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Niobium film superconductor carries high currents in strong magnetic fields. The thin niobium film is formed on an inert substrate through evaporation in a vacuum environment. Control of temperature and vacuum results in rejection of gaseous impurities so that the film is of a very high purity.
Niobium nitride thin films very high critical current and field characteristics, noting deposition by sputtering
Niobium carbonitride thin film deposition temperature effects on superconducting properties, considering transition temperature and critical currents and fields
A novel technique is presented which should allow precise determination of the temperature dependence of the inductance, and hence of the penetration depth, of superconducting niobium thin-film structures. Four niobium thin-film stripline inductors are arranged in a bridge configuration, and inductance differences are measured using a potentiometric technique with a SQUID (superconducting quantum interference device) as the null detector. Numerical simulations of the stripline inductances are presented which allow the performance of the measurement technique to be evaluated. The prediction of the two-fluid model for the penetration-depth temperature dependence is given for reduced temperatures of 0.3 to 0.9. The experimental apparatus and its resolution and accuracy are discussed.
A superconducting comb structure as a slow-wave element in a traveling-wave maser will significantly improve maser noise temperature and gain by reducing the insertion loss. The results of the insertion loss measurements of superconducting niobium slow-wave structures subjected to maser operating conditions at X-Band frequencies are presented.
Superconducting niobium thin film production
NbN thin film production by refined reactive sputtering technique, discussing Pauli spin paramagnetism and spin orbit scattering in high field superconductivity
A process to coat a quartz gyroscope rotor uniformly with superconducting niobium as part of a NASA sponsored experiment to test general relativity is described. The requirements for uniformity, film adhesion, and superconducting properties of the niobium thin film rotor coating are discussed. A uniformity of 1.5 percent (peak to valley) (38 nm) with good adhesion, no pinholes larger than 0.25 mm, transition temperature of 9.8 K, and the ability to survive repeated thermal cycling to 4.2 K have been achieved. Problems concerning abrasive damage and electrical arc damage during earthbound testing have been observed. Many hours of ground-based gyro operation demonstrate the applicability of this approach to rotor coating.
Due to delays in manifesting the return of the Long Duration Exposure Facility from space, attention was concentrated on extracting the maximum information from the EIOM-2 (oxygen interaction with materials experiment) flown on STS-8 in September 1983. An analysis was made of the optical surfaces exposed during that flight and an assessment made of the effect of the 5 eV atomic oxygen upon their physical and chemical properties. The surfaces studied were of two types: high-purity thin films sputtered or evaporated onto 2.54-cm diam lambda/20 fused silica optical flats, and highly polished bulk samples. Rapid etching of carbon and carbonaceous surfaces was observed with polycarbonate CR-39 showing the largest etch of any substrate flown and measured. Of the metals tested, only osmium and silver showed large effects, the former being heavily etched and the later forming a very thick layer of oxide. The first measurable effects on iridium, aluminum, nickel, tungsten and niobium thin films are reported.
The surface resistance of niobium nitride (NBN) thin films was measured at 7.78 and 10.14 GHz in the temperature range of 1.5 to 4.2 K. The films were reactively sputtered on sapphire substrates to a thickness of approximately 1 micron. The surface resistance was determined by measuring the quality factor (Q) of the TE sub 011 mode of a lead-plated copper cavity where the NbN served as one end-cap of the cavity.
Superconducting properties of Nb-Ti-N thin films prepared by reactive sputtering process, obtaining transition temperature maximums
Effect of Niobium substitution at the copper site in YBa2Cu3O(7-x) was studied in thin film form. The films were deposited by laser ablation technique using the targets of the YBa2Cu(3-x)Nb(x)O(y) where x = 0.0, 0.025, 0.05, 0.1, 0.2, 0.4, 0.8 and 1.0 under identical deposition conditions on SrTiO3 (100) substrates. Films were characterized by XRD, resistivity, I-V and J(sub c) measurements. Films made from x = 0.025 and 0.05 concentrations of Nb substituted targets showed relatively improved superconducting properties compared to that of undoped films. the best J(sub c) realized for x - 0.025 Nb concentration was 1.8 x 10(exp 6) A/sq cm and for 0.05 Nb concentration it was 3.2 x 10(exp 6) A/sq cm at 77 K. However, degradation of the superconducting properties, with the increase of x is greater than or equal to 0.1 Nb concentration and drastic suppression and complete loss of superconductivity was noticed for x is greater than or equal to 0.4. The growth of impurity phase YBa2NbO6 for x = 0.1 and above of Nb concentration was noted from XRD (X-Ray Diffraction) patterns. However, the site occupancy of Nb could not be confirmed from these studies.
