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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS2017

A CubeSat-Payload Radiation-Reliability Assurance Case using Goal Structuring Notation

CubeSats have become an attractive platform for universities, industry, and government space missions because they are cheaper and quicker to develop than full-scale satellites. One way CubeSats keep costs low is by using commercial off-the-shelf parts (COTS) instead of space-qualified parts. Space-qualified parts are often costlier, larger, and consume more power than their commercial counterparts precluding their use within the CubeSat form-factor. Given typical power budgets, monetary budgets, and timelines for CubeSat missions, conventional radiation hardness assurance, like the use of space-qualified parts and radiation testing campaigns of COTS parts, is not practical. Instead, a system-level approach to radiation effects mitigation is needed. In this paper an assurance case for a system-level approach to mitigate radiation effects of a CubeSat science experiment is expressed using Goal Structuring Notation (GSN), a graphical argument standard. The case specifically looks at three main mitigation strategies for the radiation environment: total ionizing dose (TID) screening of parts, detection and recovery from single-event latch-ups (SEL) and single-event functional interrupts (SEFI). The graphical assurance case presented makes a qualitative argument for the radiation reliability of the CubeSat experiment using part and system-level mitigation strategies.

COTS↗
NASA NTRSDate not supplied

Recent NEPP Program Work and Fiscal Year 2024 Plans

FY23 Highlights Standards & Guidelines: Parts Selection COTS Utilization Effort: 1) Industry Leading Parts Manufacturers (ILPM) 2) Parts Evaluation & Assessment Laboratory (PEAL) FY24 Plans Topics in NEPP Five Focus Areas: 1) Parts Assurance 2) Parts Reliability 3) Radiation Assurance 4) Radiation Reliability 5) Packaging

Peter Majewicz↗
NASA NTRS1989

Product assurance technology for procuring reliable, radiation-hard, custom LSI/VLSI electronics

Advanced measurement methods using microelectronic test chips are described. These chips are intended to be used in acquiring the data needed to qualify Application Specific Integrated Circuits (ASIC's) for space use. Efforts were focused on developing the technology for obtaining custom IC's from CMOS/bulk silicon foundries. A series of test chips were developed: a parametric test strip, a fault chip, a set of reliability chips, and the CRRES (Combined Release and Radiation Effects Satellite) chip, a test circuit for monitoring space radiation effects. The technical accomplishments of the effort include: (1) development of a fault chip that contains a set of test structures used to evaluate the density of various process-induced defects; (2) development of new test structures and testing techniques for measuring gate-oxide capacitance, gate-overlap capacitance, and propagation delay; (3) development of a set of reliability chips that are used to evaluate failure mechanisms in CMOS/bulk: interconnect and contact electromigration and time-dependent dielectric breakdown; (4) development of MOSFET parameter extraction procedures for evaluating subthreshold characteristics; (5) evaluation of test chips and test strips on the second CRRES wafer run; (6) two dedicated fabrication runs for the CRRES chip flight parts; and (7) publication of two papers: one on the split-cross bridge resistor and another on asymmetrical SRAM (static random access memory) cells for single-event upset analysis.

Buehler, M. G.↗
NASA NTRS1983

A numerical investigation of the effects of cloudiness on mesoscale atmospheric circulation

The development of a comprehensive scheme for computing radiative transfer in a cloudy, stratified atmosphere is described, and the interactions of radiation, clouds, surface heating, and frictional processes are investigated utilizing a three-dimensional numerical weather prediction model. This model is described along with the design of a reliable radiative transfer scheme which allows any vertical moisture and temperature stratifications occurring within a numerical weather prediction model to be taken into account. Some preliminary results of sensitivity tests for three 24-hour simulations are depicted in order to identify the forecast fields which respond to change in atmospheric radiation induced by cloudiness.

