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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Finite Element Simulation of Potential-Induced Degradation Kinetics in p-Type Silicon Solar Modules
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A Poisson–Nernst–Planck Model of Ion Transport and Interface Segregation in Metal–Insulator–Semiconductor Structures and Solar Cells
A numerical model that describes the transport of mobile ionic species in metal–insulator–semiconductor (MIS) and photovoltaic (PV) devices subject to temperature and voltage stress is presented. The finite element method (FEM) is used to solve the Nernst–Planck equation while imposing Poisson's equation self-consistently as a restriction for the electrostatic potential. This allows the contribution of the ionic species to the potential to be taken into account. Using a variational formulation eases the implementation of diverse boundary conditions, including the incorporation of segregation kinetics at the device interfaces. Segregation across the dielectric–semiconductor interface is relevant to modeling the electronic device degradation in systems where contamination reaches the semiconductor. The model in closed systems with no-flux boundary conditions is validated first. In the limiting case of low contamination levels with respect to the gate bias, the FEM solution matches analytically derived approximations. Then, the implementation is broadened to include an open boundary at the dielectric–semiconductor interface to account for leakage of ions. The predicted time dependence of the flatband voltage in Na-contaminated MIS test structures agrees well with measurements. This model successfully captures the role of long-range ion transport at concentrations of relevance to electronic and PV device instability and neuromorphic computing.
Development of pebble-based extruded carbon rods for extreme plasma heat flux environments
This work presents first experiments toward the development of continuously renewable (extrudable) pebble-based carbon rods for use as plasma-facing components in extreme steady-state plasma flux environments. The primary envisioned application of this work is a first wall that can survive long-term in future magnetic fusion power reactors while also improving recovery of the reactor fuel (tritium and deuterium atoms). Bench tests applying extreme steady-state front-surface heat loads of up to 50 MW/m 2 are presented. Continuous pebble rod front-surface recession and intact pebble recovery are successfully demonstrated, at a rate of order 0.2 cm/s. Numerical simulations of the pebble rod front-surface recession are able to match observations reasonably well, indicating that the recession mechanism can be understood as occurring due to pebble thermal expansion and resulting shock and cracking of the inter-pebble binder. Tests of the pebble rod extrusion demonstrate that friction between the rods and the stainless-steel extrusion channel is tolerably low (<50 N for the expected channel length) over a wide range of temperatures. Front-surface outgassing rates below 1000 Torr L/s/m 2 are achieved, believed to be sufficiently low for use in magnetic fusion reactors. In conclusion, initial parametric scans over pebble rod size and binder fraction to vary front-surface recession rates are presented.
Dependence of Heat Removal Rate of Pebble-Based Rods on Inter-Pebble Matrix Fill Fraction
Carbon pebble rods are a promising candidate for use in high heat flux regions of magnetic fusion energy reactor walls. Under high (10 – 50 MW/m 2 ) heat loads, carbon pebble rods release hot pebbles from the exposed surface, carrying away heat as the pebble rod surface recedes. In this work, we show that the surface recession rate during heating can be adjusted by changing the mechanical strength of the extruded rods, modifying the heat removal rate; this is accomplished here by varying the fill fraction of the inter-pebble matrix. A three-dimensional finite element model is presented that captures many experimental observations, including the sphere temperature and the surface recession rate. The model predicts that pebble release is caused by thermally driven crack propagation through the matrix and that the matrix strength against breaking is the single most important material parameter setting the pebble release rate; this prediction is supported by experimental results.
Measurement of post-disruption runaway electron kinetic energy and pitch angle during final loss instability in DIII-D
Post-disruption runaway electron (RE) kinetic energy K and pitch angle sin$\vartheta$ are critical parameters for determining resulting first wall material damage during wall strikes, but are very challenging to measure experimentally. During the final loss instability, confined RE K and sin$\vartheta$ are reconstructed during center-post wall strikes for both high impurity (high-Z) and low impurity (low-Z) plasmas by combining soft x-ray, hard x-ray, synchrotron emission, and total radiated power measurements. Deconfined (wall impacting) RE sin$\vartheta$ is then reconstructed for these shots by using time-decay analysis of infra-red imaging. Additionally, deconfined RE K and sin$\vartheta$ are reconstructed for a low-Z downward loss shot by analyzing resulting damage to a sacrificial graphite dome limiter. The damage analysis uses multi-step modeling simulating plasma instability, RE loss orbits, energy deposition, and finally material expansion (MARS-F, KORC, GEANT-4, and finally COMSOL). Overall, mean kinetic energies are found to be in the range $\langle$$K$$\rangle$ $≈ 3-4$ MeV for confined REs. KORC simulations indicate that the final loss instability process does not change individual RE kinetic energy K. In conclusion, confined RE pitch angles are found to be fairly low initially pre-instability, $\langle$sin$\vartheta$$\rangle$ $≈ 0.1 – 0.2$, but appear to increase roughly 2x, to $\langle$sin$\vartheta$$\rangle$ $≈ 0.3 – 0.4$ for both confined and deconfined REs during instability onset in the low-Z case; this increase is not observed in the high-Z case.
