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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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Upgrade of the Lyman-alpha diagnostic system on DIII-D for main chamber edge neutral studies

The LLAMA (Lyman Alpha Measurement Apparatus) pinhole camera diagnostic had previously been deployed on DIII-D to measure radial profiles of the Lyman-α (Ly-α) deuterium neutral line brightness across the plasma boundary in the lower chamber to infer neutral deuterium density and ionization rate profiles. This system has recently been upgraded with a new diagnostic head, named ALPACA, that also encloses two pinhole cameras and duplicates the LLAMA views in the upper chamber. Similar to LLAMA, ALPACA provides two times 20 lines of sight, viewing the plasma edge on the inboard and outboard sides with a radial resolution of ~2.5 cm (FWHM) and an effective time resolution of ~1 ms that allows for the investigation of inter-ELM dynamics. The extended Ly-α system provides better coverage to study neutrals in experiments with various plasma shapes utilizing both the upper and lower divertors. Furthermore, post-campaign calibration of the LLAMA diagnostic has successfully been demonstrated for the first time. This was facilitated by various upgrades to the calibration set-up and detailed measurements of the emissivity distribution of the Ly-α calibration source using a pinhole collimator. It was found that the sensitivity of the inboard LLAMA pinhole camera was reduced by a factor of 2.0 ± 0.2 over the course of six months of plasma operation in 2021. In conclusion, the upgraded Ly-α system, equipped with improved absolute calibration, will provide key input for neutral fueling and pedestal particle transport studies and for 2D edge transport code validation on the DIII-D tokamak.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗

Optimal Control for X-Ray Mircroscopes

In this article, a systematic framework for designing the control for fine positioning (scanning) stages of X-ray microscopes is presented. This framework facilitates designs that simultaneously achieve specifications on positioning resolution and tracking bandwidth while guaranteeing robustness of the closed loop device to unmodeled uncertainties. We use robust optimal control techniques for modeling, quantifying design objectives and system-specific challenges, and designing the control laws. The control designs were implemented on a three degree of freedom piezoactuated flexure stages dedicated for fine positioning of X-ray optics. Experimental results demonstrate significant improvements in positioning performance of 134%, 150%, and 132% in tracking bandwidths along the lateral (X), vertical (Y), and beam (Z) directions, respectively, when compared to proportional-integral-derivative controller designs. This was achieved while keeping similar or better positioning resolution and robustness measures. Fast scanning for X-ray imaging was demonstrated in both the step scan and flyscan modes, where bandwidth was improved by over 450 times with flyscan compared to the step scan.

42 ENGINEERING↗

Fabrication of Six Degrees-of-Freedom Hexflex Positioner With Integrated Strain Sensing Using Nonlithographically Based Microfabrication

In this study, a process flow is described for the low cost, flexible fabrication of metal micro-electromechanical systems (MEMS) with high performance integrated sensing. The process is capable of producing new designs in ≈1 week at an average unit cost of <$1 k/device even at batch sizes of ≈1–10, with expected sensing performance limits of about 135 dB over a 10 kHz sensor bandwidth. This is a ≈20× reduction in cost, ≈25× reduction in time, and potentially >30× increase in sensing dynamic range over comparable state-of-the-art compliant nanopositioners. The nonlithographically based microfabrication (NLBM) process is uniquely suited to create high performance nanopositioning architectures which are customizable to the positioning requirements of a range of nanoscale applications. These can significantly reduce the cost of nanomanufacturing research and development, as well as accelerate the development of new processes and the testing of fabrication process chains without excess capital investment. A six degrees-of-freedom (6DOF) flexural nanopositioner with integrated sensing for all 6DOF was fabricated using the newly developed process chain. The fabrication process was measured to have ≈30 μ m alignment. Sensor arm, flexure, and trace widths of 150 μ m, 150 μ m, and 800 μ m, respectively, were demonstrated. Process capabilities suggest lower bounds of 25 μ m, 50 μ m, and 100 μ m, respectively. Dynamic range sensing of 52 dB was demonstrated for the nanopositioner over a 10 kHz sensor bandwidth. Improvements are proposed to approach sensor performance of about 135 dB over a 10 kHz sensor bandwidth.

42 ENGINEERING↗