Sensor consisting of superconductive film mounted on a dipstick measures the level of liquid helium in a Dewar flask. The sensor is made by depositing a thin film of niobium metal to a thickness of 2000 angstroms on a quartz substrate, which is then mounted on a graduated dipstick.
Niobium thin-film bridges 300-A thick, 1-micron wide, and 0.5-micron long joining two bulk films 5000-A thick and having normal resistance of the order of 1 ohm have been fabricated and used for microwave mixing at 10 GHz. They exhibit Josephson, bolometric, and multiple-flux-flow mixing and have useful response at 100-200 GHz. The data show in a direct way limitations imposed by flux flow and heating.
Thin films of niobium nitride with high superconducting temperature (T sub c) of 15.7 K are deposited on substrates held at room temperature (approx 90 C) by heat sink throughout the sputtering process. Films deposited at P sub Ar 12.9 + or - 0.2 mTorr exhibit higher T sub c with increasing P sub N2,I with the highest T sub c achieved at P sub n2,I= 3.7 + or - 0.2 mTorr and total sputtering pressure P sub tot = 16.6 + or - 0.4. Further increase of N2 injection starts decreasing T sub c.
We describe superconducting diffusion-cooled hot-electron bolometers that were fabricated fromtantalum films grown on a thin niobium seed layer. The seed layer promotes single-phase growth of the Ta films, resulting in high-quality bolometers with transition temperatures up to 2.35 K and transition widths of less than 0.2 K. An S-parameter measurement set-up in a He-3 cryostat was used to measure device impedance versus frequency of a 400 nm long device at a temperature of 400 mK. It is shown that a 3 dB roll-off frequency of about 1 GHz can be achieved when the device resistance matches the impedance of the embedding network (no electrothermal feedback). This would lead to a prediction of 16 GHz for a 100 nm device, and indicates that a heterodyne mixer using a Ta HEB should be able to operate at several GHz even with a significant amount of electrothermal feedback.
Polycrystalline Nb thin films are extensively used for microwave kinetic inductance detectors (MKIDs) and superconducting transmission line applications. The microwave and mm-wave loss in these films is impacted, in part, by the presence of surface nitrides and oxides. In this study, glancing incidence x-ray diffraction was used to identify the presence of niobium nitride and niobium monoxide surface layers on Nb thin films which had been exposed to chemicals used in standard photolithographic processing. A method of mitigating the presence of ordered niobium monoxide surface layers is presented. Furthermore, we discuss the possibility of using glancing incidence x-ray diffraction as a non-destructive diagnostic tool for evaluating the quality of Nb thin films used in MKIDs and transmission lines. For a given fabrication process, we have both the X-ray diffraction data of the surface chemistry and a measure of the mm-wave and microwave loss, the latter being made in superconducting resonators.
Polycrystalline Nb thin films are extensively used for microwave kinetic inductance detectors (MKIDs) and superconducting transmission line applications. The microwave and mm-wave loss in these films is impacted, in part, by the presence of surface nitrides and oxides. In this study, glancing incidence x-ray diffraction was used to identify the presence of niobium nitride and niobium monoxide surface layers on Nb thin films which had been exposed to chemicals used in standard photolithographic processing. A method of mitigating the presence of ordered niobium monoxide surface layers is presented. Furthermore, we discuss the possibility of using glancing incidence x-ray diffraction as a non-destructive diagnostic tool for evaluating the quality of Nb thin films used in MKIDs and transmission lines. For a given fabrication process, we have both the X-ray diffraction data of the surface chemistry and a measure of the mm-wave and microwave loss, the latter being made in superconducting resonators.