire (23) of the initiator which is required to be between 0.95 and 1.15 ohms.

Robinson, Robert L.↗
NASA NTRS1970

A Study of the Electrotransport in Thin Films: An Advanced Method for the Study of Electrotransport in Thin Films Using Electrical Resistance Measurements

To date, very little is understood about electrotransport in thin films. One reason for this is the lack of methods in which electromigration can be adequately monitored dynamically. In this thesis, a new nondestructive method for the study of the electrotransport phenomenon in thin aluminum films is presented. This method makes use of electrical resistance measurements of various regions along the test sample to monitor changes in resistance resulting from electromigration. The advantage of this method is that resistance changes can be observed long before void formation can be seen using standard microscopy methods. In order to achieve the best efficiency using this method, special consideration must be given to the design of the sample. Design problems and their respective solutions are given. The results of the electrical resistance measurements are interpreted by means of photographs taken with an scanning electron microscope. The increase in resistance of the aluminum samples is interpreted to be due to void formation. The expected decrease in resistance near the anode was never observed. It is shown that mass accumulation takes on the form of hillocks and whiskers on the surface of the aluminum film, which does not contribute appreciably to conductivity.

Hummel, R. E.↗
NASA NTRS1976

Contactless method of measuring resistivity

A method is described for measuring the conductivity of materials without having to make electrical contact with the material. Currents which are magnetically induced in the conducting sample are measured by means of the magnetic fields they produce. Although induction techniques have been used in the past for this type of measurement, the configuration presented here makes it possible to perform absolute measurements of resistivity over a wide range of values for relatively small samples. The theory of the technique, the results of measurements made with it, and a comparison of the technique with other methods are presented.

Crowley, J. D.↗
NASA NTRS1986

Measuring Resistivities of Small Fibers

Technique for measuring electrical resistivities of fibers of graphite, silicon carbide/silicon nitride mixture, and other materials used in composites simple, accurate, and reproducible. Suitable for monofilament fibers with diameters of about 10 to 50 micrometers. Also adapted to two fiber strands.

Daniels, J.↗
NASA NTRS1968

Resistivity measurements of neutron-irradiated pure metals and Al-Zn alloys

Report presents resistivity measurements and their interpretation for neutron-irradiated pure metals and Al-Zn alloys. The influence of temperature, the role of point defects, and the aging behavior on resistivity are considered. The experimental procedures and results are discussed in detail.

Horak, J. A.↗
NASA NTRS1986

Method for contact resistivity measurements on photovoltaic cells and cell adapted for such measurement

A method is disclosed for scribing at least three grid contacts of a photovoltaic cell to electrically isolate them from the grid contact pattern used to collect solar current generated by the cell, and using the scribed segments for determining parameters of the cell by a combination of contact end resistance (CER) measurements using a minimum of three equally or unequally spaced lines, and transmission line modal (TLM) measurements using a minimum of four unequally spaced lines. TLM measurements may be used to determine sheet resistance under the contact, R.sub.sk, while CER measurements are used to determine contact resistivity, .rho..sub.c, from a nomograph of contact resistivity as a function of contact end resistance and sheet resistivity under the contact. In some cases, such as the case of silicon photovoltaic cells, sheet resistivity under the contact may be assumed to be equal to the known sheet resistance, R.sub.s, of the semiconductor material, thereby obviating the need for TLM measurements to determine R.sub.sk.

Burger, Dale R.↗
NASA NTRS1969

Nondestructive evaluation of printed wiring boards by microhm resistance measurements

Application of the microhm measuring circuit to measurement of plated-through hole resistances, when combined with appropriate probes, provides data that can be related to the quality of copper plating on printed wiring boards. Acceptance limits can be established and continuous inspection performed, with plating defects causing abnormal readings.

Stiefeld, B.↗