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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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All sourcesNASA NTRSDOE OSTI
DOE OSTI2019

Transmission EBSD (t-EBSD) as Tool to Investigate Nanostructures in Superconductors

The transmission electron backscatter diffraction (t-EBSD) technique has proven to be an indispensable tool for the analysis of microstructures of superconducting samples, both high-T{sub c} samples (YBa{sub 2}Cu{sub 3}O{sub y}, Bi{sub 2}Sr{sub 2}CaCu{sub 2}O{sub 8}) as well as MgB{sub 2} or iron-based materials. The knowledge of the grain boundary properties (misorientation, length, width) is essential for the further optimization of sample performance. Any addition of secondary phase(s) to improve the flux pinning properties is required to be of nanometer dimensions, so the higher achievable resolution and the better imaging properties are important to obtain reasonably high image quality to enable automated orientation mapping. The orientation maps reveal not only the location and the shape of the inclusions within the superconducting matrix or at the grain boundaries but also their influence on the surrounding superconducting matrix, which also plays an important role in flux pinning. In the case of sintered MgB{sub 2} bulk samples, the demand for higher critical current densities leads to MgB{sub 2} grains in the 100-nm range, which is already difficult to be studied by means of conventional EBSD. Furthermore, t-EBSD is useful for the analysis of specific microstructures of unconventional superconductors like superconducting foams or superconducting nanowire networks.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2021

Measuring residual stress in Ti-6Al-4V with HR-EBSD, using reference patterns from annealed material

In this study, elastic strain and residual stress values in an engineering material were determined by high-resolution EBSD (HR-EBSD) using reference patterns from annealed, recrystallized material. Specifically, rolled Ti-6Al-4V sheet was analyzed using HR EBSD in both an as-annealed and a strained state, the latter established via a static two-point bend fixture. The commercial software CrossCourt4 (CC4) was used to evaluate the relative intragranular strain tensor components of the alpha grains mapped by HR-EBSD. The intragranular reference patterns identified in each grain by the software were then replaced with similarly-oriented patterns from scans of the as-annealed, recrystallized material. The CC4 analysis was then repeated to provide calibrated strain and residual stress values. Elastic strains on the order of 10–3 were detected, with corresponding residual stress values on the order of 1 GPa. Subsequent analyses using high energy synchrotron x-ray diffraction showed good correlation with the elastic strains measured by HR-EBSD using the annealed reference patterns. Additionally, the maximum macroscopic stress analytically predicted for two-point bending was in agreement with the residual stress observed. Good repeatability of the methodology and insight into the state of individual grains were also observed. The findings provide encouraging evidence that accurate intragranular and long-range residual stress measurements of engineering significance can be made with HR-EBSD using a physical reference pattern library.

36 MATERIALS SCIENCE↗
DOE OSTI2019

On the measurement of dislocations and dislocation substructures using EBSD and HRSD techniques

The accumulation of the dislocations and development of dislocation structures in plastically deformed Ni201 is examined using dedicated analyses of Electron Back-Scatter Diffraction (EBSD) acquired orientation maps, and High-Resolution Synchrotron Diffraction (HRSD) acquired patterns. The results show that the minimum detectable microstructure-averaged (bulk) total dislocation density ($ρ_T$) measured via HRSD is approximately 1E13 m -2 , while the minimum GND density ($ρ_G$) measured via EBSD is approximately 2E12 m -2 - the EBSD technique being more sensitive at low plastic strain. This highlights complementarity of the two techniques when attempting to quantify amount of plastic deformation (damage) in a material via a measurement of present dislocations and their structures. Furthermore, a relationship between EBSD-measured $ρ_G$ and the size of HRSD-measured Coherently Scattering Domains (CSDs) has been mathematically derived - this allows for an estimation of the size of CSDs from EBSD-acquired orientation maps, and conversely an estimation of $ρ_G$ from HRSD-measured size of CSDs. The measured evolution of ($ρ_T$), and $ρ_G$ is compared with plasticity theory models - the current results suggest that Ashby's single-slip model underestimates the amount of ONDs ($ρ_G$), while Taylor's model is correctly predicting the total amount of dislocation ($ρ_T$) present in the material as a function of imparted plastic strain.