Wong, V. C.↗
NASA NTRS1995

Enhanced Low Dose Rate Effects in Bipolar Circuits: A New Hardness Assurance Problem for NASA

Many bipolar integrated circuits are much more susceptible to ionizing radiation at low dose rates than they are at high dose rates typically used for radiation parts testing. Since the low dose rate is equivalent to that seen in space, the standard lab test no longer can be considered conservative and has caused the Air Force to issue an alert. Although a reliable radiation hardness assurance test has not yet been designed, possible mechanisms for low dose rate enhancement and hardness assurance tests are discussed.

bipolar integrated circuits↗
NASA NTRS1985

Reactor power system deployment and startup

This paper addresses issues that should receive further examination in the near-term as concept selection for development of a U.S. space reactor power system is approached. The issues include: the economics, practicality and system reliability associated with transfer of nuclear spacecraft from low earth shuttle orbits to operational orbits, via chemical propulsion versus nuclear electric propulsion; possible astronaut supervised reactor and nuclear electric propulsion startup in low altitude Shuttle orbit; potential deployment methods for nuclear powered spacecraft from Shuttle; the general public safety of low altitude startup and nuclear safe and disposal orbits; the question of preferred reactor power level; and the question of frozen versus molten alkali metal coolant during launch and deployment. These issues must be considered now because they impact the SP-100 concept selection, power level selection, weight and size limits, use of deployable radiators, reliability requirements, and economics, as well as the degree of need for and the urgency of developing space reactor power systems.

Wetch, J. R.↗
NASA NTRS2011

Single-Event Gate Rupture in Power MOSFETs: A New Radiation Hardness Assurance Approach

Almost every space mission uses vertical power metal-semiconductor-oxide field-effect transistors (MOSFETs) in its power-supply circuitry. These devices can fail catastrophically due to single-event gate rupture (SEGR) when exposed to energetic heavy ions. To reduce SEGR failure risk, the off-state operating voltages of the devices are derated based upon radiation tests at heavy-ion accelerator facilities. Testing is very expensive. Even so, data from these tests provide only a limited guide to on-orbit performance. In this work, a device simulation-based method is developed to measure the response to strikes from heavy ions unavailable at accelerator facilities but posing potential risk on orbit. This work is the first to show that the present derating factor, which was established from non-radiation reliability concerns, is appropriate to reduce on-orbit SEGR failure risk when applied to data acquired from ions with appropriate penetration range. A second important outcome of this study is the demonstration of the capability and usefulness of this simulation technique for augmenting SEGR data from accelerator beam facilities. The mechanisms of SEGR are two-fold: the gate oxide is weakened by the passage of the ion through it, and the charge ionized along the ion track in the silicon transiently increases the oxide electric field. Most hardness assurance methodologies consider the latter mechanism only. This work demonstrates through experiment and simulation that the gate oxide response should not be neglected. In addition, the premise that the temporary weakening of the oxide due to the ion interaction with it, as opposed to due to the transient oxide field generated from within the silicon, is validated. Based upon these findings, a new approach to radiation hardness assurance for SEGR in power MOSFETs is defined to reduce SEGR risk in space flight projects. Finally, the potential impact of accumulated dose over the course of a space mission on SEGR susceptibility is explored. SEGR evaluation of gamma-irradiated power MOSFETs suggests a non-significant SEGR susceptibility enhancement due to accumulated dose from gamma rays. During SEGR testing, an unexpected enhanced dose effect from heavy-ion irradiation was detected. We demonstrate that this effect could be due to direct ionization by two or more ions at the same channel location. The probability on-orbit for such an occurrence is near-zero given the low heavy-ion fluence over a typical mission lifetime, and did not affect SEGR susceptibility. The results of this work can be used to bound the risk of SEGR in power MOSFETs considered for insertion into spacecraft and instruments.

Lauenstein, Jean-Marie↗
NASA NTRS1991

Study Of Candidate Architectures For Data Processor

Report discusses candidate architectures for digital computer system, part of communication system in spacecraft. Primary issues in analysis; performance, rates of bit errors attributable to single-event upsets (caused by ionizing radiation), reliability, size, and dissipation of power.

Mcroberts, Lou↗
NASA NTRS1991

On protection of Freedom's solar dynamic radiator from the orbital debris environment. Part 2: Further testing and analyses

Presented here are results of a test program undertaken to further define the response of the solar dynamic radiator to hypervelocity impact (HVI). Tests were conducted on representative radiator panels (under ambient, nonoperating conditions) over a range of velocity. Target parameters are also varied. Data indicate that analytical penetration predictions are conservative (i.e., pessimistic) for the specific configuration of the solar dynamic radiator. Test results are used to define the solar dynamic radiator reliability with respect to HVI more rigorously than previous studies. Test data, reliability, and survivability results are presented.

Rhatigan, Jennifer L.↗