Characterization of runaway electron impact on instrumented sacrificial limiters on DIII-D
Instrumented sacrificial limiter heads, both domed (proud) and flat (flush) are used in DIII-D runaway electron (RE) wall strikes to study the wall impact dynamics with high spatial and time resolution. The approximate structure of the RE wetted area and heating depth on the domed limiter heads were predicted qualitatively using orbit-tracking simulations, although a strong left–right asymmetry (about the magnetic field direction) was not captured well by the simulations. It is hypothesized that this difference is perhaps due to the local 3D magnetic field perturbation of the dome limiter head. The average kinetic energy K and pitch angle θ of REs striking the limiter head were estimated from the spatial distribution of local HXR emission and were estimated to be roughly K ≈ 4 MeV and θ ≈ 0.2 rad. These values are roughly consistent with in-plasma values estimated before the loss event, indicating that RE kinetic energy and pitch angle are not drastically altered when transporting to the wall. Large shot–shot variations (1–10 kJ) in energy deposition into the limiter head were observed and were explained by shot–shot variations in locked magneto-hydrodynamics mode toroidal phase. For the largest deposited energies (10 kJ), graphite material failure and explosive dust release was observed, and the depth of material failure at higher energy deposition was successfully reproduced using modelling of volumetric energy deposition and brittle failure. The presence of energetic (keV) level ion impact during the RE wall strike was confirmed by three different surface analysis techniques. The ratio of energetic ion to RE flux appears to be larger on flat surfaces within the RE wetted area, although the energetic ion flux and total energy flux due to energetic ions have not yet been quantified.
Modeling Time to Failure in Potential-Induced Degradation of Silicon Solar Modules based on Quantitative Sodium Kinetics
We present a physics-based simulation environment for the prediction of potential-induced-degradation (PID) failure time in silicon solar modules. Our model is based on experimental sodium migration kinetics obtained from our recently developed trap-corrected bias-stress-temperature method and from secondary ion mass spectrometry measurements. Furthermore, we model sodium migration to stacking faults and subsequent formation of conductive pathways through the p-n junction, which causes a decrease of the shunt resistance and loss of efficiency.
Insights into Na + Diffusion in Silicon Modules under Operating Conditions: Measuring Low Concentrations by D-SIMS
Sodium induced shunting under an electric field is a challenging reliability issue in crystalline Si solar modules. The source of this Potential-Induced Degradation of the Shunting type (PID-s) is well understood and its influence on power loss has been intensively studied based on phenomenological models on cell or module level relating the experimental power-loss to stressing parameters (time, temperature, voltage). However, little is known about the Na ion migration kinetics, responsible for PID on a microscopic level, and its quantitative relation to the efficiency degradation. In this paper we present our investigations of sodium ion migration in Ethylene-Vinyl Acetate (EVA) and silicon through Dynamic Secondary Ion Mass Spectroscopy (D-SIMS). Each sample was annealed at field relevant temperatures from 60-90 °C to address typical migration mechanisms of common PV installations. Analysis of the SIMS migration profiles revealed a diffusivity constant D 0,EVA = 0.09 ± 0.14 cm 2 /s and an activation energy E A,EVA = 0.85 ± .04 eV for Na in EVA and diffusivities higher than extrapolated literature values in silicon (D 0,Si = (3.03 ± 2.42)x10 -5 cm 2 /s, and E A,Si = 0.98 ± 0.02 eV). The new insight will be included in a drift-diffusion based degradation model accounting for the partition coefficient across all relevant interfaces. This model can assist in predicting PID-failure in the field based on the given model stack and the diffusion of Na + through each material. Furthermore, this tool can be used for process optimization as well as material selection significantly reducing the cost and time to validate a technology.