36 MATERIALS SCIENCE↗
DOE OSTI2019

EBSD characterization of metallic nuclear fuel

Grain structure and texture are important in all materials as they influence most mechanical properties. In particular for nuclear materials texture can influence material properties important for reactor performance, such as swelling, yield stress, fracture toughness etc. Moreover such data are of primary importance to develop and validate physics-based models for nuclear fuels based on microstructure evolution during irradiation (e.g. MARMOT). Scanning Electron Microscopy (SEM) coupled with Electron Back Scatter Diffraction (EBSD) has been proven as an effective technique for evaluating grain size, shape, and orientation. However it has been seldom used for nuclear fuels. This has been mostly related to difficulties in handling and preparing such materials for EBSD analyses. Particularly challenging remains sample preparation for metallic irradiated fuels, as they are prone to rapid oxidation. Indeed EBSD analyses require the elimination of any surface defect or oxide layer as the signal arise from 50-100 nm depth in the material. At Idaho National Laboratory (INL) great effort has focused in developing techniques to obtain suitable surfaces for EBSD analyses. In this paper the first results from EBSD analyses obtained from a wide range of nuclear materials will be presented. Sample analyzed included fresh U, U-Zr, Pu-Zr , and U-Mo, including some irradiated fuel.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗
NASA NTRS2016

Dislocation Content Measured Via 3D HR-EBSD Near a Grain Boundary in an AlCu Oligocrystal

Interactions between dislocations and grain boundaries are poorly understood and crucial to mesoscale plasticity modeling. Much of our understanding of dislocation-grain boundary interaction comes from atomistic simulations and TEM studies, both of which are extremely limited in scale. High angular resolution EBSD-based continuum dislocation microscopy provides a way of measuring dislocation activity at length scales and accuracies relevant to crystal plasticity, but it is limited as a two-dimensional technique, meaning the character of the grain boundary and the complete dislocation activity is difficult to recover. However, the commercialization of plasma FIB dual-beam microscopes have made 3D EBSD studies all the more feasible. The objective of this work is to apply high angular resolution cross correlation EBSD to a 3D EBSD data set collected by serial sectioning in a FIB to characterize dislocation interaction with a grain boundary. Three dimensional high angular resolution cross correlation EBSD analysis was applied to an AlCu oligocrystal to measure dislocation densities around a grain boundary. Distortion derivatives associated with the plasma FIB serial sectioning were higher than expected, possibly due to geometric uncertainty between layers. Future work will focus on mitigating the geometric uncertainty and examining more regions of interest along the grain boundary to glean information on dislocation-grain boundary interaction.

Ruggles, Timothy↗
DOE OSTI2021

Combined EDS and EBSD dataset from TiB2 ceramic material

This is supplemental information to a paper to be submitted, tentatively titled Cluster analysis of combined EDS and EBSD data to solve ambiguous phase identifications. Data was acquired from a TiB2 ceramic provided by Missouri University of Science and Technology. Simultaneous EDS and EBSD were acquired on a Tescan MIRA3 GMH field-emission SEM equipped with Oxford Instruments Symmetry CMOS-based EBSD detector and Oxford Instruments UltimMax 170 mm2 silicon-drift detector EDS. Data was acquired using Oxford Instruments AZtec 4.0 software. Data was acquired at 20 keV, 70° tilt, and ≈1 nA probe current. An 80×60 pixel, 40×30 μm map (500 nm pixel pitch) was acquired. EBSD indexing was performed using TiB2, space group 191 P6/mmm, and TiC, space group 225 Fm \bar{3}m, crystal cards.

36 MATERIALS SCIENCE↗
DOE OSTI2022

NSUF Report EBSD analyses on metallic fuel samples: Tips and improvements in sample preparation

EBSD (Electron Backscatter Diffraction) is an analytic technique used to evaluate the microstructure of a specimen. It can be used to evaluate interesting crystallographic data ranging from grains size to grain orientation, from grain boundaries to stresses. Moreover, in the field of nuclear materials EBSD can aid in estimating properties important for reactor performance, such as dislocation and residual strain [1]. EBSD patterns are generated by focusing a stationary electron gun on the specimen and detecting the backscatter electrons that satisfy Bragg conditions, and thus are diffracted by the crystal planes forming the so called Kikuchi bands. These bands correspond to each of the lattice diffracting crystal planes and are detected on a phosphor screen via a low-light CCD camera [2]. The patterns are generated within a small interaction volume located at a depth of less than 50-100 nm. Because of this, the data quality is extremely sensitive to the integrity of the crystallographic lattice order at the surface of the sample and thus to sample preparation and to oxidation [3]. While conventional sample preparation methods are widely used in materials science, they often do not lead to quality electron backscatter patterns needed for the characterization of nuclear materials [4]. This has been related by many authors to the challenges associated with handling radiological specimens, their rapid oxidation, and artifacts in such samples (e.g. high number of defects, precipitates and/or porosities) [4-8]. EBSD, however, can be an invaluable technique to evaluate microstructural evolution during fabrication and after irradiation at the required mesoscale for model and simulation. It also provides important information on grain structure necessary to understand irradiation effect, such as grain subdivision. Thus, it is of paramount importance to further the application of this technique to nuclear materials and especially irradiated fuels.

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗
DOE OSTI2019

Crystallographic Characterization of Nb3Sn Coatings and N-Doped Niobium via EBSD and SIMS

Historically, niobium has been used as the superconducting material in SRF cavities. Due the high operational costs, other materials are currently being considered. Nb3Sn coatings have been investigated over the past several decades, motivated by potentially higher operating temperatures. More recently niobium has been doped with nitrogen to improve the quality factor (Q). Currently, a need for better understanding still exists for both mechanisms. EBSD has been shown to be a viable technique to determine the crystallographic orientation and the size of the Nb3Sn grains. The EBSD maps obtained show a bimodal distribution of grain sizes with smaller Nb3Sn grains found present near the Nb3Sn/Nb interface. In addition to the Nb3Sn coatings, N-doped niobium coupons were analyzed by EBSD and found that the coupon had preferred surface orientation. The EBSD analysis was found to be vital as specific grains could be targeted in SIMS to better understand the diffusion of nitrogen with respect to crystal orientation.

Angle, J. W.↗
DOE OSTI2021

Comparison of EBSD, DIC, AFM, and ECCI for active slip system identification in deformed Ti-7Al

The use of SEM-DIC, AFM, ECCI, and HR-EBSD to characterize slip-system activity was assessed on the same material volume of Ti-7Al. This study presents a robust comparison of the various methods for the first time, including an assessment of their advantages and disadvantages, and how they can be used effectively in a complementary fashion. The analysis of the different approaches was carried out in a blind, round-robin manner at three different universities. A Ti-7Al specimen was deformed in uniaxial tension to approximately 3% axial strain, and the active slip systems were independently identified using (i) trace analysis; (ii) in-SEM digital image correlation, (iii) observations of residual dislocations from ECCI, and (iv) long-range rotation gradients through HR-EBSD, with consistent trace identification in all cases. Displacement data from AFM was used to augment SEM-DIC displacement data by providing complementary out-of-plane displacement information. Furthermore, short-range dislocation gradients (measured by DIC) provided insight into the residual geometrically necessary dislocation (GND) content, and was consistent with the GND content extracted from EBSD data and ECCI images, confirming the presence of residual GNDs on the dominant slip systems resulting in visible slip bands. Furthermore, these approaches can be used in tandem to provide multi-modal information on slip band identification, strain and orientation gradients, out-of-plane displacements, and the presence of GNDs and SSDs, all of which can be used to inform and validate the development of dislocation-based crystal plasticity and strain gradient models.

36 MATERIALS SCIENCE↗
DOE OSTI2022

Investigation of deformation mechanisms in an advanced FeCrAl alloy using in-situ SEM-EBSD testing

The deformation mechanisms associated with uniaxial tensile testing are observed by conducting tensile experiments of an FeCrAl alloy using scanning electron microscopy (SEM) coupled with electron backscattered diffraction (EBSD). Prior to the deformation, investigated alloy was consisting grain and precipitate size of ~63.0 μm and ~6.7 μm, respectively. The recorded SEM micrographs and EBSD data at increasing levels of strains revealed the complex phenomena of slip bands’ formation in the presence of surface grain morphology evolution and their (001), (110) and (111) crystallographic planes distortions. The grains with orientation (110)||tensile direction (TD) shows higher shape change; however, (001)||TD and (111)||TD oriented grains show higher lattice gradient formation. Extracted information from the EBSD indicates that the crystallographic rotations drive towards specific, fiber-like texture in relation to the loading direction. Postmortem analysis of the recorded microstructure during the tensile deformation explains the phenomena of crack formation in the hard-intermetallic particles before the ultimate tensile strength (UTS). However, after the UTS, pores were identified in the neck that resulted from extensive plastic deformation. In-depth analysis was carried out to identify the cause of cracks and pores formation phenomena during the tensile test.

36 MATERIALS SCIENCE↗
DOE OSTI2022

Cluster Analysis of Combined EDS and EBSD Data to Solve Ambiguous Phase Identifications

A common problem in analytical scanning electron microscopy (SEM) using electron backscatter diffraction (EBSD) is the differentiation of phases with distinct chemistry but the same or very similar crystal structure. X-ray energy dispersive spectroscopy (EDS) is useful to help differentiate these phases of similar crystal structures but different elemental makeups. However, open, automated, and unbiased methods of differentiating phases of similar EBSD responses based on their EDS response are lacking. This paper describes a simple data analytics-based method, using a combination of singular value decomposition and cluster analysis, to merge simultaneously acquired EDS + EBSD information and automatically determine phases from both their crystal and elemental data. I use hexagonal TiB 2 ceramic contaminated with multiple crystallographically ambiguous but chemically distinct cubic phases to illustrate the method. Code, in the form of a Python 3 Jupyter Notebook, and the necessary data to replicate the analysis are provided as Supplementary material.

47 OTHER INSTRUMENTATION↗
DOE OSTI2025

An overview of HR-EBSD techniques for mapping local stress and dislocations in crystalline materials at sub-micron resolution

High resolution electron backscatter diffraction (HR-EBSD) is a technique used to map elastic strain, crystallographic orientation and dislocation density in a scanning electron microscope. Here, this review covers the background and mathematics of this technique, contextualizing it within the broader landscape of EBSD techniques and other materials characterization methods. Several case studies are presented showing the application of HR-EBSD to the study of plasticity in metals, failure analysis in microelectronics and defect quantification in thin films. This is intended to be a comprehensive resource for researchers developing this technique as well as an introduction to those wishing to apply it.

Ruggles, Timothy J. [Sandia National Laboratories ↗
DOE OSTI2025

Generalizable Image Segmentation for Microstructure Characterization Through Integrated SEM and EBSD Analysis

We demonstrate generalizable semantic segmentation using minimal ground truth data. Correlated scanning electron microscopy (SEM) images and electron backscatter diffraction (EBSD) measurements of frictionstir processed 316L stainless steel plates were used to train deep learning models for grain boundary segmentation. Secondary electron (SE) imaging taken at an accelerating voltage of 10 keV correlated to EBSD-derived grain boundaries produced the best performing model. Notably, an ensemble of three models trained on a single SE image produced accurate segmentation over a series of BSE images of samples manufactured under different processing parameters, with a resultant mean absolute error in grain size of 0.34 µm. The striking generalizability of the models likely results from the similar escape depths of the SE training input and the EBSD training output and the reduced probability of dislocation artifacts appearing in the image. This finding highlights the importance of considering the physical principles behind imaging in the development of robust segmentation models for microstructure characterization.

Taufique, Mohammad Fuad Nur↗
NASA NTRS2018

Structures of Astromaterials Revealed by EBSD

Groups at the Johnson Space Center and the University of Tokyo have been using electron back-scattered diffraction (EBSD) to reveal the crystal structures of extraterrestrial minerals for many years. Even though we also routinely use transmission electron microscopy, synchrotron X-ray diffraction (SXRD), and conventional electron diffraction, we find that EBSD is the most powerful technique for crystal structure elucidation in many instances. In this talk I describe a few of the cases where we have found EBSD to provide crucial, unique information. See attachment.

Zolensky, M.↗
NASA NTRSDate not supplied

In-situ Testing to Acquire HR-EBSD and DIC Strain Data Within a Coincident Domain

For this project, an inked rubber stamp was applied to a small Inconel 625 specimen. The stamp transferred a thin pattern with microscale features for digital image correlation (DIC). The pattern is easily visible at lower voltages and thin enough to not obstruct backscattered electrons. The unique characteristics of the pattern enabled the concurrent acquisition of DIC and high-resolution electron backscatter diffraction (HR-EBSD) data while the specimen was loaded in-situ. The challenges of in-situ testing and combining EBSD with DIC measurements are discussed. By combining the elastic strains (from HR-EBSD) and total strains (from DIC) the result of this approach is an estimate of stress- strain behavior at points across the specimen surface. This combined dataset can then be used as higher-fidelity data in the calibration of crystal plasticity models.

Will Gilliland↗
DOE OSTI2024

3D Reconstruction of a High-Energy Diffraction Microscopy Sample Using Multi-modal Serial Sectioning with High-Precision EBSD and Surface Profilometry

High-energy diffraction microscopy (HEDM) combined with in situ mechanical testing is a powerful nondestructive technique for tracking the evolving microstructure within polycrystalline materials during deformation. This technique relies on a sophisticated analysis of X-ray diffraction patterns to produce a three-dimensional reconstruction of grains and other microstructural features within the interrogated volume. However, it is known that HEDM can fail to identify certain microstructural features, particularly smaller grains or twinned regions. Characterization of the identical sample volume using high-resolution surface-specific techniques, particularly electron backscatter diffraction (EBSD), can not only provide additional microstructure information about the interrogated volume but also highlight opportunities for improvement of the HEDM reconstruction algorithms. In this study, a sample fabricated from undeformed “low solvus, high refractory” nickel-based superalloy was scanned using HEDM. The volume interrogated by HEDM was then carefully characterized using a combination of surface-specific techniques, including epi-illumination optical microscopy, zero-tilt secondary and backscattered electron imaging, scanning white light interferometry, and high-precision EBSD. Custom data fusion protocols were developed to integrate and align the microstructure maps captured by these surface-specific techniques and HEDM. The raw and processed data from HEDM and serial sectioning have been made available via the Materials Data Facility (MDF) at https://doi.org/10.18126/4y0p-v604 for further investigation.

36 MATERIALS SCIENCE↗
DOE OSTI2019

An investigation of geometrically necessary dislocations and back stress in large grained tantalum via EBSD and CPFEM

This study explores the evolution of GNDs and their effects on back stress through experimental and computational methods. Four large-grained tantalum tensile specimens were strained in uniaxial tension, electron backscatter diffraction (EBSD) data were collected, and geometrically necessary dislocation (GND) maps of the four specimens in the unloaded state were produced. EBSD-based GND maps revealed several types of features with high GND content which caused back stress in the specimens. Correlations between five geometrically-based grain boundary (GB) transmission factors and the GB GND content were evaluated, and statistically significant correlations were found for transmission factors based on Livingston and Chalmer’s N factor, Werner and Prantl’s slip transfer number, and GB misorientation. The sign of individual components of the Nye tensor were used to visually and quantitatively identify clustering of GNDs of the same sign, thus giving additional evidence of increasing back stress due to deformation. Deformation of one of the specimens was simulated using multiple CPFEM based modeling approaches and predicted stress-strain responses are compared. The super dislocation model (SD model) — a crystal plasticity finite element method (CPFEM) which incorporates elastic dislocation interactions — was able to isolate impact of back stress on the overall flow stress. The SD model predicted correct stresses when compared with experimental data; however, when the elastic interactions in the SD model were turned off, stress predictions were 25% too low. Thus, demonstrating the importance of incorporating back stress into the model.

42 ENGINEERING↗
DOE OSTI2021

EBSD of Rough Native CuInGaSe2 Thin-Films

The polycrystalline Cu (In, Ga) Se2, or CIGS, based thin-film materials system has long been studied for use in photovoltaic technologies, where its bandgap tunability, mechanical flexibility, and relatively low production costs are all appealing. Nonetheless, significant defect populations, which serve to reduce efficiency, create performance instabilities, and increase concerns about long-term reliability, have hindered wide-scale adoption. Prior work, including application of a scanning probe based deep level trap spectroscopy (SP-DLTS) defect mapping technique and scanning transmission electron microscope (STEM) based electron energy loss spectroscopy (EELS), has shown that the most detrimental defects, with energy level near mid-gap (thus serving as a carrier recombination center), are most likely caused by CuIn/Ga antisites and tend to cluster at or around certain grain boundaries [1,2]. However, the exact nature of these particular boundaries — their structures, chemistries, or even the relative misorientation of their associated grains — and their relation to this defect clustering and/or its formation is yet unknown. As such, electron backscatter diffraction (EBSD) orientation mapping, directly correlated with defect-sensitive techniques like SP-DLTS and/or STEM-EELS, could prove critical for providing the final missing links toward understanding the mechanisms behind these defects. Indeed, recent studies using correlative electron beam induced current (EBIC) with EBSD have been able to identify boundaries, and their relative misorientations, that possess detrimental electronic properties [3]. However, because EBIC is unable to resolve the defect energy levels, many questions are left unanswered. Furthermore, this study, and others like it, employed focused ion beam (FIB) milling to flatten the natively-rough CIGS [3-5], which may run the risk of changing the nature of any near-surface defect structures.

14 SOLAR ENERGY↗